Optimal circuit segmentation for pseudo-exhaustive testing:
Saved in:
| Main Author: | |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
Stanford, Calif.
1990
|
| Series: | Stanford University / Computer Science Department: Report STAN-CS
1308 |
| Subjects: | |
| Item Description: | Stanford, Calif., Univ., Diss. |
| Physical Description: | IX, 101 S. |
Staff View
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Record in the Search Index
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| id | DE-604.BV008949453 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:27:18Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005905113 |
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| physical | IX, 101 S. |
| publishDate | 1990 |
| publishDateSearch | 1990 |
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| series2 | Stanford University / Computer Science Department: Report STAN-CS |
| spelling | Patashnik, Oren Verfasser aut Optimal circuit segmentation for pseudo-exhaustive testing Stanford, Calif. 1990 IX, 101 S. txt rdacontent n rdamedia nc rdacarrier Stanford University / Computer Science Department: Report STAN-CS 1308 Stanford, Calif., Univ., Diss. Electronic circuits Testing Graph theory NP-complete problems (DE-588)4113937-9 Hochschulschrift gnd-content Computer Science Department: Report STAN-CS Stanford University 1308 (DE-604)BV008928280 1308 |
| spellingShingle | Patashnik, Oren Optimal circuit segmentation for pseudo-exhaustive testing Electronic circuits Testing Graph theory NP-complete problems |
| subject_GND | (DE-588)4113937-9 |
| title | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_auth | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_exact_search | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_full | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_fullStr | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_full_unstemmed | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_short | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_sort | optimal circuit segmentation for pseudo exhaustive testing |
| topic | Electronic circuits Testing Graph theory NP-complete problems |
| topic_facet | Electronic circuits Testing Graph theory NP-complete problems Hochschulschrift |
| volume_link | (DE-604)BV008928280 |
| work_keys_str_mv | AT patashnikoren optimalcircuitsegmentationforpseudoexhaustivetesting |