Defect recognition in semiconductors before and after processing: proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK
Saved in:
| Format: | Conference Proceeding Book |
|---|---|
| Language: | Undetermined |
| Published: |
Redcliffe Way
IOP Publ.
1992
|
| Subjects: | |
| Item Description: | In: Semiconductor science and technology ; 7 (1992) 1,1 |
| Physical Description: | 310 S. |
Staff View
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV008979671 | ||
| 003 | DE-604 | ||
| 005 | 19960709 | ||
| 007 | t | ||
| 008 | 940206s1992 |||| 10||| und d | ||
| 035 | |a (OCoLC)632851386 | ||
| 035 | |a (DE-599)BVBBV008979671 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 049 | |a DE-29T | ||
| 245 | 1 | 0 | |a Defect recognition in semiconductors before and after processing |b proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK |
| 264 | 1 | |a Redcliffe Way |b IOP Publ. |c 1992 | |
| 300 | |a 310 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 500 | |a In: Semiconductor science and technology ; 7 (1992) 1,1 | ||
| 650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1991 |z Wilmslow |2 gnd-content | |
| 689 | 0 | 0 | |a Gitterbaufehler |0 (DE-588)4125030-8 |D s |
| 689 | 0 | 1 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 711 | 2 | |a DRIP |n 4 |d 1991 |c Wilmslow |j Sonstige |0 (DE-588)5066074-3 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-005930361 | ||
Record in the Search Index
| _version_ | 1804123318418145280 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV008979671 |
| ctrlnum | (OCoLC)632851386 (DE-599)BVBBV008979671 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01177nam a2200325 c 4500</leader><controlfield tag="001">BV008979671</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19960709 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940206s1992 |||| 10||| und d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)632851386</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV008979671</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Defect recognition in semiconductors before and after processing</subfield><subfield code="b">proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Redcliffe Way</subfield><subfield code="b">IOP Publ.</subfield><subfield code="c">1992</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">310 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">In: Semiconductor science and technology ; 7 (1992) 1,1</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1991</subfield><subfield code="z">Wilmslow</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Gitterbaufehler</subfield><subfield code="0">(DE-588)4125030-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">DRIP</subfield><subfield code="n">4</subfield><subfield code="d">1991</subfield><subfield code="c">Wilmslow</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)5066074-3</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005930361</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1991 Wilmslow gnd-content |
| genre_facet | Konferenzschrift 1991 Wilmslow |
| id | DE-604.BV008979671 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:27:52Z |
| institution | BVB |
| institution_GND | (DE-588)5066074-3 |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005930361 |
| oclc_num | 632851386 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | 310 S. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | IOP Publ. |
| record_format | marc |
| spelling | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK Redcliffe Way IOP Publ. 1992 310 S. txt rdacontent n rdamedia nc rdacarrier In: Semiconductor science and technology ; 7 (1992) 1,1 Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1991 Wilmslow gnd-content Gitterbaufehler (DE-588)4125030-8 s Halbleiter (DE-588)4022993-2 s DE-604 DRIP 4 1991 Wilmslow Sonstige (DE-588)5066074-3 oth |
| spellingShingle | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4022993-2 (DE-588)1071861417 |
| title | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK |
| title_auth | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK |
| title_exact_search | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK |
| title_full | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK |
| title_fullStr | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK |
| title_full_unstemmed | Defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK |
| title_short | Defect recognition in semiconductors before and after processing |
| title_sort | defect recognition in semiconductors before and after processing proceedings of the fourth international conference 18 22 march 1991 wilmslow uk |
| title_sub | proceedings of the fourth international conference 18 - 22 March 1991, Wilmslow, UK |
| topic | Gitterbaufehler (DE-588)4125030-8 gnd Halbleiter (DE-588)4022993-2 gnd |
| topic_facet | Gitterbaufehler Halbleiter Konferenzschrift 1991 Wilmslow |
| work_keys_str_mv | AT dripwilmslow defectrecognitioninsemiconductorsbeforeandafterprocessingproceedingsofthefourthinternationalconference1822march1991wilmslowuk |