Handbook of X-ray spectrometry: methods and techniques
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
New York [u.a.]
Dekker
1993
|
| Schriftenreihe: | Practical spectroscopy
14 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIV, 704 S. Ill., graph. Darst. |
| ISBN: | 0824784839 |
Internformat
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Datensatz im Suchindex
| _version_ | 1804122741859680256 |
|---|---|
| adam_text | HANDBOOK OF X-RAY SPECTROMETRY METHODS AND TECHNIQUES EDITED BY RENE E.
VAN GRIEKEN DEPARTMENT OF CHEMISTRY UNIVERSITY OFANTWERP ANTWERP,
BELGIUM ANDRZEJ A. MARKOWICZ INSTITUTE OF PHYSICS AND NUCLEAR TECHNIQUES
ACADEMY OF MINING AND METALLURGY CRACOW, POLAND MARCEL DEKKER, INC. NEW
YORK * BASEL * HONG KONG CONTENTS PREFACE III CONTRIBUTORS XIII 1 X-RAY
PHYSICS ANDRZEJ A. MARKOWICZ 1 I. INTRODUCTION 1 II. HISTORY 1 III.
GENERAL FEATURES 2 IV. EMISSION OF CONTINUOUS RADIATION 3 V. EMISSION OF
CHARACTERISTIC X-RAYS 8 VI. INTERACTION OF PHOTONS WITH MATTER 17 VII.
INTENSITY OF CHARACTERISTIC X-RAYS 30 VIII. IUPAC NOTATION FOR X-RAY
SPECTROSCOPY 33 APPENDIXES I. CRITICAL ABSORPTION WAVELENGTHS AND
CRITICAL ABSORPTION ENERGIES 35 II. CHARACTERISTIC X-RAY WAVELENGTHS (A)
AND ENERGIES (KEV) 37 III. RADIATIVE TRANSITION PROBABILITIES 49 IV.
WAVELENGTHS OF K SATELLITE LINES (AE) 52 V. FLUORESCENCE YIELDS AND
COSTER-KRONIG TRANSITION PROBABILITIES 54 VI. COEFFICIENTS FOR
CALCULATING THE PHOTOELECTRIC ABSORPTION CROSS SECTIONS T (BARNS/ATOM)
VIA LN-LN REPRESENTATION 59 VII VIII CONTENTS VII. COEFFICIENTS FOR
CALCULATING THE INCOHERENT COLLISION CROSS SECTIONS CT C (BARNS/ATOM)
VIA THE LN-LN REPRESENTATION 65 VIII. COEFFICIENTS FOR CALCULATING THE
COHERENT SCATTERING CROSS SECTIONS U R (BARNS/ATOM) VIA THE LN-LN
REPRESENTATION 67 IX. TOTAL MASS ATTENUATION COEFFICIENTS FOR LOW-ENERGY
LINES 69 X. CORRESPONDENCE BETWEEN OLD SIEGBAHN AND NEW IUPAC NOTATION
X-RAY DIAGRAM LINES 71 REFERENCES 71 2 WAVELENGTH-DISPERSIVE X-RAY
FLUORESCENCE 75 J. A. HEISEN AND ANDRZEJ KUCZUMOW I. INTRODUCTION 75 II.
FUNDAMENTALS OF WAVELENGTH DISPERSION 78 III. LAYOUT OF A SPECTROMETER
82 IV. QUALITATIVE AND QUANTITATIVE ANALYSIS 117 V. CHEMICAL SHIFT AND
SPECIATION 134 VI. INSTRUMENTATION 138 REFERENCES 145 3 ENERGY
DISPERSIVE X-RAY FLUORESCENCE ANALYSIS USING X-RAY TUBE EXCITATION 151
JOSEPH M. JAKLEVIC AND ROBERT D. GIAUQUE I. INTRODUCTION 151 II.
