Electron beam microanalysis:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Philadelphia, Pa.
1972
|
| Schriftenreihe: | American Society for Testing and Materials: ASTM special technical publication.
506 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | 80 S. |
Internformat
MARC
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| 245 | 1 | 0 | |a Electron beam microanalysis |c Donald R. Beaman ; Jose A. Isasi* |
| 264 | 1 | |a Philadelphia, Pa. |c 1972 | |
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| 490 | 1 | |a American Society for Testing and Materials: ASTM special technical publication. |v 506 | |
| 650 | 4 | |a Microanalyse par sonde électronique | |
| 650 | 4 | |a Microchimie | |
| 650 | 4 | |a Microscopie électronique | |
| 650 | 4 | |a Electron microscopy | |
| 650 | 4 | |a Electron probe microanalysis | |
| 650 | 4 | |a Microchemistry | |
| 650 | 0 | 7 | |a Mikroanalyse |0 (DE-588)4169804-6 |2 gnd |9 rswk-swf |
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| 700 | 1 | |a Isasi, Jose A. |e Verfasser |4 aut | |
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Datensatz im Suchindex
| _version_ | 1804123409963024384 |
|---|---|
| adam_text | Contents
Part I—Fundamentals and Applications
Introduction
The Electron Column
Electron Interactions in Solids
Wavelength Dispersive Spectrometers
Energy Dispersive Spectrometers
Combination Instruments
Auger Electron Spectroscopy
Ion Mass Analyzer and Ion Microprobe Analyzer
Comparison of Analytical Techniques
Automated Instruments
Applications
Suggestions for the Novice
Part II—Experimental Considerations and Quantitative Analysis
Measurement of Accurate X-Ray Intensity Ratios
Quantitative Analysis
Notes Added in Proof
Appendix 1
|
| any_adam_object | 1 |
| author | Beaman, Donald R. Isasi, Jose A. |
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| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
| dewey-raw | 543/.081 |
| dewey-search | 543/.081 |
| dewey-sort | 3543 281 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie |
| format | Book |
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| id | DE-604.BV009053572 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:29:19Z |
| institution | BVB |
| language | English |
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| oclc_num | 320527 |
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| owner_facet | DE-29T DE-83 |
| physical | 80 S. |
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| publishDate | 1972 |
| publishDateSearch | 1972 |
| publishDateSort | 1972 |
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| series | American Society for Testing and Materials: ASTM special technical publication. |
| series2 | American Society for Testing and Materials: ASTM special technical publication. |
| spelling | Beaman, Donald R. Verfasser aut Electron beam microanalysis Donald R. Beaman ; Jose A. Isasi* Philadelphia, Pa. 1972 80 S. txt rdacontent n rdamedia nc rdacarrier American Society for Testing and Materials: ASTM special technical publication. 506 Microanalyse par sonde électronique Microchimie Microscopie électronique Electron microscopy Electron probe microanalysis Microchemistry Mikroanalyse (DE-588)4169804-6 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Mikroanalyse (DE-588)4169804-6 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Isasi, Jose A. Verfasser aut American Society for Testing and Materials: ASTM special technical publication. 506 (DE-604)BV035417629 506 HEBIS Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005992984&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Beaman, Donald R. Isasi, Jose A. Electron beam microanalysis American Society for Testing and Materials: ASTM special technical publication. Microanalyse par sonde électronique Microchimie Microscopie électronique Electron microscopy Electron probe microanalysis Microchemistry Mikroanalyse (DE-588)4169804-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4169804-6 (DE-588)4014327-2 |
| title | Electron beam microanalysis |
| title_auth | Electron beam microanalysis |
| title_exact_search | Electron beam microanalysis |
| title_full | Electron beam microanalysis Donald R. Beaman ; Jose A. Isasi* |
| title_fullStr | Electron beam microanalysis Donald R. Beaman ; Jose A. Isasi* |
| title_full_unstemmed | Electron beam microanalysis Donald R. Beaman ; Jose A. Isasi* |
| title_short | Electron beam microanalysis |
| title_sort | electron beam microanalysis |
| topic | Microanalyse par sonde électronique Microchimie Microscopie électronique Electron microscopy Electron probe microanalysis Microchemistry Mikroanalyse (DE-588)4169804-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Microanalyse par sonde électronique Microchimie Microscopie électronique Electron microscopy Electron probe microanalysis Microchemistry Mikroanalyse Elektronenmikroskopie |
| url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005992984&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
| volume_link | (DE-604)BV035417629 |
| work_keys_str_mv | AT beamandonaldr electronbeammicroanalysis AT isasijosea electronbeammicroanalysis |