Manual on electron metallography techniques:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Philadelphia, Pa.
1973
|
Schriftenreihe: | American Society for Testing and Materials: ASTM special technical publication.
547 |
Schlagworte: | |
Online-Zugang: | Inhaltsverzeichnis |
Beschreibung: | VI, 72 S. |
Internformat
MARC
LEADER | 00000nam a2200000 cb4500 | ||
---|---|---|---|
001 | BV009053571 | ||
003 | DE-604 | ||
005 | 20000720 | ||
007 | t | ||
008 | 940227s1973 |||| 00||| eng d | ||
035 | |a (OCoLC)440778440 | ||
035 | |a (DE-599)BVBBV009053571 | ||
040 | |a DE-604 |b ger |e rakwb | ||
041 | 0 | |a eng | |
049 | |a DE-83 |a DE-706 | ||
084 | |a UQ 7300 |0 (DE-625)146572: |2 rvk | ||
245 | 1 | 0 | |a Manual on electron metallography techniques |c G. N. Maniar ... , coordinators |
264 | 1 | |a Philadelphia, Pa. |c 1973 | |
300 | |a VI, 72 S. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 1 | |a American Society for Testing and Materials: ASTM special technical publication. |v 547 | |
650 | 0 | 7 | |a Metallographie |0 (DE-588)4169614-1 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Metallographie |0 (DE-588)4169614-1 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Maniar, Gunvant N. |e Sonstige |4 oth | |
710 | 2 | |a American Society for Testing and Materials |b Subcommittee E04.11 on Electron Microscopy and Diffraction |e Sonstige |0 (DE-588)16132384-4 |4 oth | |
830 | 0 | |a American Society for Testing and Materials: ASTM special technical publication. |v 547 |w (DE-604)BV035417629 |9 547 | |
856 | 4 | 2 | |m HEBIS Datenaustausch |q application/pdf |u http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005992983&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |3 Inhaltsverzeichnis |
940 | 1 | |q TUB-nseb | |
999 | |a oai:aleph.bib-bvb.de:BVB01-005992983 |
Datensatz im Suchindex
_version_ | 1804123409955684352 |
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adam_text | Contents
Introduction 1
Chapter 1—Procedures for Standard Replication Techniques for Elec-
tron Microscopy 3
1 1 Introduction 3
1 2 Specimen Preparation for Replication 3
121 Mounting 3
122 Polishing 4
123 Etching 5
1 3 Replication 6
131 Direct Methods 6
132 Indirect Methods 13
133 Fracture Replication 15
1 4 Summary 17
References 18
Chapter 2—Extraction Replica Techniques 19
2 1 Introduction 19
2 2 General Methods 19
221 Direct Stripped Plastic Extraction Replicas 20
222 Indirect Stripped Plastic Extraction Replicas 20
223 Positive Carbon Extraction Replica 21
224 Direct Carbon Extraction Replica 22
225 Extraction Replicas Removed by Two Stage Etching 22
226 Replication of Thin Surface Films 22
227 Aluminum Oxide Extraction Replica 23
2 3 Tables of Extraction Replica Techniques 24
2 4 Bibliography 24
References 24
Chapter 3—Thin Foil Preparation for Transmission Electron Microscopy 29
3 1 Introduction 29
3 2 Bulk Thinning to 500 /im (0 5 mm) 29
321 Cutoff Wheel 29
322 Spark Machining 30
323 Electrolytic Acid Saw and Acid Planing Wheel 30
3 3 Prethinning to 50 jum (0 05 mm) 30
331 Surface Grinding and Hand Grinding 30
332 Cold Rolling 31
333 Chemical Prethinning 31
334 Electrolytic and Jet Prethinning 31
v
3 4 Final Thinning to Less Than 0 5 jUm 31
341 Bollmann Method 31
342 Window Method 32
343 Disa Electropol Polishing 33
344 Chemical Polishing 33
345 Electrolytic and Automatic Jet Polishing 33
3 5 Unique Thinning Techniques 34
351 Small Diameter Wires 34
352 Microtomy 34
353 Ion Micro Milling 34
3 6 General Precautions 35
361 Mixing Electrolytes 35
362 Polishing Film and Staining 35
363 Electrolyte and Specimen Temperature 35
364 Cutting and Mounting 36
3 7 Summary 36
3 8 Acknowledgments 37
Appendix 3 1 37
Appendix 3 2 37
References 39
Chapter 4—Selected Area Electron Diffraction Analysis of Extraction
Replica and Thin Foil Specimens in the Transmission Electron
Microscope 41
4 1 Introduction 41
Part I—Particle or Second Phase Identification Using Extraction
Replica and Selected Area Electron Diffraction 42
4 2 Introduction 42
4 3 Technique for Preparing Extraction Replicas 42
4 4 Indexing Selected Area Electron Diffraction Patterns 43
441 Calibration of the Microscope Constant 43
442 Identification of Unknown Diffraction Patterns 45
443 Indexing Simple Single Particle Spot Patterns 45
4 5 Summary 50
Part II—Analysis of Crystallographic Features and Defects in Thin
Foil Specimens 51
4 6 Introduction 51
4 7 Steps in the Solution of a Selected Area Spot Electron Dif-
fraction Pattern of a Thin Foil Specimen 52
Appendix 4 1 60
Appendix 4 2 61
Appendix 4 3 62
Appendix 4 4 68
References 72
|
any_adam_object | 1 |
building | Verbundindex |
bvnumber | BV009053571 |
classification_rvk | UQ 7300 |
ctrlnum | (OCoLC)440778440 (DE-599)BVBBV009053571 |
