Specimen preparation for transmission electron microscopy of materials II: symposium held April 19 - 20, 1990, San Francisco, California, U.S.A.
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Pittsburgh, Pa.
Materials Research Soc.
1990
|
| Schriftenreihe: | Materials Research Society: Materials Research Society symposia proceedings
199 |
| Schlagworte: | |
| Beschreibung: | XI, 347 S. Ill., graph. Darst. |
| ISBN: | 1558990887 |
Internformat
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| 245 | 1 | 0 | |a Specimen preparation for transmission electron microscopy of materials II |b symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. |c ed.: Ron Anderson |
| 264 | 1 | |a Pittsburgh, Pa. |b Materials Research Soc. |c 1990 | |
| 300 | |a XI, 347 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
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| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Materials Research Society: Materials Research Society symposia proceedings |v 199 | |
| 650 | 4 | |a Electron microscopy |v Congresses | |
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Datensatz im Suchindex
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| dewey-ones | 620 - Engineering and allied operations |
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| genre_facet | Konferenzschrift 1990 San Francisco Calif. |
| id | DE-604.BV008975056 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:27:47Z |
| institution | BVB |
| isbn | 1558990887 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005926540 |
| oclc_num | 22005968 |
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| physical | XI, 347 S. Ill., graph. Darst. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
| publisher | Materials Research Soc. |
| record_format | marc |
| series | Materials Research Society: Materials Research Society symposia proceedings |
| series2 | Materials Research Society: Materials Research Society symposia proceedings |
| spelling | Specimen preparation for transmission electron microscopy of materials II symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. ed.: Ron Anderson Pittsburgh, Pa. Materials Research Soc. 1990 XI, 347 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposia proceedings 199 Electron microscopy Congresses Materials Microscopy Congresses Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Präparation (DE-588)4130471-8 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 San Francisco Calif. gnd-content Werkstoffprüfung (DE-588)4037934-6 s Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Präparation (DE-588)4130471-8 s Anderson, Ron Sonstige oth Materials Research Society: Materials Research Society symposia proceedings 199 (DE-604)BV001899105 199 |
| spellingShingle | Specimen preparation for transmission electron microscopy of materials II symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. Materials Research Society: Materials Research Society symposia proceedings Electron microscopy Congresses Materials Microscopy Congresses Werkstoffprüfung (DE-588)4037934-6 gnd Präparation (DE-588)4130471-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4037934-6 (DE-588)4130471-8 (DE-588)4014327-2 (DE-588)1071861417 |
| title | Specimen preparation for transmission electron microscopy of materials II symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. |
| title_auth | Specimen preparation for transmission electron microscopy of materials II symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. |
| title_exact_search | Specimen preparation for transmission electron microscopy of materials II symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. |
| title_full | Specimen preparation for transmission electron microscopy of materials II symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. ed.: Ron Anderson |
| title_fullStr | Specimen preparation for transmission electron microscopy of materials II symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. ed.: Ron Anderson |
| title_full_unstemmed | Specimen preparation for transmission electron microscopy of materials II symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. ed.: Ron Anderson |
| title_short | Specimen preparation for transmission electron microscopy of materials II |
| title_sort | specimen preparation for transmission electron microscopy of materials ii symposium held april 19 20 1990 san francisco california u s a |
| title_sub | symposium held April 19 - 20, 1990, San Francisco, California, U.S.A. |
| topic | Electron microscopy Congresses Materials Microscopy Congresses Werkstoffprüfung (DE-588)4037934-6 gnd Präparation (DE-588)4130471-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Electron microscopy Congresses Materials Microscopy Congresses Werkstoffprüfung Präparation Elektronenmikroskopie Konferenzschrift 1990 San Francisco Calif. |
| volume_link | (DE-604)BV001899105 |
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