UW VLSI chip tester:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Seattle, Wash.
1989
|
| Schriftenreihe: | University of Washington <Seattle, Wash.> / Department of Computer Science: Technical report
89,12,1 |
| Schlagworte: | |
| Beschreibung: | 20 S. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV008949468 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 940206s1989 |||| 00||| eng d | ||
| 035 | |a (OCoLC)27664537 | ||
| 035 | |a (DE-599)BVBBV008949468 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 100 | 1 | |a MacKenzie, Neil |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a UW VLSI chip tester |c Neil McKenzie |
| 264 | 1 | |a Seattle, Wash. |c 1989 | |
| 300 | |a 20 S. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a University of Washington <Seattle, Wash.> / Department of Computer Science: Technical report |v 89,12,1 | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 810 | 2 | |a Department of Computer Science: Technical report |t University of Washington <Seattle, Wash.> |v 89,12,1 |w (DE-604)BV008930431 |9 89,12,1 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-005905126 | ||
Datensatz im Suchindex
| _version_ | 1804123282562088960 |
|---|---|
| any_adam_object | |
| author | MacKenzie, Neil |
| author_facet | MacKenzie, Neil |
| author_role | aut |
| author_sort | MacKenzie, Neil |
| author_variant | n m nm |
| building | Verbundindex |
| bvnumber | BV008949468 |
| ctrlnum | (OCoLC)27664537 (DE-599)BVBBV008949468 |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00957nam a2200277 cb4500</leader><controlfield tag="001">BV008949468</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">940206s1989 |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)27664537</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV008949468</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">MacKenzie, Neil</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">UW VLSI chip tester</subfield><subfield code="c">Neil McKenzie</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Seattle, Wash.</subfield><subfield code="c">1989</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">20 S.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">University of Washington <Seattle, Wash.> / Department of Computer Science: Technical report</subfield><subfield code="v">89,12,1</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Very large scale integration</subfield><subfield code="x">Testing</subfield></datafield><datafield tag="810" ind1="2" ind2=" "><subfield code="a">Department of Computer Science: Technical report</subfield><subfield code="t">University of Washington <Seattle, Wash.></subfield><subfield code="v">89,12,1</subfield><subfield code="w">(DE-604)BV008930431</subfield><subfield code="9">89,12,1</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005905126</subfield></datafield></record></collection> |
| id | DE-604.BV008949468 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:27:18Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005905126 |
| oclc_num | 27664537 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | 20 S. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| record_format | marc |
| series2 | University of Washington <Seattle, Wash.> / Department of Computer Science: Technical report |
| spelling | MacKenzie, Neil Verfasser aut UW VLSI chip tester Neil McKenzie Seattle, Wash. 1989 20 S. txt rdacontent n rdamedia nc rdacarrier University of Washington <Seattle, Wash.> / Department of Computer Science: Technical report 89,12,1 Integrated circuits Very large scale integration Testing Department of Computer Science: Technical report University of Washington <Seattle, Wash.> 89,12,1 (DE-604)BV008930431 89,12,1 |
| spellingShingle | MacKenzie, Neil UW VLSI chip tester Integrated circuits Very large scale integration Testing |
| title | UW VLSI chip tester |
| title_auth | UW VLSI chip tester |
| title_exact_search | UW VLSI chip tester |
| title_full | UW VLSI chip tester Neil McKenzie |
| title_fullStr | UW VLSI chip tester Neil McKenzie |
| title_full_unstemmed | UW VLSI chip tester Neil McKenzie |
| title_short | UW VLSI chip tester |
| title_sort | uw vlsi chip tester |
| topic | Integrated circuits Very large scale integration Testing |
| topic_facet | Integrated circuits Very large scale integration Testing |
| volume_link | (DE-604)BV008930431 |
| work_keys_str_mv | AT mackenzieneil uwvlsichiptester |