Fault tolerance in VLSI:
Gespeichert in:
Format: | Buch |
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Sprache: | English |
Veröffentlicht: |
New York
1986
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Schlagworte: | |
Beschreibung: | In: Institute of Electrical and Electronics Engineers: Proceedings of the IEEE ; 74. 1986 5 |
Beschreibung: | S. 627 - 745 |
Internformat
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Datensatz im Suchindex
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id | DE-604.BV009220588 |
illustrated | Not Illustrated |
indexdate | 2024-07-09T17:33:21Z |
institution | BVB |
language | English |
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owner_facet | DE-29T |
physical | S. 627 - 745 |
publishDate | 1986 |
publishDateSearch | 1986 |
publishDateSort | 1986 |
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spelling | Fault tolerance in VLSI Special issue on fault tolerance in VLSI New York 1986 S. 627 - 745 txt rdacontent n rdamedia nc rdacarrier In: Institute of Electrical and Electronics Engineers: Proceedings of the IEEE ; 74. 1986 5 Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf (DE-588)4143413-4 Aufsatzsammlung gnd-content Fehlertoleranz (DE-588)4123192-2 s VLSI (DE-588)4117388-0 s DE-604 |
spellingShingle | Fault tolerance in VLSI Fehlertoleranz (DE-588)4123192-2 gnd VLSI (DE-588)4117388-0 gnd |
subject_GND | (DE-588)4123192-2 (DE-588)4117388-0 (DE-588)4143413-4 |
title | Fault tolerance in VLSI |
title_alt | Special issue on fault tolerance in VLSI |
title_auth | Fault tolerance in VLSI |
title_exact_search | Fault tolerance in VLSI |
title_full | Fault tolerance in VLSI |
title_fullStr | Fault tolerance in VLSI |
title_full_unstemmed | Fault tolerance in VLSI |
title_short | Fault tolerance in VLSI |
title_sort | fault tolerance in vlsi |
topic | Fehlertoleranz (DE-588)4123192-2 gnd VLSI (DE-588)4117388-0 gnd |
topic_facet | Fehlertoleranz VLSI Aufsatzsammlung |