Materials reliability issues in microelectronics: symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A.
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Pittsburgh, Pa.
Materials Research Soc.
1992
|
| Ausgabe: | 2. printing |
| Schriftenreihe: | Materials Research Society: Materials Research Society symposia proceedings
225 |
| Schlagworte: | |
| Beschreibung: | XIII, 358 S. Ill., graph. Darst. |
| ISBN: | 1558991190 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV008254974 | ||
| 003 | DE-604 | ||
| 005 | 20010202 | ||
| 007 | t | ||
| 008 | 931007s1992 ad|| |||| 10||| eng d | ||
| 020 | |a 1558991190 |9 1-55899-119-0 | ||
| 035 | |a (OCoLC)258340640 | ||
| 035 | |a (DE-599)BVBBV008254974 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-384 |a DE-703 | ||
| 084 | |a UD 8400 |0 (DE-625)145545: |2 rvk | ||
| 245 | 1 | 0 | |a Materials reliability issues in microelectronics |b symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. |c eds.: James R. Lloyd ... |
| 250 | |a 2. printing | ||
| 264 | 1 | |a Pittsburgh, Pa. |b Materials Research Soc. |c 1992 | |
| 300 | |a XIII, 358 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Materials Research Society: Materials Research Society symposia proceedings |v 225 | |
| 650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Mikroelektronik |0 (DE-588)4039207-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Stoffeigenschaft |0 (DE-588)4192147-1 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1991 |z Anaheim Calif. |2 gnd-content | |
| 689 | 0 | 0 | |a Mikroelektronik |0 (DE-588)4039207-7 |D s |
| 689 | 0 | 1 | |a Stoffeigenschaft |0 (DE-588)4192147-1 |D s |
| 689 | 0 | 2 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Lloyd, James R. |e Sonstige |4 oth | |
| 830 | 0 | |a Materials Research Society: Materials Research Society symposia proceedings |v 225 |w (DE-604)BV001899105 |9 225 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-005451291 | ||
Datensatz im Suchindex
| _version_ | 1804122647581163520 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV008254974 |
| classification_rvk | UD 8400 |
| ctrlnum | (OCoLC)258340640 (DE-599)BVBBV008254974 |
| discipline | Physik |
| edition | 2. printing |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01598nam a2200397 cb4500</leader><controlfield tag="001">BV008254974</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20010202 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">931007s1992 ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">1558991190</subfield><subfield code="9">1-55899-119-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)258340640</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV008254974</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-384</subfield><subfield code="a">DE-703</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UD 8400</subfield><subfield code="0">(DE-625)145545:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Materials reliability issues in microelectronics</subfield><subfield code="b">symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A.</subfield><subfield code="c">eds.: James R. Lloyd ...</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2. printing</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Pittsburgh, Pa.</subfield><subfield code="b">Materials Research Soc.</subfield><subfield code="c">1992</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 358 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">225</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Stoffeigenschaft</subfield><subfield code="0">(DE-588)4192147-1</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1991</subfield><subfield code="z">Anaheim Calif.</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Mikroelektronik</subfield><subfield code="0">(DE-588)4039207-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Stoffeigenschaft</subfield><subfield code="0">(DE-588)4192147-1</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Lloyd, James R.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Materials Research Society: Materials Research Society symposia proceedings</subfield><subfield code="v">225</subfield><subfield code="w">(DE-604)BV001899105</subfield><subfield code="9">225</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005451291</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1991 Anaheim Calif. gnd-content |
| genre_facet | Konferenzschrift 1991 Anaheim Calif. |
| id | DE-604.BV008254974 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:17:12Z |
| institution | BVB |
| isbn | 1558991190 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005451291 |
| oclc_num | 258340640 |
| open_access_boolean | |
| owner | DE-384 DE-703 |
| owner_facet | DE-384 DE-703 |
| physical | XIII, 358 S. Ill., graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
| publishDateSort | 1992 |
| publisher | Materials Research Soc. |
| record_format | marc |
| series | Materials Research Society: Materials Research Society symposia proceedings |
| series2 | Materials Research Society: Materials Research Society symposia proceedings |
| spelling | Materials reliability issues in microelectronics symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. eds.: James R. Lloyd ... 2. printing Pittsburgh, Pa. Materials Research Soc. 1992 XIII, 358 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Materials Research Society: Materials Research Society symposia proceedings 225 Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Mikroelektronik (DE-588)4039207-7 gnd rswk-swf Stoffeigenschaft (DE-588)4192147-1 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1991 Anaheim Calif. gnd-content Mikroelektronik (DE-588)4039207-7 s Stoffeigenschaft (DE-588)4192147-1 s Zuverlässigkeit (DE-588)4059245-5 s DE-604 Lloyd, James R. Sonstige oth Materials Research Society: Materials Research Society symposia proceedings 225 (DE-604)BV001899105 225 |
| spellingShingle | Materials reliability issues in microelectronics symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. Materials Research Society: Materials Research Society symposia proceedings Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd Stoffeigenschaft (DE-588)4192147-1 gnd |
| subject_GND | (DE-588)4059245-5 (DE-588)4039207-7 (DE-588)4192147-1 (DE-588)1071861417 |
| title | Materials reliability issues in microelectronics symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. |
| title_auth | Materials reliability issues in microelectronics symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. |
| title_exact_search | Materials reliability issues in microelectronics symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. |
| title_full | Materials reliability issues in microelectronics symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. eds.: James R. Lloyd ... |
| title_fullStr | Materials reliability issues in microelectronics symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. eds.: James R. Lloyd ... |
| title_full_unstemmed | Materials reliability issues in microelectronics symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. eds.: James R. Lloyd ... |
| title_short | Materials reliability issues in microelectronics |
| title_sort | materials reliability issues in microelectronics symposium held april 30 may 3 1991 anaheim california u s a |
| title_sub | symposium held April 30 - May 3, 1991, Anaheim, California, U.S.A. |
| topic | Zuverlässigkeit (DE-588)4059245-5 gnd Mikroelektronik (DE-588)4039207-7 gnd Stoffeigenschaft (DE-588)4192147-1 gnd |
| topic_facet | Zuverlässigkeit Mikroelektronik Stoffeigenschaft Konferenzschrift 1991 Anaheim Calif. |
| volume_link | (DE-604)BV001899105 |
| work_keys_str_mv | AT lloydjamesr materialsreliabilityissuesinmicroelectronicssymposiumheldapril30may31991anaheimcaliforniausa |