Integrated circuit technology: instrumentation and techniques for measurement, process, and failure analysis
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
New York u.a.
McGraw-Hill
1967
|
Schlagworte: | |
Beschreibung: | XII, 340 S. |
Internformat
MARC
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001 | BV009045264 | ||
003 | DE-604 | ||
005 | 20030712 | ||
007 | t | ||
008 | 940227s1967 |||| 00||| eng d | ||
035 | |a (OCoLC)2118269 | ||
035 | |a (DE-599)BVBBV009045264 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-29T |a DE-91 |a DE-83 | ||
050 | 0 | |a TK7874 | |
082 | 0 | |a 621.3817 | |
245 | 1 | 0 | |a Integrated circuit technology |b instrumentation and techniques for measurement, process, and failure analysis |c ed. by Seymour Schwartz |
264 | 1 | |a New York u.a. |b McGraw-Hill |c 1967 | |
300 | |a XII, 340 S. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Circuitos electrónicos | |
650 | 4 | |a Circuits intégrés | |
650 | 4 | |a Ingeniería eléctrica | |
650 | 4 | |a Integrated circuits | |
650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Schwartz, Seymour |e Sonstige |4 oth | |
940 | 1 | |q TUB-nseb | |
999 | |a oai:aleph.bib-bvb.de:BVB01-005985914 |
Datensatz im Suchindex
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---|---|
any_adam_object | |
building | Verbundindex |
bvnumber | BV009045264 |
callnumber-first | T - Technology |
callnumber-label | TK7874 |
callnumber-raw | TK7874 |
callnumber-search | TK7874 |
callnumber-sort | TK 47874 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
ctrlnum | (OCoLC)2118269 (DE-599)BVBBV009045264 |
dewey-full | 621.3817 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.3817 |
dewey-search | 621.3817 |
dewey-sort | 3621.3817 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Book |
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id | DE-604.BV009045264 |
illustrated | Not Illustrated |
indexdate | 2024-07-09T17:29:10Z |
institution | BVB |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005985914 |
oclc_num | 2118269 |
open_access_boolean | |
owner | DE-29T DE-91 DE-BY-TUM DE-83 |
owner_facet | DE-29T DE-91 DE-BY-TUM DE-83 |
physical | XII, 340 S. |
psigel | TUB-nseb |
publishDate | 1967 |
publishDateSearch | 1967 |
publishDateSort | 1967 |
publisher | McGraw-Hill |
record_format | marc |
spelling | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis ed. by Seymour Schwartz New York u.a. McGraw-Hill 1967 XII, 340 S. txt rdacontent n rdamedia nc rdacarrier Circuitos electrónicos Circuits intégrés Ingeniería eléctrica Integrated circuits Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 s DE-604 Schwartz, Seymour Sonstige oth |
spellingShingle | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis Circuitos electrónicos Circuits intégrés Ingeniería eléctrica Integrated circuits Integrierte Schaltung (DE-588)4027242-4 gnd |
subject_GND | (DE-588)4027242-4 |
title | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis |
title_auth | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis |
title_exact_search | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis |
title_full | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis ed. by Seymour Schwartz |
title_fullStr | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis ed. by Seymour Schwartz |
title_full_unstemmed | Integrated circuit technology instrumentation and techniques for measurement, process, and failure analysis ed. by Seymour Schwartz |
title_short | Integrated circuit technology |
title_sort | integrated circuit technology instrumentation and techniques for measurement process and failure analysis |
title_sub | instrumentation and techniques for measurement, process, and failure analysis |
topic | Circuitos electrónicos Circuits intégrés Ingeniería eléctrica Integrated circuits Integrierte Schaltung (DE-588)4027242-4 gnd |
topic_facet | Circuitos electrónicos Circuits intégrés Ingeniería eléctrica Integrated circuits Integrierte Schaltung |
work_keys_str_mv | AT schwartzseymour integratedcircuittechnologyinstrumentationandtechniquesformeasurementprocessandfailureanalysis |