Impurity diffusion and gettering in silicon: proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston
Gespeichert in:
Format: | Tagungsbericht Buch |
---|---|
Sprache: | Undetermined |
Veröffentlicht: |
Pittsburgh, Penn.
Materials Research Soc.
1985
|
Schriftenreihe: | Materials Research Society: Materials Research Society symposia proceedings
36 |
Schlagworte: | |
Beschreibung: | XIII, 284 S. Ill., graph. Darst. |
ISBN: | 0931837014 |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV009219304 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | t | ||
008 | 940313s1985 ad|| |||| 10||| und d | ||
020 | |a 0931837014 |9 0-931837-01-4 | ||
035 | |a (OCoLC)632470209 | ||
035 | |a (DE-599)BVBBV009219304 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | |a und | ||
049 | |a DE-29T | ||
245 | 1 | 0 | |a Impurity diffusion and gettering in silicon |b proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston |c Hrsg. von Richard B. Fair* |
264 | 1 | |a Pittsburgh, Penn. |b Materials Research Soc. |c 1985 | |
300 | |a XIII, 284 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a Materials Research Society: Materials Research Society symposia proceedings |v 36 | |
650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Getterung |0 (DE-588)4157223-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Silicium |0 (DE-588)4077445-4 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Diffusion |0 (DE-588)4012277-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Störstelle |0 (DE-588)4193400-3 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1984 |z Boston Mass. |2 gnd-content | |
689 | 0 | 0 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
689 | 0 | 1 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
689 | 0 | |5 DE-604 | |
689 | 1 | 0 | |a Getterung |0 (DE-588)4157223-3 |D s |
689 | 1 | 1 | |a Silicium |0 (DE-588)4077445-4 |D s |
689 | 1 | |5 DE-604 | |
689 | 2 | 0 | |a Störstelle |0 (DE-588)4193400-3 |D s |
689 | 2 | 1 | |a Diffusion |0 (DE-588)4012277-3 |D s |
689 | 2 | 2 | |a Silicium |0 (DE-588)4077445-4 |D s |
689 | 2 | |8 1\p |5 DE-604 | |
700 | 1 | |a Fair, Richard B. |e Sonstige |4 oth | |
711 | 2 | |a Symposium on Impurity Diffusion and Gettering in Semiconductors |d 1984 |c Boston, Mass. |j Sonstige |0 (DE-588)5026036-4 |4 oth | |
830 | 0 | |a Materials Research Society: Materials Research Society symposia proceedings |v 36 |w (DE-604)BV001899105 |9 36 | |
999 | |a oai:aleph.bib-bvb.de:BVB01-006129127 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804123661643284480 |
---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV009219304 |
ctrlnum | (OCoLC)632470209 (DE-599)BVBBV009219304 |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02235nam a2200505 cb4500</leader><controlfield tag="001">BV009219304</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940313s1985 ad|| |||| 10||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0931837014</subfield><subfield code="9">0-931837-01-4</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)632470209</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV009219304</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Impurity diffusion and gettering in silicon</subfield><subfield code="b">proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston</subfield><subfield code="c">Hrsg. von Richard B. Fair*</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Pittsburgh, Penn.</subfield><subfield code="b">Materials Research Soc.</subfield><subfield code="c">1985</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 284 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">36</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Getterung</subfield><subfield code="0">(DE-588)4157223-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Diffusion</subfield><subfield code="0">(DE-588)4012277-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1984</subfield><subfield code="z">Boston Mass.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Getterung</subfield><subfield code="0">(DE-588)4157223-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Störstelle</subfield><subfield code="0">(DE-588)4193400-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Diffusion</subfield><subfield code="0">(DE-588)4012277-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="2"><subfield code="a">Silicium</subfield><subfield code="0">(DE-588)4077445-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Fair, Richard B.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">Symposium on Impurity Diffusion and Gettering in Semiconductors</subfield><subfield code="d">1984</subfield><subfield code="c">Boston, Mass.</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5026036-4</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">36</subfield><subfield code="w">(DE-604)BV001899105</subfield><subfield code="9">36</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-006129127</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift 1984 Boston Mass. gnd-content |
