Design and +& test of ASICs: technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan
Saved in:
| Format: | Book |
|---|---|
| Language: | Undetermined |
| Published: |
Hiroshima
1990
|
| Edition: | Participants ed. |
| Subjects: | |
| Physical Description: | VII, 110 S. graph. Darst. |
Staff View
MARC
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Record in the Search Index
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| publishDateSearch | 1990 |
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| spelling | Design and +& test of ASICs technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan ed. by K. Kinoshita ... Participants ed. Hiroshima 1990 VII, 110 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Kundenspezifische Schaltung (DE-588)4122250-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1990 Hiroshima gnd-content Kundenspezifische Schaltung (DE-588)4122250-7 s DE-604 Konoshita, Kozo Sonstige oth Workshop on Design & Test of ASICs (1990, Hiroshima) Sonstige (DE-588)16131373-5 oth International Federation for Information Processing Sonstige (DE-588)1003417-1 oth |
| spellingShingle | Design and +& test of ASICs technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan Kundenspezifische Schaltung (DE-588)4122250-7 gnd |
| subject_GND | (DE-588)4122250-7 (DE-588)1071861417 |
| title | Design and +& test of ASICs technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan |
| title_auth | Design and +& test of ASICs technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan |
| title_exact_search | Design and +& test of ASICs technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan |
| title_full | Design and +& test of ASICs technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan ed. by K. Kinoshita ... |
| title_fullStr | Design and +& test of ASICs technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan ed. by K. Kinoshita ... |
| title_full_unstemmed | Design and +& test of ASICs technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan ed. by K. Kinoshita ... |
| title_short | Design and +& test of ASICs |
| title_sort | design and test of asics technical digest of the ifip workshop on design test of asics june 11 12 1990 hiroshima grand hotel hiroshima japan |
| title_sub | technical digest of the IFIP Workshop on Design & Test of ASICs, June 11 - 12, 1990, Hiroshima Grand Hotel, Hiroshima, Japan |
| topic | Kundenspezifische Schaltung (DE-588)4122250-7 gnd |
| topic_facet | Kundenspezifische Schaltung Konferenzschrift 1990 Hiroshima |
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