SEMICONDUCTOR DETECTORS FOR X-RAY SPECTROMETRY 152 III. TYPICAL X-RAY
TUBE EXCITATION SYSTEMS FOR EDXRF 168 IV. APPLICATIONS OF TUBE-EXCITED
EDXRF 175 V. SUMMARY 179 REFERENCES 179 4 SPECTRUM EVALUATION 181 PIERRE
J. M. VAN ESPEN AND KOEN H. A. JANSSENS I. INTRODUCTION 181 IL
FUNDAMENTAL ASPECTS 182 III. SPECTRUM PROCESSING METHODS 187 IV.
BACKGROUND ESTIMATION METHODS 205 V. SIMPLE NET PEAK AREA DETERMINATION
213 VI. LEAST-SQUARES FITTING USING REFERENCE SPECTRA 217 VII.
LEAST-SQUARES FITTING USING ANALYTICAL FUNCTIONS 222 VIII. METHODS BASED
ON THE MONTE CARLO TECHNIQUE 254 IX. LEAST-SQUARES FITTING METHOD 258 X.
COMPUTER IMPLEMENTATION OF VARIOUS ALGORITHMS 268 REFERENCES 291 5
QUANTIFICATION BY XRF ANALYSIS OF INFINITELY THICK SAMPLES 295 /. L. DE
VRIES AND BRUNO A. R. VREBOS I. CORRELATION BETWEEN INTENSITIES AND
CONCENTRATION 295 II. FACTORS INFLUENCING THE ACCURACY OF THE INTENSITY
MEASUREMENT 300 CONTENTS IX III. REMARKS ON SAMPLE PREPARATION 308 IV.
CONVERTING INTENSITIES TO CONCENTRATION 309 V. CONCLUSION 336 REFERENCES
337 SUGGESTIONS FOR FURTHER READING 338 6 QUANTIFICATION IN XRF ANALYSIS
OF INTERMEDIATE-THICKNESS SAMPLES 339 ANDRZEJ A. MARKOWICZ AND RENE E.
VAN GRIEKEN I. INTRODUCTION 339 II. EMISSION-TRANSMISSION METHOD 340
III. ABSORPTION CORRECTION METHODS VIA SCATTERED PRIMARY RADIATION 344
IV. QUANTITATION FOR INTERMEDIATE-THICKNESS GRANULAER SPECIMENS 350
REFERENCES 357 7 RADIOISOTOPE X-RAY ANALYSIS 359 JOHN S. WATT I.
INTRODUCTION 359 II. BASIC EQUATIONS 360 III. RADIOISOTOPE X-RAY SOURCES
AND DETECTORS 367 IV. X-RAY AND -Y-RAY TECHNIQUES 377 V. CHOICE OF X-RAY
TECHNIQUE FOR A SPECIFIC APPLICATION 390 VI. APPLICATIONS 391 VII.
CONCLUSIONS 407 REFERENCES 407 8 SYNCHROTRON RADIATION-INDUCED X-RAY
EMISSION 411 KEITH W. JONES I. INTRODUCTION 411 II. PROPERTIES OF
SYNCHROTRON RADIATION 413 III. DESCRIPTION OF SYNCHROTRON FACILITIES 416
IV. APPARATUS FOR X-RAY MICROSCOPY 418 V. CONTINUUM AND MONOCHROMATIC
EXCITATION 427 VI. QUANTITATION 428 VII. SENSITIVITIES AND MINIMUM
DETECTION LIMITS 432 VIII. BEAM-INDUCED DAMAGE 434 IX. APPLICATIONS OF
SRIXE 437 X. TOMOGRAPHY 443 XI. EXAFS AND XANES 444 XII. FUTURE
DIRECTIONS 448 REFERENCES 449 9 TOTAL REFLECTION XRF 453 HEINRICH
SCHWENKE AND JOACHIM KNOTH I. INTRODUCTION 453 II. PHYSICS OF TOTAL
REFLECTION OF X-RAYS 454 III. DESIGN OF INSTRUMENTS 458 IV. ANALYSIS OF
SMALL QUANTITIES ON REFLECTING CARRIERS 463 X CONTENTS V. SURFACE
ANALYSIS 474 VI. ROLEOFTXRF 488 REFERENCES 488 10 POLARIZED BEAM X-RAY
FLUORESCENCE 491 RICHARD W. RYON AND JOHN D. ZAHRT I. INTRODUCTION 491
II. BARKLA SYSTEMS 497 III. BRAGG SYSTEMS 506 IV. SYNCHROTRON RADIATION
510 V. RESULTS AND EXAMPLES 510 VI. CONCLUSION 511 APPENDIX: CRYSTALS
THAT DIFFRACT SELECTED CHARACTERISTIC WAVELENGTHS AT29 = N/2 = 90 512
REFERENCES 515 11 PARTICLE-INDUCED X-RAY EMISSION ANALYSIS 517 WILLY
MAENHAUT AND KLAS G. MALMQVIST I. INTRODUCTION 517 II. INTERACTIONS OF
CHARGED PARTICLES WITH MATTER, CHARACTERISTIC X-RAY PRODUCTION, AND
CONTINUOUS PHOTON BACKGROUND PRODUCTION 519 III. INSTRUMENTATION 526 IV.
