Digital integrated circuit testing from a quality perspective:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York, NY
Van Nostrand Reinhold
1993
|
| Schlagworte: | |
| Beschreibung: | X, 179 S. graph. Darst. |
| ISBN: | 0442006438 |
Internformat
MARC
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| 041 | 0 | |a eng | |
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| 100 | 1 | |a Hnatek, Eugene Ronald |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Digital integrated circuit testing from a quality perspective |c Eugene R. Hnatek |
| 264 | 1 | |a New York, NY |b Van Nostrand Reinhold |c 1993 | |
| 300 | |a X, 179 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Digital integrated circuits |x Testing |x Quality control | |
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Hnatek, Eugene Ronald |
| author_facet | Hnatek, Eugene Ronald |
| author_role | aut |
| author_sort | Hnatek, Eugene Ronald |
| author_variant | e r h er erh |
| building | Verbundindex |
| bvnumber | BV008836135 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 359f |
| ctrlnum | (OCoLC)28111381 (DE-599)BVBBV008836135 |
| dewey-full | 621.3815/48 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.3815/48 |
| dewey-search | 621.3815/48 |
| dewey-sort | 3621.3815 248 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV008836135 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:25:48Z |
| institution | BVB |
| isbn | 0442006438 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005842432 |
| oclc_num | 28111381 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | X, 179 S. graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | Van Nostrand Reinhold |
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| spelling | Hnatek, Eugene Ronald Verfasser aut Digital integrated circuit testing from a quality perspective Eugene R. Hnatek New York, NY Van Nostrand Reinhold 1993 X, 179 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Digital integrated circuits Testing Quality control Testen (DE-588)4367264-4 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 gnd rswk-swf Digitale integrierte Schaltung (DE-588)4113313-4 s Testen (DE-588)4367264-4 s DE-604 |
| spellingShingle | Hnatek, Eugene Ronald Digital integrated circuit testing from a quality perspective Digital integrated circuits Testing Quality control Testen (DE-588)4367264-4 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4113313-4 |
| title | Digital integrated circuit testing from a quality perspective |
| title_auth | Digital integrated circuit testing from a quality perspective |
| title_exact_search | Digital integrated circuit testing from a quality perspective |
| title_full | Digital integrated circuit testing from a quality perspective Eugene R. Hnatek |
| title_fullStr | Digital integrated circuit testing from a quality perspective Eugene R. Hnatek |
| title_full_unstemmed | Digital integrated circuit testing from a quality perspective Eugene R. Hnatek |
| title_short | Digital integrated circuit testing from a quality perspective |
| title_sort | digital integrated circuit testing from a quality perspective |
| topic | Digital integrated circuits Testing Quality control Testen (DE-588)4367264-4 gnd Digitale integrierte Schaltung (DE-588)4113313-4 gnd |
| topic_facet | Digital integrated circuits Testing Quality control Testen Digitale integrierte Schaltung |
| work_keys_str_mv | AT hnatekeugeneronald digitalintegratedcircuittestingfromaqualityperspective |