Assessing fault model and test quality:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Boston u.a.
Kluwer Acad. Press
|
| Schriftenreihe: | The Kluwer international series in engineering and computer science
157.: VLSI, computer architecture and digital signal processing |
| Schlagworte: | |
| Beschreibung: | XVIII, 132 S. graph. Darst. |
| ISBN: | 0792392221 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV008993726 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 940206nuuuuuuuu d||| |||| 00||| eng d | ||
| 020 | |a 0792392221 |9 0-7923-9222-1 | ||
| 035 | |a (OCoLC)24379197 | ||
| 035 | |a (DE-599)BVBBV008993726 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 050 | 0 | |a TK7874 | |
| 082 | 0 | |a 621.381/5 |2 20 | |
| 100 | 1 | |a Butler, Kenneth M. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Assessing fault model and test quality |c Kenneth M. Butler ; M. Ray Mercer |
| 264 | 1 | |a Boston u.a. |b Kluwer Acad. Press | |
| 300 | |a XVIII, 132 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a The Kluwer international series in engineering and computer science |v 157.: VLSI, computer architecture and digital signal processing | |
| 650 | 4 | |a Digital integrated circuits |x Testing | |
| 650 | 4 | |a Integrated circuits |x Fault tolerance | |
| 650 | 0 | 7 | |a Datenverarbeitung |0 (DE-588)4011152-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Test |0 (DE-588)4059549-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Digitalschaltung |0 (DE-588)4012295-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Fehlertoleranz |0 (DE-588)4123192-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Digitale integrierte Schaltung |0 (DE-588)4113313-4 |D s |
| 689 | 0 | 1 | |a Test |0 (DE-588)4059549-3 |D s |
| 689 | 0 | 2 | |a Fehlertoleranz |0 (DE-588)4123192-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Digitalschaltung |0 (DE-588)4012295-5 |D s |
| 689 | 1 | 1 | |a Test |0 (DE-588)4059549-3 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 689 | 2 | 0 | |a Datenverarbeitung |0 (DE-588)4011152-0 |D s |
| 689 | 2 | 1 | |a Fehlertoleranz |0 (DE-588)4123192-2 |D s |
| 689 | 2 | |8 2\p |5 DE-604 | |
| 700 | 1 | |a Mercer, Melvin R. |e Verfasser |4 aut | |
| 830 | 0 | |a The Kluwer international series in engineering and computer science |v 157.: VLSI, computer architecture and digital signal processing |w (DE-604)BV023545171 |9 157 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-005942452 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804123336305803264 |
|---|---|
| any_adam_object | |
| author | Butler, Kenneth M. Mercer, Melvin R. |
| author_facet | Butler, Kenneth M. Mercer, Melvin R. |
| author_role | aut aut |
| author_sort | Butler, Kenneth M. |
| author_variant | k m b km kmb m r m mr mrm |
| building | Verbundindex |
| bvnumber | BV008993726 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| ctrlnum | (OCoLC)24379197 (DE-599)BVBBV008993726 |
| dewey-full | 621.381/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.381/5 |
| dewey-search | 621.381/5 |
| dewey-sort | 3621.381 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>02235nam a2200541 cb4500</leader><controlfield tag="001">BV008993726</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940206nuuuuuuuu d||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0792392221</subfield><subfield code="9">0-7923-9222-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)24379197</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV008993726</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381/5</subfield><subfield code="2">20</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Butler, Kenneth M.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Assessing fault model and test quality</subfield><subfield code="c">Kenneth M. Butler ; M. Ray Mercer</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Boston u.a.