Diagnostic measurements in LSI VLSI integrated circuits production:
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
Singapore u.a.
World Scientific
1991
|
| Schriftenreihe: | Advanced series in electrical and computer engineering
7 |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XV, 356 S. graph. Darst. |
| ISBN: | 9810202822 |
Internformat
MARC
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| 001 | BV008278633 | ||
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| 035 | |a (OCoLC)23692863 | ||
| 035 | |a (DE-599)BVBBV008278633 | ||
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| 100 | 1 | |a Jakubowski, Andrzej |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Diagnostic measurements in LSI VLSI integrated circuits production |c Andrzej Jakubowski ; Wiesław Marciniak ; Henryk M. Przewłocki |
| 264 | 1 | |a Singapore u.a. |b World Scientific |c 1991 | |
| 300 | |a XV, 356 S. |b graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Advanced series in electrical and computer engineering |v 7 | |
| 500 | |a Literaturangaben | ||
| 650 | 4 | |a Circuit intégré | |
| 650 | 7 | |a Circuits intégrés à très grande échelle |2 ram | |
| 650 | 4 | |a LSI | |
| 650 | 4 | |a VLSI | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Design and construction | |
| 650 | 4 | |a Integrated circuits |x Very large scale integration |x Testing | |
| 650 | 0 | 7 | |a Fehlererkennung |0 (DE-588)4133764-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a VLSI |0 (DE-588)4117388-0 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Fertigung |0 (DE-588)4016899-2 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a VLSI |0 (DE-588)4117388-0 |D s |
| 689 | 0 | 1 | |a Integrierte Schaltung |0 (DE-588)4027242-4 |D s |
| 689 | 0 | 2 | |a Fertigung |0 (DE-588)4016899-2 |D s |
| 689 | 0 | 3 | |a Fehlererkennung |0 (DE-588)4133764-5 |D s |
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| 700 | 1 | |a Marciniak, Wiesław |e Verfasser |4 aut | |
| 700 | 1 | |a Przewłocki, Henryk M. |e Verfasser |4 aut | |
| 830 | 0 | |a Advanced series in electrical and computer engineering |v 7 |w (DE-604)BV001774676 |9 7 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-005469870 | ||
Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Jakubowski, Andrzej Marciniak, Wiesław Przewłocki, Henryk M. |
| author_facet | Jakubowski, Andrzej Marciniak, Wiesław Przewłocki, Henryk M. |
| author_role | aut aut aut |
| author_sort | Jakubowski, Andrzej |
| author_variant | a j aj w m wm h m p hm hmp |
| building | Verbundindex |
| bvnumber | BV008278633 |
| callnumber-first | T - Technology |
| callnumber-label | TK7874 |
| callnumber-raw | TK7874 |
| callnumber-search | TK7874 |
| callnumber-sort | TK 47874 |
| callnumber-subject | TK - Electrical and Nuclear Engineering |
| classification_tum | ELT 299f ELT 008f |
| ctrlnum | (OCoLC)23692863 (DE-599)BVBBV008278633 |
| dewey-full | 621.39/5 |
| dewey-hundreds | 600 - Technology (Applied sciences) |
| dewey-ones | 621 - Applied physics |
| dewey-raw | 621.39/5 |
| dewey-search | 621.39/5 |
| dewey-sort | 3621.39 15 |
| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Book |
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| id | DE-604.BV008278633 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:17:39Z |
| institution | BVB |
| isbn | 9810202822 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005469870 |
| oclc_num | 23692863 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM |
| owner_facet | DE-91 DE-BY-TUM |
| physical | XV, 356 S. graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | World Scientific |
| record_format | marc |
| series | Advanced series in electrical and computer engineering |
| series2 | Advanced series in electrical and computer engineering |
| spelling | Jakubowski, Andrzej Verfasser aut Diagnostic measurements in LSI VLSI integrated circuits production Andrzej Jakubowski ; Wiesław Marciniak ; Henryk M. Przewłocki Singapore u.a. World Scientific 1991 XV, 356 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Advanced series in electrical and computer engineering 7 Literaturangaben Circuit intégré Circuits intégrés à très grande échelle ram LSI VLSI Integrated circuits Very large scale integration Design and construction Integrated circuits Very large scale integration Testing Fehlererkennung (DE-588)4133764-5 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf Integrierte Schaltung (DE-588)4027242-4 gnd rswk-swf Fertigung (DE-588)4016899-2 gnd rswk-swf VLSI (DE-588)4117388-0 s Integrierte Schaltung (DE-588)4027242-4 s Fertigung (DE-588)4016899-2 s Fehlererkennung (DE-588)4133764-5 s DE-604 Marciniak, Wiesław Verfasser aut Przewłocki, Henryk M. Verfasser aut Advanced series in electrical and computer engineering 7 (DE-604)BV001774676 7 |
| spellingShingle | Jakubowski, Andrzej Marciniak, Wiesław Przewłocki, Henryk M. Diagnostic measurements in LSI VLSI integrated circuits production Advanced series in electrical and computer engineering Circuit intégré Circuits intégrés à très grande échelle ram LSI VLSI Integrated circuits Very large scale integration Design and construction Integrated circuits Very large scale integration Testing Fehlererkennung (DE-588)4133764-5 gnd VLSI (DE-588)4117388-0 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Fertigung (DE-588)4016899-2 gnd |
| subject_GND | (DE-588)4133764-5 (DE-588)4117388-0 (DE-588)4027242-4 (DE-588)4016899-2 |
| title | Diagnostic measurements in LSI VLSI integrated circuits production |
| title_auth | Diagnostic measurements in LSI VLSI integrated circuits production |
| title_exact_search | Diagnostic measurements in LSI VLSI integrated circuits production |
| title_full | Diagnostic measurements in LSI VLSI integrated circuits production Andrzej Jakubowski ; Wiesław Marciniak ; Henryk M. Przewłocki |
| title_fullStr | Diagnostic measurements in LSI VLSI integrated circuits production Andrzej Jakubowski ; Wiesław Marciniak ; Henryk M. Przewłocki |
| title_full_unstemmed | Diagnostic measurements in LSI VLSI integrated circuits production Andrzej Jakubowski ; Wiesław Marciniak ; Henryk M. Przewłocki |
| title_short | Diagnostic measurements in LSI VLSI integrated circuits production |
| title_sort | diagnostic measurements in lsi vlsi integrated circuits production |
| topic | Circuit intégré Circuits intégrés à très grande échelle ram LSI VLSI Integrated circuits Very large scale integration Design and construction Integrated circuits Very large scale integration Testing Fehlererkennung (DE-588)4133764-5 gnd VLSI (DE-588)4117388-0 gnd Integrierte Schaltung (DE-588)4027242-4 gnd Fertigung (DE-588)4016899-2 gnd |
| topic_facet | Circuit intégré Circuits intégrés à très grande échelle LSI VLSI Integrated circuits Very large scale integration Design and construction Integrated circuits Very large scale integration Testing Fehlererkennung Integrierte Schaltung Fertigung |
| volume_link | (DE-604)BV001774676 |
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