Hyperfine interaction of defects in semiconductors:
Gespeichert in:
Format: | Buch |
---|---|
Sprache: | English |
Veröffentlicht: |
Amsterdam u.a.
Elsevier
1992
|
Schlagworte: | |
Beschreibung: | IX, 458 S. graph. Darst. |
ISBN: | 044489134X |
Internformat
MARC
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245 | 1 | 0 | |a Hyperfine interaction of defects in semiconductors |c ed. by G. Langouche |
264 | 1 | |a Amsterdam u.a. |b Elsevier |c 1992 | |
300 | |a IX, 458 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Interactions hyperfines | |
650 | 4 | |a Semiconducteurs - Défauts | |
650 | 4 | |a Hyperfine interactions | |
650 | 4 | |a Semiconductors |x Defects | |
650 | 0 | 7 | |a Gitterbaufehler |0 (DE-588)4125030-8 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Hyperfeinwechselwirkung |0 (DE-588)4161053-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
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700 | 1 | |a Langouche, G. |e Sonstige |4 oth | |
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Datensatz im Suchindex
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id | DE-604.BV008246784 |
illustrated | Illustrated |
indexdate | 2024-07-09T17:17:03Z |
institution | BVB |
isbn | 044489134X |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005445469 |
oclc_num | 25549870 |
open_access_boolean | |
owner | DE-384 DE-29T |
owner_facet | DE-384 DE-29T |
physical | IX, 458 S. graph. Darst. |
publishDate | 1992 |
publishDateSearch | 1992 |
publishDateSort | 1992 |
publisher | Elsevier |
record_format | marc |
spelling | Hyperfine interaction of defects in semiconductors ed. by G. Langouche Amsterdam u.a. Elsevier 1992 IX, 458 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Interactions hyperfines Semiconducteurs - Défauts Hyperfine interactions Semiconductors Defects Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Hyperfeinwechselwirkung (DE-588)4161053-2 gnd rswk-swf Halbleiter (DE-588)4022993-2 gnd rswk-swf Hyperfeinwechselwirkung (DE-588)4161053-2 s Gitterbaufehler (DE-588)4125030-8 s Halbleiter (DE-588)4022993-2 s DE-604 Langouche, G. Sonstige oth |
spellingShingle | Hyperfine interaction of defects in semiconductors Interactions hyperfines Semiconducteurs - Défauts Hyperfine interactions Semiconductors Defects Gitterbaufehler (DE-588)4125030-8 gnd Hyperfeinwechselwirkung (DE-588)4161053-2 gnd Halbleiter (DE-588)4022993-2 gnd |
subject_GND | (DE-588)4125030-8 (DE-588)4161053-2 (DE-588)4022993-2 |
title | Hyperfine interaction of defects in semiconductors |
title_auth | Hyperfine interaction of defects in semiconductors |
title_exact_search | Hyperfine interaction of defects in semiconductors |
title_full | Hyperfine interaction of defects in semiconductors ed. by G. Langouche |
title_fullStr | Hyperfine interaction of defects in semiconductors ed. by G. Langouche |
title_full_unstemmed | Hyperfine interaction of defects in semiconductors ed. by G. Langouche |
title_short | Hyperfine interaction of defects in semiconductors |
title_sort | hyperfine interaction of defects in semiconductors |
topic | Interactions hyperfines Semiconducteurs - Défauts Hyperfine interactions Semiconductors Defects Gitterbaufehler (DE-588)4125030-8 gnd Hyperfeinwechselwirkung (DE-588)4161053-2 gnd Halbleiter (DE-588)4022993-2 gnd |
topic_facet | Interactions hyperfines Semiconducteurs - Défauts Hyperfine interactions Semiconductors Defects Gitterbaufehler Hyperfeinwechselwirkung Halbleiter |
work_keys_str_mv | AT langoucheg hyperfineinteractionofdefectsinsemiconductors |