Electron microscopy of thin crystals:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
New York
Plenum Pr.
1965
|
| Schlagworte: | |
| Beschreibung: | VIII, 549 S. |
Internformat
MARC
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| 245 | 1 | 0 | |a Electron microscopy of thin crystals |c Mitarb.: Peter B. Hirsch ; A. Howie ; R. B. Nicholson* |
| 264 | 1 | |a New York |b Plenum Pr. |c 1965 | |
| 300 | |a VIII, 549 S. | ||
| 336 | |b txt |2 rdacontent | ||
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| 650 | 0 | 7 | |a Dünne Schicht |0 (DE-588)4136925-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
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| 689 | 0 | |5 DE-604 | |
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| 689 | 1 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Hirsch, Peter B. |d 1925- |e Sonstige |0 (DE-588)124650880 |4 oth | |
| 700 | 1 | |a Howie, A. |e Sonstige |4 oth | |
| 700 | 1 | |a Nicholson, R. B. |e Sonstige |4 oth | |
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Datensatz im Suchindex
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| building | Verbundindex |
| bvnumber | BV009045211 |
| classification_rvk | UQ 5500 |
| ctrlnum | (OCoLC)634507898 (DE-599)BVBBV009045211 |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV009045211 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:29:10Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005985876 |
| oclc_num | 634507898 |
| open_access_boolean | |
| owner | DE-29T DE-20 DE-19 DE-BY-UBM DE-91 DE-BY-TUM |
| owner_facet | DE-29T DE-20 DE-19 DE-BY-UBM DE-91 DE-BY-TUM |
| physical | VIII, 549 S. |
| publishDate | 1965 |
| publishDateSearch | 1965 |
| publishDateSort | 1965 |
| publisher | Plenum Pr. |
| record_format | marc |
| spelling | Electron microscopy of thin crystals Mitarb.: Peter B. Hirsch ; A. Howie ; R. B. Nicholson* New York Plenum Pr. 1965 VIII, 549 S. txt rdacontent n rdamedia nc rdacarrier Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Kristall (DE-588)4033209-3 gnd rswk-swf Dünne Schicht (DE-588)4136925-7 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Kristall (DE-588)4033209-3 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Dünne Schicht (DE-588)4136925-7 s Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s 1\p DE-604 Hirsch, Peter B. 1925- Sonstige (DE-588)124650880 oth Howie, A. Sonstige oth Nicholson, R. B. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Electron microscopy of thin crystals Elektronenmikroskopie (DE-588)4014327-2 gnd Kristall (DE-588)4033209-3 gnd Dünne Schicht (DE-588)4136925-7 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4033209-3 (DE-588)4136925-7 (DE-588)4215608-7 |
| title | Electron microscopy of thin crystals |
| title_auth | Electron microscopy of thin crystals |
| title_exact_search | Electron microscopy of thin crystals |
| title_full | Electron microscopy of thin crystals Mitarb.: Peter B. Hirsch ; A. Howie ; R. B. Nicholson* |
| title_fullStr | Electron microscopy of thin crystals Mitarb.: Peter B. Hirsch ; A. Howie ; R. B. Nicholson* |
| title_full_unstemmed | Electron microscopy of thin crystals Mitarb.: Peter B. Hirsch ; A. Howie ; R. B. Nicholson* |
| title_short | Electron microscopy of thin crystals |
| title_sort | electron microscopy of thin crystals |
| topic | Elektronenmikroskopie (DE-588)4014327-2 gnd Kristall (DE-588)4033209-3 gnd Dünne Schicht (DE-588)4136925-7 gnd Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd |
| topic_facet | Elektronenmikroskopie Kristall Dünne Schicht Durchstrahlungselektronenmikroskopie |
| work_keys_str_mv | AT hirschpeterb electronmicroscopyofthincrystals AT howiea electronmicroscopyofthincrystals AT nicholsonrb electronmicroscopyofthincrystals |