Electron beam analysis of materials:
The microstructure of materials controls many of their important physical, mechanical and electrical properties. In order to understand and control these properties it is essential to assess microstructure at a resolution down to atomic level. This second edition of Electron Beam Analysis of Materia...
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London u.a.
Chapman and Hall
1994
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| Ausgabe: | 2. ed. |
| Schlagworte: | |
| Zusammenfassung: | The microstructure of materials controls many of their important physical, mechanical and electrical properties. In order to understand and control these properties it is essential to assess microstructure at a resolution down to atomic level. This second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis, used to examine these microstructures, available today The text provides detailed coverage of both fundamental principles and practical aspects of the many electron beam techniques that have been developed. These include: transmission electron microscopy, scanning transmission electron microscopy, scanning electron microscopy, conventional and convergent electron diffraction, Auger electron spectroscopy, electron energy loss spectroscopy and electron probe microanalysis techniques The importance of understanding the operation of the equipment and of the simple theory underlying the significance of the data is emphasized. This emphasis is becoming increasingly important as computer solutions of data and computer control of equipment are tending to obscure the understanding of the analysis of data and of the operation of the equipment |
| Beschreibung: | VI, 272 S. Ill., graph. Darst. |
| ISBN: | 0412477904 |
Internformat
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| 100 | 1 | |a Loretto, Michael H. |e Verfasser |0 (DE-588)132011123 |4 aut | |
| 245 | 1 | 0 | |a Electron beam analysis of materials |c M. H. Loretto |
| 250 | |a 2. ed. | ||
| 264 | 1 | |a London u.a. |b Chapman and Hall |c 1994 | |
| 300 | |a VI, 272 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 520 | 3 | |a The microstructure of materials controls many of their important physical, mechanical and electrical properties. In order to understand and control these properties it is essential to assess microstructure at a resolution down to atomic level. This second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis, used to examine these microstructures, available today | |
| 520 | |a The text provides detailed coverage of both fundamental principles and practical aspects of the many electron beam techniques that have been developed. These include: transmission electron microscopy, scanning transmission electron microscopy, scanning electron microscopy, conventional and convergent electron diffraction, Auger electron spectroscopy, electron energy loss spectroscopy and electron probe microanalysis techniques | ||
| 520 | |a The importance of understanding the operation of the equipment and of the simple theory underlying the significance of the data is emphasized. This emphasis is becoming increasingly important as computer solutions of data and computer control of equipment are tending to obscure the understanding of the analysis of data and of the operation of the equipment | ||
| 650 | 4 | |a Electron beams |x Industrial applications | |
| 650 | 4 | |a Electron microscopy | |
| 650 | 4 | |a Materials |x Analysis | |
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Datensatz im Suchindex
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| any_adam_object | |
| author | Loretto, Michael H. |
| author_GND | (DE-588)132011123 |
| author_facet | Loretto, Michael H. |
| author_role | aut |
| author_sort | Loretto, Michael H. |
| author_variant | m h l mh mhl |
| building | Verbundindex |
| bvnumber | BV008888432 |
| callnumber-first | T - Technology |
| callnumber-label | TA417 |
| callnumber-raw | TA417.23 |
| callnumber-search | TA417.23 |
| callnumber-sort | TA 3417.23 |
| callnumber-subject | TA - General and Civil Engineering |
| classification_rvk | UQ 8050 |
| classification_tum | PHY 135f CHE 264f WER 780f |
| ctrlnum | (OCoLC)28800416 (DE-599)BVBBV008888432 |
| dewey-full | 620.1/127 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 620 - Engineering and allied operations |
| dewey-raw | 620.1/127 |
| dewey-search | 620.1/127 |
| dewey-sort | 3620.1 3127 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Physik Chemie Werkstoffwissenschaften |
| edition | 2. ed. |
| format | Book |
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| id | DE-604.BV008888432 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:26:43Z |
| institution | BVB |
| isbn | 0412477904 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005880210 |
| oclc_num | 28800416 |
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| physical | VI, 272 S. Ill., graph. Darst. |
| publishDate | 1994 |
| publishDateSearch | 1994 |
| publishDateSort | 1994 |
| publisher | Chapman and Hall |
| record_format | marc |
| spelling | Loretto, Michael H. Verfasser (DE-588)132011123 aut Electron beam analysis of materials M. H. Loretto 2. ed. London u.a. Chapman and Hall 1994 VI, 272 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier The microstructure of materials controls many of their important physical, mechanical and electrical properties. In order to understand and control these properties it is essential to assess microstructure at a resolution down to atomic level. This second edition of Electron Beam Analysis of Materials provides a concise and up-to-date overview of the most widely used electron beam instruments and techniques of microstructural analysis, used to examine these microstructures, available today The text provides detailed coverage of both fundamental principles and practical aspects of the many electron beam techniques that have been developed. These include: transmission electron microscopy, scanning transmission electron microscopy, scanning electron microscopy, conventional and convergent electron diffraction, Auger electron spectroscopy, electron energy loss spectroscopy and electron probe microanalysis techniques The importance of understanding the operation of the equipment and of the simple theory underlying the significance of the data is emphasized. This emphasis is becoming increasingly important as computer solutions of data and computer control of equipment are tending to obscure the understanding of the analysis of data and of the operation of the equipment Electron beams Industrial applications Electron microscopy Materials Analysis Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Elektronenstrahl (DE-588)4151894-9 gnd rswk-swf Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf Werkstoffkunde (DE-588)4079184-1 gnd rswk-swf Elektronenbeugung (DE-588)4151862-7 s Werkstoffkunde (DE-588)4079184-1 s DE-604 Elektronenstrahlmikroanalyse (DE-588)4151898-6 s Elektronenstrahl (DE-588)4151894-9 s Werkstoffprüfung (DE-588)4037934-6 s |
| spellingShingle | Loretto, Michael H. Electron beam analysis of materials Electron beams Industrial applications Electron microscopy Materials Analysis Werkstoffprüfung (DE-588)4037934-6 gnd Elektronenstrahl (DE-588)4151894-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenbeugung (DE-588)4151862-7 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| subject_GND | (DE-588)4037934-6 (DE-588)4151894-9 (DE-588)4151898-6 (DE-588)4151862-7 (DE-588)4079184-1 |
| title | Electron beam analysis of materials |
| title_auth | Electron beam analysis of materials |
| title_exact_search | Electron beam analysis of materials |
| title_full | Electron beam analysis of materials M. H. Loretto |
| title_fullStr | Electron beam analysis of materials M. H. Loretto |
| title_full_unstemmed | Electron beam analysis of materials M. H. Loretto |
| title_short | Electron beam analysis of materials |
| title_sort | electron beam analysis of materials |
| topic | Electron beams Industrial applications Electron microscopy Materials Analysis Werkstoffprüfung (DE-588)4037934-6 gnd Elektronenstrahl (DE-588)4151894-9 gnd Elektronenstrahlmikroanalyse (DE-588)4151898-6 gnd Elektronenbeugung (DE-588)4151862-7 gnd Werkstoffkunde (DE-588)4079184-1 gnd |
| topic_facet | Electron beams Industrial applications Electron microscopy Materials Analysis Werkstoffprüfung Elektronenstrahl Elektronenstrahlmikroanalyse Elektronenbeugung Werkstoffkunde |
| work_keys_str_mv | AT lorettomichaelh electronbeamanalysisofmaterials |