Integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
New York u.a.
McGraw-Hill
1967
|
| Subjects: | |
| Physical Description: | XII, 340 S. |
Staff View
MARC
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| 245 | 1 | 0 | |a Integrated circuit technology |b instrumentation and techniques for measurement, process, and failure analysis |c ed. by Seymour Schwartz |
| 264 | 1 | |a New York u.a. |b McGraw-Hill |c 1967 | |
| 300 | |a XII, 340 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
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| 650 | 4 | |a Circuitos electrónicos | |
| 650 | 4 | |a Circuits intégrés | |
| 650 | 4 | |a Ingeniería eléctrica | |
| 650 | 4 | |a Integrated circuits | |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
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| 689 | 0 | |5 DE-604 | |
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| 940 | 1 | |q TUB-nseb | |
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Record in the Search Index
| _version_ | 1804123400465022976 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV009045264 |
| callnumber-first | T - Technology |
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| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)2118269 (DE-599)BVBBV009045264 |
| dewey-full | 621.3817 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3817 |
| dewey-search | 621.3817 |
| dewey-sort | 3621.3817 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV009045264 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:29:10Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005985914 |
| oclc_num | 2118269 |
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| physical | XII, 340 S. |
| psigel | TUB-nseb |
| publishDate | 1967 |
| publishDateSearch | 1967 |
| publishDateSort | 1967 |
| publisher | McGraw-Hill |
| record_format | marc |
| spelling | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis ed. by Seymour Schwartz New York u.a. McGraw-Hill 1967 XII, 340 S. txt rdacontent n rdamedia nc rdacarrier Circuitos electrónicos Circuits intégrés Ingeniería eléctrica Integrated circuits Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s DE-604 Schwartz, Seymour Sonstige oth |
| spellingShingle | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis Circuitos electrónicos Circuits intégrés Ingeniería eléctrica Integrated circuits Integrierte Schaltung (DE-588)4027242-4 gnd |
| subject_GND | (DE-588)4027242-4 |
| title | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis |
| title_auth | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis |
| title_exact_search | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis |
| title_full | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis ed. by Seymour Schwartz |
| title_fullStr | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis ed. by Seymour Schwartz |
| title_full_unstemmed | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis ed. by Seymour Schwartz |
| title_short | Integrated circuit technology |
| title_sort | integrated circuit technology instrumentation and techniques for measurement process and failure analysis |
| title_sub | instrumentation and techniques for measurement, process, and failure analysis |
| topic | Circuitos electrónicos Circuits intégrés Ingeniería eléctrica Integrated circuits Integrierte Schaltung (DE-588)4027242-4 gnd |
| topic_facet | Circuitos electrónicos Circuits intégrés Ingeniería eléctrica Integrated circuits Integrierte Schaltung |
| work_keys_str_mv | AT schwartzseymour integratedcircuittechnologyinstrumentationandtechniquesformeasurementprocessandfailureanalysis |