New trends in ion-beam analysis:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Amsterdam
Elsevier
1992
|
| Schriftenreihe: | Surface science reports
16,7 |
| Schlagworte: | |
| Beschreibung: | Stücktitelaufn. zu e. Zeitschriftenh. |
| Beschreibung: | S. 334 - 375 |
Internformat
MARC
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Datensatz im Suchindex
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| any_adam_object | |
| author | David, Daniel |
| author_facet | David, Daniel |
| author_role | aut |
| author_sort | David, Daniel |
| author_variant | d d dd |
| building | Verbundindex |
| bvnumber | BV009005411 |
| ctrlnum | (OCoLC)633547592 (DE-599)BVBBV009005411 |
| format | Book |
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| id | DE-604.BV009005411 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:28:24Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005952592 |
| oclc_num | 633547592 |
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| owner_facet | DE-29T |
| physical | S. 334 - 375 |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Elsevier |
| record_format | marc |
| series2 | Surface science reports |
| spelling | David, Daniel Verfasser aut New trends in ion-beam analysis Daniel David Amsterdam Elsevier 1992 S. 334 - 375 txt rdacontent n rdamedia nc rdacarrier Surface science reports 16,7 Stücktitelaufn. zu e. Zeitschriftenh. Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 |
| spellingShingle | David, Daniel New trends in ion-beam analysis Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4077346-2 |
| title | New trends in ion-beam analysis |
| title_auth | New trends in ion-beam analysis |
| title_exact_search | New trends in ion-beam analysis |
| title_full | New trends in ion-beam analysis Daniel David |
| title_fullStr | New trends in ion-beam analysis Daniel David |
| title_full_unstemmed | New trends in ion-beam analysis Daniel David |
| title_short | New trends in ion-beam analysis |
| title_sort | new trends in ion beam analysis |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie |
| work_keys_str_mv | AT daviddaniel newtrendsinionbeamanalysis |