</subfield><subfield code="b">Kluwer Acad. Press</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XVIII, 132 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">The Kluwer international series in engineering and computer science</subfield><subfield code="v">157.: VLSI, computer architecture and digital signal processing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Digital integrated circuits</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Fault tolerance</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Datenverarbeitung</subfield><subfield code="0">(DE-588)4011152-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Digitale integrierte Schaltung</subfield><subfield code="0">(DE-588)4113313-4</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Digitalschaltung</subfield><subfield code="0">(DE-588)4012295-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Digitale integrierte Schaltung</subfield><subfield code="0">(DE-588)4113313-4</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Digitalschaltung</subfield><subfield code="0">(DE-588)4012295-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Test</subfield><subfield code="0">(DE-588)4059549-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Datenverarbeitung</subfield><subfield code="0">(DE-588)4011152-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2="1"><subfield code="a">Fehlertoleranz</subfield><subfield code="0">(DE-588)4123192-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Mercer, Melvin R.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">The Kluwer international series in engineering and computer science</subfield><subfield code="v">157.: VLSI, computer architecture and digital signal processing</subfield><subfield code="w">(DE-604)BV023545171</subfield><subfield code="9">157</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005942452</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV008993726 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:28:09Z |
| institution | BVB |
| isbn | 0792392221 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005942452 |
| oclc_num | 24379197 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XVIII, 132 S. graph. Darst. |
| publishDateSort | 0000 |
| publisher | Kluwer Acad. Press |
| record_format | marc |
| series | The Kluwer international series in engineering and computer science |
| series2 | The Kluwer international series in engineering and computer science |
| spelling | Butler, Kenneth M. Verfasser aut Assessing fault model and test quality Kenneth M. Butler ; M. Ray Mercer Boston u.a. Kluwer Acad. Press XVIII, 132 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier The Kluwer international series in engineering and computer science 157.: VLSI, computer architecture and digital signal processing Digital integrated circuits Testing Integrated circuits Fault tolerance Datenverarbeitung (DE-588)4011152-0 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 gnd rswk-swf Digitalschaltung (DE-588)4012295-5 gnd rswk-swf Fehlertoleranz (DE-588)4123192-2 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 s Test (DE-588)4059549-3 s Fehlertoleranz (DE-588)4123192-2 s DE-604 Digitalschaltung (DE-588)4012295-5 s 1\p DE-604 Datenverarbeitung (DE-588)4011152-0 s 2\p DE-604 Mercer, Melvin R. Verfasser aut The Kluwer international series in engineering and computer science 157.: VLSI, computer architecture and digital signal processing (DE-604)BV023545171 157 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Butler, Kenneth M. Mercer, Melvin R. Assessing fault model and test quality The Kluwer international series in engineering and computer science Digital integrated circuits Testing Integrated circuits Fault tolerance Datenverarbeitung (DE-588)4011152-0 gnd Test (DE-588)4059549-3 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd Digitalschaltung (DE-588)4012295-5 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
| subject_GND | (DE-588)4011152-0 (DE-588)4059549-3 (DE-588)4113313-4 (DE-588)4012295-5 (DE-588)4123192-2 |
| title | Assessing fault model and test quality |
| title_auth | Assessing fault model and test quality |
| title_exact_search | Assessing fault model and test quality |
| title_full | Assessing fault model and test quality Kenneth M. Butler ; M. Ray Mercer |
| title_fullStr | Assessing fault model and test quality Kenneth M. Butler ; M. Ray Mercer |
| title_full_unstemmed | Assessing fault model and test quality Kenneth M. Butler ; M. Ray Mercer |
| title_short | Assessing fault model and test quality |
| title_sort | assessing fault model and test quality |
| topic | Digital integrated circuits Testing Integrated circuits Fault tolerance Datenverarbeitung (DE-588)4011152-0 gnd Test (DE-588)4059549-3 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd Digitalschaltung (DE-588)4012295-5 gnd Fehlertoleranz (DE-588)4123192-2 gnd |
| topic_facet | Digital integrated circuits Testing Integrated circuits Fault tolerance Datenverarbeitung Test Digitale integrierte Schaltung Digitalschaltung Fehlertoleranz |
| volume_link | (DE-604)BV023545171 |
| work_keys_str_mv | AT butlerkennethm assessingfaultmodelandtestquality AT mercermelvinr assessingfaultmodelandtestquality |