QUANTITATION, DETECTION LIMITS, ACCURACY, AND PRECISION 538 V. SAMPLE
COLLECTION AND SAMPLE AND SPECIMEN PREPARATION FOR PIXE ANALYSIS 548 VI.
APPLICATIONS 550 VII. COMPLEMENTARY ION BEAM ANALYSIS TECHNIQUES 565
VIII. CONCLUSIONS 571 REFERENCES 574 12 ELECTRON-INDUCED X-RAY EMISSION
583 JOHN A. SMALL I. INTRODUCTION 583 II. QUANTITATIVE ANALYSIS 587 III.
QUANTITATIVE ANALYSIS OF THIN SPECIMENS 616 IV. QUANTITATIVE ANALYSIS OF
PARTICLES AND ROUGH SURFACES 621 V. SPATIALLY RESOLVED X-RAY ANALYSIS
635 REFERENCES 652 13 SAMPLE PREPARATION FOR XRF 657 JASNA INJUK AND
RENE E. VAN GRIEKEN I. INTRODUCTION 657 II. SOLID SAMPLES 658 III. FUSED
SPECIMENS 665 IV. LIQUID SAMPLES 669 CONTENTS XI V. BIOLOGICAL SAMPLES
676 VI. ATMOSPHERIC PARTICLES 682 VII. SAMPLE SUPPORT MATERIALS 685
REFERENCES 687 INDEX 693
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| indexdate | 2024-07-09T17:18:42Z |
| institution | BVB |
| isbn | 0824784839 |
| language | Undetermined |
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| physical | XIV, 704 S. Ill., graph. Darst. |
| publishDate | 1993 |
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| series | Practical spectroscopy |
| series2 | Practical spectroscopy |
| spelling | Handbook of X-ray spectrometry methods and techniques ed. by René E. VanGrieken ... New York [u.a.] Dekker 1993 XIV, 704 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Practical spectroscopy 14 Röntgenspektroskopie (DE-588)4050331-8 gnd rswk-swf Röntgenspektroskopie (DE-588)4050331-8 s DE-604 Van Grieken, René E. Sonstige oth Practical spectroscopy 14 (DE-604)BV000617466 14 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005514309&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Handbook of X-ray spectrometry methods and techniques Practical spectroscopy Röntgenspektroskopie (DE-588)4050331-8 gnd |
| subject_GND | (DE-588)4050331-8 |
| title | Handbook of X-ray spectrometry methods and techniques |
| title_auth | Handbook of X-ray spectrometry methods and techniques |
| title_exact_search | Handbook of X-ray spectrometry methods and techniques |
| title_full | Handbook of X-ray spectrometry methods and techniques ed. by René E. VanGrieken ... |
| title_fullStr | Handbook of X-ray spectrometry methods and techniques ed. by René E. VanGrieken ... |
| title_full_unstemmed | Handbook of X-ray spectrometry methods and techniques ed. by René E. VanGrieken ... |
| title_short | Handbook of X-ray spectrometry |
| title_sort | handbook of x ray spectrometry methods and techniques |
| title_sub | methods and techniques |
| topic | Röntgenspektroskopie (DE-588)4050331-8 gnd |
| topic_facet | Röntgenspektroskopie |
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