Optimal circuit segmentation for pseudo-exhaustive testing:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Stanford, Calif.
1990
|
| Schriftenreihe: | Stanford University / Computer Science Department: Report STAN-CS
1308 |
| Schlagworte: | |
| Beschreibung: | Stanford, Calif., Univ., Diss. |
| Beschreibung: | IX, 101 S. |
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Datensatz im Suchindex
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| author | Patashnik, Oren |
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| indexdate | 2024-07-09T17:27:18Z |
| institution | BVB |
| language | English |
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| series2 | Stanford University / Computer Science Department: Report STAN-CS |
| spelling | Patashnik, Oren Verfasser aut Optimal circuit segmentation for pseudo-exhaustive testing Stanford, Calif. 1990 IX, 101 S. txt rdacontent n rdamedia nc rdacarrier Stanford University / Computer Science Department: Report STAN-CS 1308 Stanford, Calif., Univ., Diss. Electronic circuits Testing Graph theory NP-complete problems (DE-588)4113937-9 Hochschulschrift gnd-content Computer Science Department: Report STAN-CS Stanford University 1308 (DE-604)BV008928280 1308 |
| spellingShingle | Patashnik, Oren Optimal circuit segmentation for pseudo-exhaustive testing Electronic circuits Testing Graph theory NP-complete problems |
| subject_GND | (DE-588)4113937-9 |
| title | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_auth | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_exact_search | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_full | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_fullStr | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_full_unstemmed | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_short | Optimal circuit segmentation for pseudo-exhaustive testing |
| title_sort | optimal circuit segmentation for pseudo exhaustive testing |
| topic | Electronic circuits Testing Graph theory NP-complete problems |
| topic_facet | Electronic circuits Testing Graph theory NP-complete problems Hochschulschrift |
| volume_link | (DE-604)BV008928280 |
| work_keys_str_mv | AT patashnikoren optimalcircuitsegmentationforpseudoexhaustivetesting |