X-ray diffraction at elevated temperatures: a method for in situ process analysis
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York, NY u.a.
VCH
1993
|
| Schlagworte: | |
| Beschreibung: | VIII, 268 S. Ill., graph. Darst. |
| ISBN: | 3527278427 0895737450 |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV007746495 | ||
| 003 | DE-604 | ||
| 005 | 20010420 | ||
| 007 | t | ||
| 008 | 930607s1993 gw ad|| |||| 00||| eng d | ||
| 020 | |a 3527278427 |9 3-527-27842-7 | ||
| 020 | |a 0895737450 |9 0-89573-745-0 | ||
| 035 | |a (OCoLC)26502034 | ||
| 035 | |a (DE-599)BVBBV007746495 | ||
| 040 | |a DE-604 |b ger |e rakwb | ||
| 041 | 0 | |a eng | |
| 044 | |a gw |c DE | ||
| 049 | |a DE-91 |a DE-355 |a DE-703 |a DE-384 |a DE-29T |a DE-634 |a DE-188 | ||
| 050 | 0 | |a QC482.D5 | |
| 082 | 0 | |a 548/.83 |2 20 | |
| 084 | |a UQ 5600 |0 (DE-625)146528: |2 rvk | ||
| 084 | |a VG 9900 |0 (DE-625)147245:253 |2 rvk | ||
| 084 | |a PHY 606f |2 stub | ||
| 245 | 1 | 0 | |a X-ray diffraction at elevated temperatures |b a method for in situ process analysis |c D. D. L. Chung ... |
| 264 | 1 | |a New York, NY u.a. |b VCH |c 1993 | |
| 300 | |a VIII, 268 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 7 | |a Rayons X - Applications industrielles |2 ram | |
| 650 | 7 | |a Rayons X - Diffraction |2 ram | |
| 650 | 4 | |a X-rays |x Diffraction | |
| 650 | 4 | |a X-rays |x Industrial applications | |
| 650 | 0 | 7 | |a Röntgenbeugung |0 (DE-588)4178306-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Dynamik |0 (DE-588)4013384-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kristall |0 (DE-588)4033209-3 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Hochtemperatur |0 (DE-588)4282597-0 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Kristall |0 (DE-588)4033209-3 |D s |
| 689 | 0 | 1 | |a Dynamik |0 (DE-588)4013384-9 |D s |
| 689 | 0 | 2 | |a Hochtemperatur |0 (DE-588)4282597-0 |D s |
| 689 | 0 | 3 | |a Röntgenstrukturanalyse |0 (DE-588)4137203-7 |D s |
| 689 | 0 | |5 DE-604 | |
| 689 | 1 | 0 | |a Röntgenbeugung |0 (DE-588)4178306-2 |D s |
| 689 | 1 | 1 | |a Hochtemperatur |0 (DE-588)4282597-0 |D s |
| 689 | 1 | |5 DE-604 | |
| 700 | 1 | |a Chung, Deborah D. L. |d 1952- |e Sonstige |0 (DE-588)123814944 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-005093638 | ||
Datensatz im Suchindex
| _version_ | 1804122119844397057 |
|---|---|
| any_adam_object | |
| author_GND | (DE-588)123814944 |
| building | Verbundindex |
| bvnumber | BV007746495 |
| callnumber-first | Q - Science |
| callnumber-label | QC482 |
| callnumber-raw | QC482.D5 |
| callnumber-search | QC482.D5 |
| callnumber-sort | QC 3482 D5 |
| callnumber-subject | QC - Physics |
| classification_rvk | UQ 5600 VG 9900 |
| classification_tum | PHY 606f |
| ctrlnum | (OCoLC)26502034 (DE-599)BVBBV007746495 |
| dewey-full | 548/.83 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
| dewey-raw | 548/.83 |
| dewey-search | 548/.83 |
| dewey-sort | 3548 283 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01952nam a2200541 c 4500</leader><controlfield tag="001">BV007746495</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20010420 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930607s1993 gw ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3527278427</subfield><subfield code="9">3-527-27842-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0895737450</subfield><subfield code="9">0-89573-745-0</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)26502034</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV007746495</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakwb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="044" ind1=" " ind2=" "><subfield code="a">gw</subfield><subfield code="c">DE</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-91</subfield><subfield code="a">DE-355</subfield><subfield code="a">DE-703</subfield><subfield code="a">DE-384</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-634</subfield><subfield code="a">DE-188</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QC482.D5</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">548/.83</subfield><subfield code="2">20</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 5600</subfield><subfield code="0">(DE-625)146528:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 9900</subfield><subfield code="0">(DE-625)147245:253</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">PHY 606f</subfield><subfield code="2">stub</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">X-ray diffraction at elevated temperatures</subfield><subfield code="b">a method for in situ process analysis</subfield><subfield code="c">D. D. L. Chung ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York, NY u.a.