genre_facet | Konferenzschrift 1984 Boston Mass. |
id | DE-604.BV009219304 |
illustrated | Illustrated |
indexdate | 2024-07-09T17:33:19Z |
institution | BVB |
institution_GND | (DE-588)5026036-4 |
isbn | 0931837014 |
language | Undetermined |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-006129127 |
oclc_num | 632470209 |
open_access_boolean | |
owner | DE-29T |
owner_facet | DE-29T |
physical | XIII, 284 S. Ill., graph. Darst. |
publishDate | 1985 |
publishDateSearch | 1985 |
publishDateSort | 1985 |
publisher | Materials Research Soc. |
record_format | marc |
series | Materials Research Society: Materials Research Society symposia proceedings |
series2 | Materials Research Society: Materials Research Society symposia proceedings |
spelling | Impurity diffusion and gettering in silicon proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston Hrsg. von Richard B. Fair* Pittsburgh, Penn. Materials Research Soc. 1985 XIII, 284 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposia proceedings 36 Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Getterung (DE-588)4157223-3 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf Diffusion (DE-588)4012277-3 gnd rswk-swf Störstelle (DE-588)4193400-3 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1984 Boston Mass. gnd-content Gitterbaufehler (DE-588)4125030-8 s Halbleiter (DE-588)4022993-2 s DE-604 Getterung (DE-588)4157223-3 s Silicium (DE-588)4077445-4 s Störstelle (DE-588)4193400-3 s Diffusion (DE-588)4012277-3 s 1\p DE-604 Fair, Richard B. Sonstige oth Symposium on Impurity Diffusion and Gettering in Semiconductors 1984 Boston, Mass. Sonstige (DE-588)5026036-4 oth Materials Research Society: Materials Research Society symposia proceedings 36 (DE-604)BV001899105 36 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Impurity diffusion and gettering in silicon proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston Materials Research Society: Materials Research Society symposia proceedings Gitterbaufehler (DE-588)4125030-8 gnd Getterung (DE-588)4157223-3 gnd Silicium (DE-588)4077445-4 gnd Diffusion (DE-588)4012277-3 gnd Störstelle (DE-588)4193400-3 gnd Halbleiter (DE-588)4022993-2 gnd |
subject_GND | (DE-588)4125030-8 (DE-588)4157223-3 (DE-588)4077445-4 (DE-588)4012277-3 (DE-588)4193400-3 (DE-588)4022993-2 (DE-588)1071861417 |
title | Impurity diffusion and gettering in silicon proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston |
title_auth | Impurity diffusion and gettering in silicon proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston |
title_exact_search | Impurity diffusion and gettering in silicon proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston |
title_full | Impurity diffusion and gettering in silicon proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston Hrsg. von Richard B. Fair* |
title_fullStr | Impurity diffusion and gettering in silicon proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston Hrsg. von Richard B. Fair* |
title_full_unstemmed | Impurity diffusion and gettering in silicon proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston Hrsg. von Richard B. Fair* |
title_short | Impurity diffusion and gettering in silicon |
title_sort | impurity diffusion and gettering in silicon proceedings of the symposium on impurity diffusion and gettering in semiconductors held as symposium c at the materials research soc meeting nov 27 30 1984 in boston |
title_sub | proceedings of the Symposium on Impurity Diffusion and Gettering in Semiconductors held as Symposium C at the Materials Research Soc. Meeting, Nov. 27 - 30, 1984 in Boston |
topic | Gitterbaufehler (DE-588)4125030-8 gnd Getterung (DE-588)4157223-3 gnd Silicium (DE-588)4077445-4 gnd Diffusion (DE-588)4012277-3 gnd Störstelle (DE-588)4193400-3 gnd Halbleiter (DE-588)4022993-2 gnd |
topic_facet | Gitterbaufehler Getterung Silicium Diffusion Störstelle Halbleiter Konferenzschrift 1984 Boston Mass. |
volume_link | (DE-604)BV001899105 |
work_keys_str_mv | AT fairrichardb impuritydiffusionandgetteringinsiliconproceedingsofthesymposiumonimpuritydiffusionandgetteringinsemiconductorsheldassymposiumcatthematerialsresearchsocmeetingnov27301984inboston AT symposiumonimpuritydiffusionandgetteringinsemiconductorsbostonmass impuritydiffusionandgetteringinsiliconproceedingsofthesymposiumonimpuritydiffusionandgetteringinsemiconductorsheldassymposiumcatthematerialsresearchsocmeetingnov27301984inboston |