Special issue on the 1988 International Test Conference:
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | Undetermined |
Veröffentlicht: |
New York, NY
1990
|
Schlagworte: | |
Beschreibung: | In: Institute of Electrical and Electronics Engineers: IEEE transactions on computer-aided design of integrated circuits and systems ; 9 (1990) 6 |
Beschreibung: | S. 565 - 674 |
Internformat
MARC
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035 | |a (OCoLC)634703298 | ||
035 | |a (DE-599)BVBBV008949286 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | |a und | ||
049 | |a DE-29T | ||
111 | 2 | |a International Test Conference |d 1988 |c Washington, DC |j Verfasser |0 (DE-588)5003007-3 |4 aut | |
245 | 1 | 0 | |a Special issue on the 1988 International Test Conference |c [Michael R. Lightner, ed.] |
264 | 1 | |a New York, NY |c 1990 | |
300 | |a S. 565 - 674 | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
500 | |a In: Institute of Electrical and Electronics Engineers: IEEE transactions on computer-aided design of integrated circuits and systems ; 9 (1990) 6 | ||
650 | 0 | 7 | |a Stromkreis |0 (DE-588)4183738-1 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Test |0 (DE-588)4059549-3 |2 gnd |9 rswk-swf |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1988 |z Washington DC |2 gnd-content | |
689 | 0 | 0 | |a Stromkreis |0 (DE-588)4183738-1 |D s |
689 | 0 | 1 | |a Test |0 (DE-588)4059549-3 |D s |
689 | 0 | |5 DE-604 | |
700 | 1 | |a Lightner, Michael R. |e Sonstige |4 oth | |
999 | |a oai:aleph.bib-bvb.de:BVB01-005904973 |
Datensatz im Suchindex
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any_adam_object | |
author_corporate | International Test Conference Washington, DC |
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author_facet | International Test Conference Washington, DC |
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building | Verbundindex |
bvnumber | BV008949286 |
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format | Conference Proceeding Book |
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genre_facet | Konferenzschrift 1988 Washington DC |
id | DE-604.BV008949286 |
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indexdate | 2024-07-09T17:27:17Z |
institution | BVB |
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physical | S. 565 - 674 |
publishDate | 1990 |
publishDateSearch | 1990 |
publishDateSort | 1990 |
record_format | marc |
spelling | International Test Conference 1988 Washington, DC Verfasser (DE-588)5003007-3 aut Special issue on the 1988 International Test Conference [Michael R. Lightner, ed.] New York, NY 1990 S. 565 - 674 txt rdacontent n rdamedia nc rdacarrier In: Institute of Electrical and Electronics Engineers: IEEE transactions on computer-aided design of integrated circuits and systems ; 9 (1990) 6 Stromkreis (DE-588)4183738-1 gnd rswk-swf Test (DE-588)4059549-3 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1988 Washington DC gnd-content Stromkreis (DE-588)4183738-1 s Test (DE-588)4059549-3 s DE-604 Lightner, Michael R. Sonstige oth |
spellingShingle | Special issue on the 1988 International Test Conference Stromkreis (DE-588)4183738-1 gnd Test (DE-588)4059549-3 gnd |
subject_GND | (DE-588)4183738-1 (DE-588)4059549-3 (DE-588)1071861417 |
title | Special issue on the 1988 International Test Conference |
title_auth | Special issue on the 1988 International Test Conference |
title_exact_search | Special issue on the 1988 International Test Conference |
title_full | Special issue on the 1988 International Test Conference [Michael R. Lightner, ed.] |
title_fullStr | Special issue on the 1988 International Test Conference [Michael R. Lightner, ed.] |
title_full_unstemmed | Special issue on the 1988 International Test Conference [Michael R. Lightner, ed.] |
title_short | Special issue on the 1988 International Test Conference |
title_sort | special issue on the 1988 international test conference |
topic | Stromkreis (DE-588)4183738-1 gnd Test (DE-588)4059549-3 gnd |
topic_facet | Stromkreis Test Konferenzschrift 1988 Washington DC |
work_keys_str_mv | AT internationaltestconferencewashingtondc specialissueonthe1988internationaltestconference AT lightnermichaelr specialissueonthe1988internationaltestconference |