Eleventh Annual 1993 IEEE VLSI Test Symposium: April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | English |
| Veröffentlicht: |
Los Alamitos, Calif. u.a.
IEEE Computer Soc. Press
1993
|
| Schlagworte: | |
| Beschreibung: | XIII, 365 S. |
| ISBN: | 0818638303 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV009035152 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 940227s1993 |||| 10||| eng d | ||
| 020 | |a 0818638303 |9 0-8186-3830-3 | ||
| 035 | |a (OCoLC)29025394 | ||
| 035 | |a (DE-599)BVBBV009035152 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.39/5/0287 |2 20 | |
| 111 | 2 | |a VLSI Test Symposium |n 11 |d 1993 |c Atlantic City, NJ |j Verfasser |0 (DE-588)5090847-9 |4 aut | |
| 245 | 1 | 0 | |a Eleventh Annual 1993 IEEE VLSI Test Symposium |b April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers |
| 264 | 1 | |a Los Alamitos, Calif. u.a. |b IEEE Computer Soc. Press |c 1993 | |
| 300 | |a XIII, 365 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing |v Congresses | |
| 650 | 0 | 7 | |a Testen |0 (DE-588)4367264-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1993 |z Atlantic City NJ |2 gnd-content | |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Testen |0 (DE-588)4367264-4 |D s |
| 689 | 0 | |5 DE-604 | |
| 710 | 2 | |a Institute of Electrical and Electronics Engineers |e Sonstige |0 (DE-588)1692-5 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-005977635 | ||
Datensatz im Suchindex
| _version_ | 1804123388687417344 |
|---|---|
| any_adam_object | |
| author_corporate | VLSI Test Symposium Atlantic City, NJ |
| author_corporate_role | aut |
| author_facet | VLSI Test Symposium Atlantic City, NJ |
| author_sort | VLSI Test Symposium Atlantic City, NJ |
| building | Verbundindex |
| bvnumber | BV009035152 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)29025394 (DE-599)BVBBV009035152 |
| dewey-full | 621.39/5/0287 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5/0287 |
| dewey-search | 621.39/5/0287 |
| dewey-sort | 3621.39 15 3287 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01385nam a2200373 c 4500</leader><controlfield tag="001">BV009035152</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940227s1993 |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818638303</subfield><subfield code="9">0-8186-3830-3</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)29025394</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV009035152</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.39/5/0287</subfield><subfield code="2">20</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">VLSI Test Symposium</subfield><subfield code="n">11</subfield><subfield code="d">1993</subfield><subfield code="c">Atlantic City, NJ</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)5090847-9</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Eleventh Annual 1993 IEEE VLSI Test Symposium</subfield><subfield code="b">April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Los Alamitos, Calif. u.a.</subfield><subfield code="b">IEEE Computer Soc. Press</subfield><subfield code="c">1993</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 365 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1993</subfield><subfield code="z">Atlantic City NJ</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">VLSI</subfield><subfield code="0">(DE-588)4117388-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Testen</subfield><subfield code="0">(DE-588)4367264-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="710" ind1="2" ind2=" "><subfield code="a">Institute of Electrical and Electronics Engineers</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)1692-5</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005977635</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1993 Atlantic City NJ gnd-content |
| genre_facet | Konferenzschrift 1993 Atlantic City NJ |
| id | DE-604.BV009035152 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:28:59Z |
| institution | BVB |
| institution_GND | (DE-588)5090847-9 (DE-588)1692-5 |
| isbn | 0818638303 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005977635 |
| oclc_num | 29025394 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XIII, 365 S. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | IEEE Computer Soc. Press |
| record_format | marc |
| spelling | VLSI Test Symposium 11 1993 Atlantic City, NJ Verfasser (DE-588)5090847-9 aut Eleventh Annual 1993 IEEE VLSI Test Symposium April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers Los Alamitos, Calif. u.a. IEEE Computer Soc. Press 1993 XIII, 365 S. txt rdacontent n rdamedia nc rdacarrier Integrated circuits Very large scale integration Testing Congresses Testen (DE-588)4367264-4 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1993 Atlantic City NJ gnd-content VLSI (DE-588)4117388-0 s Testen (DE-588)4367264-4 s DE-604 Institute of Electrical and Electronics Engineers Sonstige (DE-588)1692-5 oth |
| spellingShingle | Eleventh Annual 1993 IEEE VLSI Test Symposium April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers Integrated circuits Very large scale integration Testing Congresses Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4117388-0 (DE-588)1071861417 |
| title | Eleventh Annual 1993 IEEE VLSI Test Symposium April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers |
| title_auth | Eleventh Annual 1993 IEEE VLSI Test Symposium April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers |
| title_exact_search | Eleventh Annual 1993 IEEE VLSI Test Symposium April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers |
| title_full | Eleventh Annual 1993 IEEE VLSI Test Symposium April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers |
| title_fullStr | Eleventh Annual 1993 IEEE VLSI Test Symposium April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers |
| title_full_unstemmed | Eleventh Annual 1993 IEEE VLSI Test Symposium April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers |
| title_short | Eleventh Annual 1993 IEEE VLSI Test Symposium |
| title_sort | eleventh annual 1993 ieee vlsi test symposium april 6 8 1993 atlantic city new jersey digest of papers |
| title_sub | April 6 - 8, 1993, Atlantic City, New Jersey ; digest of papers |
| topic | Integrated circuits Very large scale integration Testing Congresses Testen (DE-588)4367264-4 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Integrated circuits Very large scale integration Testing Congresses Testen VLSI Konferenzschrift 1993 Atlantic City NJ |
| work_keys_str_mv | AT vlsitestsymposiumatlanticcitynj eleventhannual1993ieeevlsitestsymposiumapril681993atlanticcitynewjerseydigestofpapers AT instituteofelectricalandelectronicsengineers eleventhannual1993ieeevlsitestsymposiumapril681993atlanticcitynewjerseydigestofpapers |