Characterization of semiconductor substrates and structures: proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | English |
| Veröffentlicht: |
Amsterdam
North-Holland
1993
|
| Schriftenreihe: | Journal of crystal growth
126,1 |
| Schlagworte: | |
| Beschreibung: | Einzelaufnahme eines Zs.-Heftes |
| Beschreibung: | 173 S. Ill., graph. Darst. |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV007711782 | ||
| 003 | DE-604 | ||
| 005 | 19930722 | ||
| 007 | t | ||
| 008 | 930421s1993 ad|| |||| 10||| eng d | ||
| 035 | |a (OCoLC)260175245 | ||
| 035 | |a (DE-599)BVBBV007711782 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-12 |a DE-706 | ||
| 050 | 0 | |a QD921 | |
| 084 | |a 7,41 |2 ssgn | ||
| 245 | 1 | 0 | |a Characterization of semiconductor substrates and structures |b proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 |c ed. by M. Schieber ... |
| 264 | 1 | |a Amsterdam |b North-Holland |c 1993 | |
| 300 | |a 173 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Journal of crystal growth |v 126,1 | |
| 500 | |a Einzelaufnahme eines Zs.-Heftes | ||
| 650 | 4 | |a Semiconductors |v Congresses | |
| 650 | 0 | 7 | |a Halbleiter |0 (DE-588)4022993-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Substrat |g Mikroelektronik |0 (DE-588)4229622-5 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |y 1992 |z Smolenice |2 gnd-content | |
| 689 | 0 | 0 | |a Halbleiter |0 (DE-588)4022993-2 |D s |
| 689 | 0 | 1 | |a Substrat |g Mikroelektronik |0 (DE-588)4229622-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Schieber, M. |e Sonstige |4 oth | |
| 711 | 2 | |a International Workshop on Characterization of Semiconductor Substrates and Structures |d 1992 |c Smolenice |j Sonstige |0 (DE-588)3015177-6 |4 oth | |
| 940 | 1 | |n oe | |
| 942 | 1 | 1 | |e 22/bsb |g 4373 |
| 943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-005065804 | |
Datensatz im Suchindex
| _version_ | 1809403382182445056 |
|---|---|
| adam_text | |
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV007711782 |
| callnumber-first | Q - Science |
| callnumber-label | QD921 |
| callnumber-raw | QD921 |
| callnumber-search | QD921 |
| callnumber-sort | QD 3921 |
| callnumber-subject | QD - Chemistry |
| ctrlnum | (OCoLC)260175245 (DE-599)BVBBV007711782 |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 cb4500</leader><controlfield tag="001">BV007711782</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19930722</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930421s1993 ad|| |||| 10||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)260175245</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV007711782</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-12</subfield><subfield code="a">DE-706</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QD921</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">7,41</subfield><subfield code="2">ssgn</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Characterization of semiconductor substrates and structures</subfield><subfield code="b">proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992</subfield><subfield code="c">ed. by M. Schieber ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Amsterdam</subfield><subfield code="b">North-Holland</subfield><subfield code="c">1993</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">173 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Journal of crystal growth</subfield><subfield code="v">126,1</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Einzelaufnahme eines Zs.-Heftes</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Substrat</subfield><subfield code="g">Mikroelektronik</subfield><subfield code="0">(DE-588)4229622-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="y">1992</subfield><subfield code="z">Smolenice</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiter</subfield><subfield code="0">(DE-588)4022993-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Substrat</subfield><subfield code="g">Mikroelektronik</subfield><subfield code="0">(DE-588)4229622-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Schieber, M.</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">International Workshop on Characterization of Semiconductor Substrates and Structures</subfield><subfield code="d">1992</subfield><subfield code="c">Smolenice</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)3015177-6</subfield><subfield code="4">oth</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="n">oe</subfield></datafield><datafield tag="942" ind1="1" ind2="1"><subfield code="e">22/bsb</subfield><subfield code="g">4373</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005065804</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift 1992 Smolenice gnd-content |
| genre_facet | Konferenzschrift 1992 Smolenice |
| id | DE-604.BV007711782 |
| illustrated | Illustrated |
| indexdate | 2024-09-06T00:12:13Z |
| institution | BVB |
| institution_GND | (DE-588)3015177-6 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005065804 |
| oclc_num | 260175245 |
| open_access_boolean | |
| owner | DE-12 DE-706 |
| owner_facet | DE-12 DE-706 |
| physical | 173 S. Ill., graph. Darst. |
| publishDate | 1993 |
| publishDateSearch | 1993 |
| publishDateSort | 1993 |
| publisher | North-Holland |
| record_format | marc |
| series2 | Journal of crystal growth |
| spelling | Characterization of semiconductor substrates and structures proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 ed. by M. Schieber ... Amsterdam North-Holland 1993 173 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Journal of crystal growth 126,1 Einzelaufnahme eines Zs.-Heftes Semiconductors Congresses Halbleiter (DE-588)4022993-2 gnd rswk-swf Substrat Mikroelektronik (DE-588)4229622-5 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1992 Smolenice gnd-content Halbleiter (DE-588)4022993-2 s Substrat Mikroelektronik (DE-588)4229622-5 s DE-604 Schieber, M. Sonstige oth International Workshop on Characterization of Semiconductor Substrates and Structures 1992 Smolenice Sonstige (DE-588)3015177-6 oth |
| spellingShingle | Characterization of semiconductor substrates and structures proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 Semiconductors Congresses Halbleiter (DE-588)4022993-2 gnd Substrat Mikroelektronik (DE-588)4229622-5 gnd |
| subject_GND | (DE-588)4022993-2 (DE-588)4229622-5 (DE-588)1071861417 |
| title | Characterization of semiconductor substrates and structures proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 |
| title_auth | Characterization of semiconductor substrates and structures proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 |
| title_exact_search | Characterization of semiconductor substrates and structures proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 |
| title_full | Characterization of semiconductor substrates and structures proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 ed. by M. Schieber ... |
| title_fullStr | Characterization of semiconductor substrates and structures proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 ed. by M. Schieber ... |
| title_full_unstemmed | Characterization of semiconductor substrates and structures proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 ed. by M. Schieber ... |
| title_short | Characterization of semiconductor substrates and structures |
| title_sort | characterization of semiconductor substrates and structures proceedings of the international workshop on characterization of semiconductor substrates and structures smolenice czechoslovakia 1 4 april 1992 |
| title_sub | proceedings of the International Workshop on Characterization of Semiconductor Substrates and Structures, Smolenice, Czechoslovakia 1 - 4 April 1992 |
| topic | Semiconductors Congresses Halbleiter (DE-588)4022993-2 gnd Substrat Mikroelektronik (DE-588)4229622-5 gnd |
| topic_facet | Semiconductors Congresses Halbleiter Substrat Mikroelektronik Konferenzschrift 1992 Smolenice |
| work_keys_str_mv | AT schieberm characterizationofsemiconductorsubstratesandstructuresproceedingsoftheinternationalworkshoponcharacterizationofsemiconductorsubstratesandstructuressmoleniceczechoslovakia14april1992 AT internationalworkshoponcharacterizationofsemiconductorsubstratesandstructuressmolenice characterizationofsemiconductorsubstratesandstructuresproceedingsoftheinternationalworkshoponcharacterizationofsemiconductorsubstratesandstructuressmoleniceczechoslovakia14april1992 |