</subfield><subfield code="b">VCH</subfield><subfield code="c">1993</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VIII, 268 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Rayons X - Applications industrielles</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="7"><subfield code="a">Rayons X - Diffraction</subfield><subfield code="2">ram</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-rays</subfield><subfield code="x">Diffraction</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">X-rays</subfield><subfield code="x">Industrial applications</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenbeugung</subfield><subfield code="0">(DE-588)4178306-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Dynamik</subfield><subfield code="0">(DE-588)4013384-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Kristall</subfield><subfield code="0">(DE-588)4033209-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Hochtemperatur</subfield><subfield code="0">(DE-588)4282597-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Kristall</subfield><subfield code="0">(DE-588)4033209-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Dynamik</subfield><subfield code="0">(DE-588)4013384-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Hochtemperatur</subfield><subfield code="0">(DE-588)4282597-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Röntgenstrukturanalyse</subfield><subfield code="0">(DE-588)4137203-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Röntgenbeugung</subfield><subfield code="0">(DE-588)4178306-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Hochtemperatur</subfield><subfield code="0">(DE-588)4282597-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Chung, Deborah D. L.</subfield><subfield code="d">1952-</subfield><subfield code="e">Sonstige</subfield><subfield code="0">(DE-588)123814944</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005093638</subfield></datafield></record></collection> |
| id | DE-604.BV007746495 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:08:49Z |
| institution | BVB |
| isbn | 3527278427 0895737450 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005093638 |
| oclc_num | 26502034 |
| open_access_boolean | |
| owner | DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-703 DE-384 DE-29T DE-634 DE-188 |
| owner_facet | DE-91 DE-BY-TUM DE-355 DE-BY-UBR DE-703 DE-384 DE-29T DE-634 DE-188 |
| physical | VIII, 268 S. Ill., graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | VCH |
| record_format | marc |
| spelling | X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ... New York, NY u.a. VCH 1993 VIII, 268 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Rayons X - Applications industrielles ram Rayons X - Diffraction ram X-rays Diffraction X-rays Industrial applications Röntgenbeugung (DE-588)4178306-2 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Dynamik (DE-588)4013384-9 gnd rswk-swf Kristall (DE-588)4033209-3 gnd rswk-swf Hochtemperatur (DE-588)4282597-0 gnd rswk-swf Kristall (DE-588)4033209-3 s Dynamik (DE-588)4013384-9 s Hochtemperatur (DE-588)4282597-0 s Röntgenstrukturanalyse (DE-588)4137203-7 s DE-604 Röntgenbeugung (DE-588)4178306-2 s Chung, Deborah D. L. 1952- Sonstige (DE-588)123814944 oth |
| spellingShingle | X-ray diffraction at elevated temperatures a method for in situ process analysis Rayons X - Applications industrielles ram Rayons X - Diffraction ram X-rays Diffraction X-rays Industrial applications Röntgenbeugung (DE-588)4178306-2 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Dynamik (DE-588)4013384-9 gnd Kristall (DE-588)4033209-3 gnd Hochtemperatur (DE-588)4282597-0 gnd |
| subject_GND | (DE-588)4178306-2 (DE-588)4137203-7 (DE-588)4013384-9 (DE-588)4033209-3 (DE-588)4282597-0 |
| title | X-ray diffraction at elevated temperatures a method for in situ process analysis |
| title_auth | X-ray diffraction at elevated temperatures a method for in situ process analysis |
| title_exact_search | X-ray diffraction at elevated temperatures a method for in situ process analysis |
| title_full | X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ... |
| title_fullStr | X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ... |
| title_full_unstemmed | X-ray diffraction at elevated temperatures a method for in situ process analysis D. D. L. Chung ... |
| title_short | X-ray diffraction at elevated temperatures |
| title_sort | x ray diffraction at elevated temperatures a method for in situ process analysis |
| title_sub | a method for in situ process analysis |
| topic | Rayons X - Applications industrielles ram Rayons X - Diffraction ram X-rays Diffraction X-rays Industrial applications Röntgenbeugung (DE-588)4178306-2 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Dynamik (DE-588)4013384-9 gnd Kristall (DE-588)4033209-3 gnd Hochtemperatur (DE-588)4282597-0 gnd |
| topic_facet | Rayons X - Applications industrielles Rayons X - Diffraction X-rays Diffraction X-rays Industrial applications Röntgenbeugung Röntgenstrukturanalyse Dynamik Kristall Hochtemperatur |
| work_keys_str_mv | AT chungdeborahdl xraydiffractionatelevatedtemperaturesamethodforinsituprocessanalysis |