Hillen, M. W. (1981). Charge trapping near the Si SiO2 interface in semiconductor devices.
Chicago Style (17th ed.) CitationHillen, Michiel W. Charge Trapping Near the Si SiO2 Interface in Semiconductor Devices. 1981.
MLA (9th ed.) CitationHillen, Michiel W. Charge Trapping Near the Si SiO2 Interface in Semiconductor Devices. 1981.
Warning: These citations may not always be 100% accurate.