1993 proceedings: San Francisco, California, USA
Gespeichert in:
Körperschaft: | |
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Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Piscataway, NJ
IEEE Computer Soc. u.a.
1993
|
Schlagworte: | |
Beschreibung: | IX, 373 S. Ill., graph. Darst. |
ISBN: | 0780308670 |
Internformat
MARC
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041 | 0 | |a eng | |
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050 | 0 | |a TK7874 | |
082 | 0 | |a 621.395 |b In8p, 1993 |2 20 | |
084 | |a ZN 4900 |0 (DE-625)157417: |2 rvk | ||
111 | 2 | |a International Conference on Wafer Scale Integration |n 5 |d 1993 |c San Francisco, Calif. |j Verfasser |0 (DE-588)5102934-0 |4 aut | |
245 | 1 | 0 | |a 1993 proceedings |b San Francisco, California, USA |c fifth annual IEEE International Conference on Wafer Scale Integration ; ed. by Peter W. Wyatt ... |
246 | 1 | 3 | |a Nineteen hundred and ninety-three proceedings |
264 | 1 | |a Piscataway, NJ |b IEEE Computer Soc. u.a. |c 1993 | |
300 | |a IX, 373 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 7 | |a Intégration sur tranche entière (circuits intégrés) - Congrès |2 ram | |
650 | 7 | |a Intégration tranche entière (Circuits intégrés) - Congrès |2 ram | |
650 | 7 | |a WSI |2 inriac | |
650 | 7 | |a conception WSI |2 inriac | |
650 | 7 | |a interconnexion circuit |2 inriac | |
650 | 7 | |a reconfiguration |2 inriac | |
650 | 7 | |a technologie WSI |2 inriac | |
650 | 7 | |a test |2 inriac | |
650 | 4 | |a Integrated circuits |x Wafer-scale integration |v Congresses | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
700 | 1 | |a Wyatt, Peter W. |e Sonstige |4 oth | |
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-005410633 |
Datensatz im Suchindex
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adam_text | |
any_adam_object | |
author_corporate | International Conference on Wafer Scale Integration San Francisco, Calif |
author_corporate_role | aut |
author_facet | International Conference on Wafer Scale Integration San Francisco, Calif |
author_sort | International Conference on Wafer Scale Integration San Francisco, Calif |
building | Verbundindex |
bvnumber | BV008199898 |
callnumber-first | T - Technology |
callnumber-label | TK7874 |
callnumber-raw | TK7874 |
callnumber-search | TK7874 |
callnumber-sort | TK 47874 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | ZN 4900 |
ctrlnum | (OCoLC)27841389 (DE-599)BVBBV008199898 |
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dewey-ones | 621 - Applied physics |
dewey-raw | 621.395 |
dewey-search | 621.395 |
dewey-sort | 3621.395 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Conference Proceeding Book |
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genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV008199898 |
illustrated | Illustrated |
indexdate | 2025-01-10T13:18:12Z |
institution | BVB |
institution_GND | (DE-588)5102934-0 |
isbn | 0780308670 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005410633 |
oclc_num | 27841389 |
open_access_boolean | |
owner | DE-739 DE-83 |
owner_facet | DE-739 DE-83 |
physical | IX, 373 S. Ill., graph. Darst. |
publishDate | 1993 |
publishDateSearch | 1993 |
publishDateSort | 1993 |
publisher | IEEE Computer Soc. u.a. |
record_format | marc |
spelling | International Conference on Wafer Scale Integration 5 1993 San Francisco, Calif. Verfasser (DE-588)5102934-0 aut 1993 proceedings San Francisco, California, USA fifth annual IEEE International Conference on Wafer Scale Integration ; ed. by Peter W. Wyatt ... Nineteen hundred and ninety-three proceedings Piscataway, NJ IEEE Computer Soc. u.a. 1993 IX, 373 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Intégration sur tranche entière (circuits intégrés) - Congrès ram Intégration tranche entière (Circuits intégrés) - Congrès ram WSI inriac conception WSI inriac interconnexion circuit inriac reconfiguration inriac technologie WSI inriac test inriac Integrated circuits Wafer-scale integration Congresses (DE-588)1071861417 Konferenzschrift gnd-content Wyatt, Peter W. Sonstige oth |
spellingShingle | 1993 proceedings San Francisco, California, USA Intégration sur tranche entière (circuits intégrés) - Congrès ram Intégration tranche entière (Circuits intégrés) - Congrès ram WSI inriac conception WSI inriac interconnexion circuit inriac reconfiguration inriac technologie WSI inriac test inriac Integrated circuits Wafer-scale integration Congresses |
subject_GND | (DE-588)1071861417 |
title | 1993 proceedings San Francisco, California, USA |
title_alt | Nineteen hundred and ninety-three proceedings |
title_auth | 1993 proceedings San Francisco, California, USA |
title_exact_search | 1993 proceedings San Francisco, California, USA |
title_full | 1993 proceedings San Francisco, California, USA fifth annual IEEE International Conference on Wafer Scale Integration ; ed. by Peter W. Wyatt ... |
title_fullStr | 1993 proceedings San Francisco, California, USA fifth annual IEEE International Conference on Wafer Scale Integration ; ed. by Peter W. Wyatt ... |
title_full_unstemmed | 1993 proceedings San Francisco, California, USA fifth annual IEEE International Conference on Wafer Scale Integration ; ed. by Peter W. Wyatt ... |
title_short | 1993 proceedings |
title_sort | 1993 proceedings san francisco california usa |
title_sub | San Francisco, California, USA |
topic | Intégration sur tranche entière (circuits intégrés) - Congrès ram Intégration tranche entière (Circuits intégrés) - Congrès ram WSI inriac conception WSI inriac interconnexion circuit inriac reconfiguration inriac technologie WSI inriac test inriac Integrated circuits Wafer-scale integration Congresses |
topic_facet | Intégration sur tranche entière (circuits intégrés) - Congrès Intégration tranche entière (Circuits intégrés) - Congrès WSI conception WSI interconnexion circuit reconfiguration technologie WSI test Integrated circuits Wafer-scale integration Congresses Konferenzschrift |
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