X-ray diffraction at elevated temperatures: a method for in situ process analysis
Saved in:
| Format: | Book |
|---|---|
| Language: | English |
| Published: |
New York, NY u.a.
VCH
1993
|
| Subjects: | |
| Physical Description: | VIII, 268 S. Ill., graph. Darst. |
| ISBN: | 3527278427 0895737450 |
Staff View
MARC
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| 245 | 1 | 0 | |a X-ray diffraction at elevated temperatures |b a method for in situ process analysis |c D. D. L. Chung ... |
| 264 | 1 | |a New York, NY u.a. |b VCH |c 1993 | |
| 300 | |a VIII, 268 S. |b Ill., graph. Darst. | ||
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| id | DE-604.BV007746495 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:08:49Z |
| institution | BVB |
| isbn | 3527278427 0895737450 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005093638 |
| oclc_num | 26502034 |
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| owner_facet | DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-703 DE-384 DE-29T DE-634 DE-188 |
| physical | VIII, 268 S. Ill., graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | VCH |
| record_format | marc |
| spelling | X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ... New York, NY u.a. VCH 1993 VIII, 268 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Rayons X - Applications industrielles ram Rayons X - Diffraction ram X-rays Diffraction X-rays Industrial applications Röntgenbeugung (DE-588)4178306-2 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Dynamik (DE-588)4013384-9 gnd rswk-swf Kristall (DE-588)4033209-3 gnd rswk-swf Hochtemperatur (DE-588)4282597-0 gnd rswk-swf Kristall (DE-588)4033209-3 s Dynamik (DE-588)4013384-9 s Hochtemperatur (DE-588)4282597-0 s Röntgenstrukturanalyse (DE-588)4137203-7 s DE-604 Röntgenbeugung (DE-588)4178306-2 s Chung, Deborah D. L. 1952- Sonstige (DE-588)123814944 oth |
| spellingShingle | X-ray diffraction at elevated temperatures a method for in situ process analysis Rayons X - Applications industrielles ram Rayons X - Diffraction ram X-rays Diffraction X-rays Industrial applications Röntgenbeugung (DE-588)4178306-2 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Dynamik (DE-588)4013384-9 gnd Kristall (DE-588)4033209-3 gnd Hochtemperatur (DE-588)4282597-0 gnd |
| subject_GND | (DE-588)4178306-2 (DE-588)4137203-7 (DE-588)4013384-9 (DE-588)4033209-3 (DE-588)4282597-0 |
| title | X-ray diffraction at elevated temperatures a method for in situ process analysis |
| title_auth | X-ray diffraction at elevated temperatures a method for in situ process analysis |
| title_exact_search | X-ray diffraction at elevated temperatures a method for in situ process analysis |
| title_full | X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ... |
| title_fullStr | X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ... |
| title_full_unstemmed | X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ... |
| title_short | X-ray diffraction at elevated temperatures |
| title_sort | x ray diffraction at elevated temperatures a method for in situ process analysis |
| title_sub | a method for in situ process analysis |
| topic | Rayons X - Applications industrielles ram Rayons X - Diffraction ram X-rays Diffraction X-rays Industrial applications Röntgenbeugung (DE-588)4178306-2 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Dynamik (DE-588)4013384-9 gnd Kristall (DE-588)4033209-3 gnd Hochtemperatur (DE-588)4282597-0 gnd |
| topic_facet | Rayons X - Applications industrielles Rayons X - Diffraction X-rays Diffraction X-rays Industrial applications Röntgenbeugung Röntgenstrukturanalyse Dynamik Kristall Hochtemperatur |
| work_keys_str_mv | AT chungdeborahdl xraydiffractionatelevatedtemperaturesamethodforinsituprocessanalysis |