Growth and structural characterization of strained-layer Si m Ge n superlattices:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Mikrofilm Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Zürich
1990
|
| Schlagworte: | |
| Beschreibung: | Zürich, Techn. Hochsch., Diss. - Mikroreprod. e. Ms. VIII, 82 Bl. : Ill., graph. Darst. |
| Beschreibung: | 1 Mikrofiche; 24x |
Internformat
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| 100 | 1 | |a Ospelt, Manfred M. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Growth and structural characterization of strained-layer Si m Ge n superlattices |c presented by Manfred Martin Ospelt |
| 264 | 1 | |a Zürich |c 1990 | |
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Datensatz im Suchindex
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| author | Ospelt, Manfred M. |
| author_facet | Ospelt, Manfred M. |
| author_role | aut |
| author_sort | Ospelt, Manfred M. |
| author_variant | m m o mm mmo |
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| bvnumber | BV008017345 |
| classification_tum | ELT 280d |
| ctrlnum | (OCoLC)632919359 (DE-599)BVBBV008017345 |
| discipline | Elektrotechnik |
| format | Microfilm Book |
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| genre_facet | Hochschulschrift |
| id | DE-604.BV008017345 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:12:57Z |
| institution | BVB |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005274599 |
| oclc_num | 632919359 |
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| physical | 1 Mikrofiche; 24x |
| publishDate | 1990 |
| publishDateSearch | 1990 |
| publishDateSort | 1990 |
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| spelling | Ospelt, Manfred M. Verfasser aut Growth and structural characterization of strained-layer Si m Ge n superlattices presented by Manfred Martin Ospelt Zürich 1990 1 Mikrofiche; 24x txt rdacontent h rdamedia he rdacarrier Zürich, Techn. Hochsch., Diss. - Mikroreprod. e. Ms. VIII, 82 Bl. : Ill., graph. Darst. Mischkristall (DE-588)4170112-4 gnd rswk-swf Germanium (DE-588)4135644-5 gnd rswk-swf Übergitter (DE-588)4263273-0 gnd rswk-swf Silicium (DE-588)4077445-4 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Silicium (DE-588)4077445-4 s Germanium (DE-588)4135644-5 s Mischkristall (DE-588)4170112-4 s Übergitter (DE-588)4263273-0 s DE-604 |
| spellingShingle | Ospelt, Manfred M. Growth and structural characterization of strained-layer Si m Ge n superlattices Mischkristall (DE-588)4170112-4 gnd Germanium (DE-588)4135644-5 gnd Übergitter (DE-588)4263273-0 gnd Silicium (DE-588)4077445-4 gnd |
| subject_GND | (DE-588)4170112-4 (DE-588)4135644-5 (DE-588)4263273-0 (DE-588)4077445-4 (DE-588)4113937-9 |
| title | Growth and structural characterization of strained-layer Si m Ge n superlattices |
| title_auth | Growth and structural characterization of strained-layer Si m Ge n superlattices |
| title_exact_search | Growth and structural characterization of strained-layer Si m Ge n superlattices |
| title_full | Growth and structural characterization of strained-layer Si m Ge n superlattices presented by Manfred Martin Ospelt |
| title_fullStr | Growth and structural characterization of strained-layer Si m Ge n superlattices presented by Manfred Martin Ospelt |
| title_full_unstemmed | Growth and structural characterization of strained-layer Si m Ge n superlattices presented by Manfred Martin Ospelt |
| title_short | Growth and structural characterization of strained-layer Si m Ge n superlattices |
| title_sort | growth and structural characterization of strained layer si m ge n superlattices |
| topic | Mischkristall (DE-588)4170112-4 gnd Germanium (DE-588)4135644-5 gnd Übergitter (DE-588)4263273-0 gnd Silicium (DE-588)4077445-4 gnd |
| topic_facet | Mischkristall Germanium Übergitter Silicium Hochschulschrift |
| work_keys_str_mv | AT ospeltmanfredm growthandstructuralcharacterizationofstrainedlayersimgensuperlattices |