APA (7th ed.) Citation

Whelan, M. V. (1970). Electrical behaviour of defects at a thermally oxidized silicon surface. Philips.

Chicago Style (17th ed.) Citation

Whelan, Maurice V. Electrical Behaviour of Defects at a Thermally Oxidized Silicon Surface. Eindhoven: Philips, 1970.

MLA (9th ed.) Citation

Whelan, Maurice V. Electrical Behaviour of Defects at a Thermally Oxidized Silicon Surface. Philips, 1970.