(1993). Characterization of semiconductor substrates and structures: Proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992. North-Holland.
Chicago Style (17th ed.) CitationCharacterization of Semiconductor Substrates and Structures: Proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992. Amsterdam: North-Holland, 1993.
MLA (9th ed.) CitationCharacterization of Semiconductor Substrates and Structures: Proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992. North-Holland, 1993.
Warning: These citations may not always be 100% accurate.