Special issue: Selected papers from the 1989 International Test Conference:
Gespeichert in:
| Körperschaft: | |
|---|---|
| Format: | Tagungsbericht Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
New York, NY
1992
|
| Schlagworte: | |
| Beschreibung: | In: Institute of Electrical and Electronics Engineers: IEEE transactions on computer-aided design of integrated circuits and systems ; 11 (1992) 1 |
| Beschreibung: | 136 S. |
Internformat
MARC
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| spelling | International Test Conference 20 1989 Washington, DC Verfasser (DE-588)5043900-5 aut Special issue: Selected papers from the 1989 International Test Conference [Michael R. Lightner, ed.] New York, NY 1992 136 S. txt rdacontent n rdamedia nc rdacarrier In: Institute of Electrical and Electronics Engineers: IEEE transactions on computer-aided design of integrated circuits and systems ; 11 (1992) 1 Test (DE-588)4059549-3 gnd rswk-swf Stromkreis (DE-588)4183738-1 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Stromkreis (DE-588)4183738-1 s Test (DE-588)4059549-3 s DE-604 Lightner, Michael R. Sonstige oth |
| spellingShingle | Special issue: Selected papers from the 1989 International Test Conference Test (DE-588)4059549-3 gnd Stromkreis (DE-588)4183738-1 gnd |
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| title | Special issue: Selected papers from the 1989 International Test Conference |
| title_auth | Special issue: Selected papers from the 1989 International Test Conference |
| title_exact_search | Special issue: Selected papers from the 1989 International Test Conference |
| title_full | Special issue: Selected papers from the 1989 International Test Conference [Michael R. Lightner, ed.] |
| title_fullStr | Special issue: Selected papers from the 1989 International Test Conference [Michael R. Lightner, ed.] |
| title_full_unstemmed | Special issue: Selected papers from the 1989 International Test Conference [Michael R. Lightner, ed.] |
| title_short | Special issue: Selected papers from the 1989 International Test Conference |
| title_sort | special issue selected papers from the 1989 international test conference |
| topic | Test (DE-588)4059549-3 gnd Stromkreis (DE-588)4183738-1 gnd |
| topic_facet | Test Stromkreis Konferenzschrift |
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