discipline | Physik |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01516nam a2200349 cb4500</leader><controlfield tag="001">BV009053571</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20000720 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940227s1973 |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)440778440</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV009053571</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-83</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 7300</subfield><subfield code="0">(DE-625)146572:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Manual on electron metallography techniques</subfield><subfield code="c">G. N. Maniar ... , coordinators</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Philadelphia, Pa.</subfield><subfield code="c">1973</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 72 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">American Society for Testing and Materials: ASTM special technical publication.</subfield><subfield code="v">547</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Metallographie</subfield><subfield code="0">(DE-588)4169614-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Metallographie</subfield><subfield code="0">(DE-588)4169614-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Maniar, Gunvant N.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">American Society for Testing and Materials</subfield><subfield code="b">Subcommittee E04.11 on Electron Microscopy and Diffraction</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)16132384-4</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">American Society for Testing and Materials: ASTM special technical publication.</subfield><subfield code="v">547</subfield><subfield code="w">(DE-604)BV035417629</subfield><subfield code="9">547</subfield></datafield><datafield tag="856" ind1="4" ind2="2"><subfield code="m">HEBIS Datenaustausch</subfield><subfield code="q">application/pdf</subfield><subfield code="u">http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005992983&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA</subfield><subfield code="3">Inhaltsverzeichnis</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">TUB-nseb</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005992983</subfield></datafield></record></collection> |
id | DE-604.BV009053571 |
illustrated | Not Illustrated |
indexdate | 2024-07-09T17:29:19Z |
institution | BVB |
institution_GND | (DE-588)16132384-4 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005992983 |
oclc_num | 440778440 |
open_access_boolean | |
owner | DE-83 DE-706 |
owner_facet | DE-83 DE-706 |
physical | VI, 72 S. |
psigel | TUB-nseb |
publishDate | 1973 |
publishDateSearch | 1973 |
publishDateSort | 1973 |
record_format | marc |
series | American Society for Testing and Materials: ASTM special technical publication. |
series2 | American Society for Testing and Materials: ASTM special technical publication. |
spelling | Manual on electron metallography techniques G. N. Maniar ... , coordinators Philadelphia, Pa. 1973 VI, 72 S. txt rdacontent n rdamedia nc rdacarrier American Society for Testing and Materials: ASTM special technical publication. 547 Metallographie (DE-588)4169614-1 gnd rswk-swf Metallographie (DE-588)4169614-1 s DE-604 Maniar, Gunvant N. Sonstige oth American Society for Testing and Materials Subcommittee E04.11 on Electron Microscopy and Diffraction Sonstige (DE-588)16132384-4 oth American Society for Testing and Materials: ASTM special technical publication. 547 (DE-604)BV035417629 547 HEBIS Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005992983&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
spellingShingle | Manual on electron metallography techniques American Society for Testing and Materials: ASTM special technical publication. Metallographie (DE-588)4169614-1 gnd |
subject_GND | (DE-588)4169614-1 |
title | Manual on electron metallography techniques |
title_auth | Manual on electron metallography techniques |
title_exact_search | Manual on electron metallography techniques |
title_full | Manual on electron metallography techniques G. N. Maniar ... , coordinators |
title_fullStr | Manual on electron metallography techniques G. N. Maniar ... , coordinators |
title_full_unstemmed | Manual on electron metallography techniques G. N. Maniar ... , coordinators |
title_short | Manual on electron metallography techniques |
title_sort | manual on electron metallography techniques |
topic | Metallographie (DE-588)4169614-1 gnd |
topic_facet | Metallographie |
url | http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005992983&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA |
volume_link | (DE-604)BV035417629 |
work_keys_str_mv | AT maniargunvantn manualonelectronmetallographytechniques AT americansocietyfortestingandmaterialssubcommitteee0411onelectronmicroscopyanddiffraction manualonelectronmetallographytechniques |