Advanced scanning electron microscopy and X-ray microanalysis:
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
New York u.a.
Plenum Pr.
1986
|
| Schlagworte: | |
| Beschreibung: | Literaturverz. S. 435 - 448 |
| Beschreibung: | XII, 454 S. Ill., graph. Darst. |
| ISBN: | 0306421402 |
Internformat
MARC
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| 245 | 1 | 0 | |a Advanced scanning electron microscopy and X-ray microanalysis |c Dale E. Newbury ... |
| 264 | 1 | |a New York u.a. |b Plenum Pr. |c 1986 | |
| 300 | |a XII, 454 S. |b Ill., graph. Darst. | ||
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| 650 | 4 | |a Microscopes électroniques à balayage | |
| 650 | 4 | |a Electron Probe Microanalysis | |
| 650 | 4 | |a Microscopy, Electron, Scanning | |
| 650 | 4 | |a Scanning electron microscopy | |
| 650 | 4 | |a X-ray microanalysis | |
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Datensatz im Suchindex
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| bvnumber | BV007715884 |
| callnumber-first | Q - Science |
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| callnumber-search | QH212.S3 |
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| callnumber-subject | QH - Natural History and Biology |
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| dewey-ones | 502 - Miscellany |
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| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik Chemie |
| format | Book |
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| id | DE-604.BV007715884 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:08:14Z |
| institution | BVB |
| isbn | 0306421402 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005069268 |
| oclc_num | 14174776 |
| open_access_boolean | |
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| owner_facet | DE-355 DE-BY-UBR DE-29T DE-91G DE-BY-TUM DE-11 |
| physical | XII, 454 S. Ill., graph. Darst. |
| publishDate | 1986 |
| publishDateSearch | 1986 |
| publishDateSort | 1986 |
| publisher | Plenum Pr. |
| record_format | marc |
| spelling | Advanced scanning electron microscopy and X-ray microanalysis Dale E. Newbury ... New York u.a. Plenum Pr. 1986 XII, 454 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Literaturverz. S. 435 - 448 Elektronenmicroscopie gtt Microanalyse aux rayons X Microanalyse gtt Microscopes électroniques à balayage Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Abtastsystem (DE-588)4129844-5 gnd rswk-swf Röntgenstrukturanalyse (DE-588)4137203-7 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Röntgenmikroskopie (DE-588)4178315-3 gnd rswk-swf Röntgenmikroskopie (DE-588)4178315-3 s DE-604 Rasterelektronenmikroskopie (DE-588)4048455-5 s Röntgenstrukturanalyse (DE-588)4137203-7 s 1\p DE-604 Abtastsystem (DE-588)4129844-5 s 2\p DE-604 Elektronenmikroskopie (DE-588)4014327-2 s 3\p DE-604 Newbury, Dale E. Sonstige oth 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Advanced scanning electron microscopy and X-ray microanalysis Elektronenmicroscopie gtt Microanalyse aux rayons X Microanalyse gtt Microscopes électroniques à balayage Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Abtastsystem (DE-588)4129844-5 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Röntgenmikroskopie (DE-588)4178315-3 gnd |
| subject_GND | (DE-588)4129844-5 (DE-588)4137203-7 (DE-588)4014327-2 (DE-588)4048455-5 (DE-588)4178315-3 |
| title | Advanced scanning electron microscopy and X-ray microanalysis |
| title_auth | Advanced scanning electron microscopy and X-ray microanalysis |
| title_exact_search | Advanced scanning electron microscopy and X-ray microanalysis |
| title_full | Advanced scanning electron microscopy and X-ray microanalysis Dale E. Newbury ... |
| title_fullStr | Advanced scanning electron microscopy and X-ray microanalysis Dale E. Newbury ... |
| title_full_unstemmed | Advanced scanning electron microscopy and X-ray microanalysis Dale E. Newbury ... |
| title_short | Advanced scanning electron microscopy and X-ray microanalysis |
| title_sort | advanced scanning electron microscopy and x ray microanalysis |
| topic | Elektronenmicroscopie gtt Microanalyse aux rayons X Microanalyse gtt Microscopes électroniques à balayage Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Abtastsystem (DE-588)4129844-5 gnd Röntgenstrukturanalyse (DE-588)4137203-7 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd Röntgenmikroskopie (DE-588)4178315-3 gnd |
| topic_facet | Elektronenmicroscopie Microanalyse aux rayons X Microanalyse Microscopes électroniques à balayage Electron Probe Microanalysis Microscopy, Electron, Scanning Scanning electron microscopy X-ray microanalysis Abtastsystem Röntgenstrukturanalyse Elektronenmikroskopie Rasterelektronenmikroskopie Röntgenmikroskopie |
| work_keys_str_mv | AT newburydalee advancedscanningelectronmicroscopyandxraymicroanalysis |