Electron and ion microscopy and microanalysis: principles and applications
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
Dekker
1991
|
| Ausgabe: | 2. ed., rev. and expanded |
| Schriftenreihe: | Optical engineering
29 |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | XIV, 837 S. zahlr. Ill., graph. Darst. |
| ISBN: | 0824785568 |
Internformat
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| 245 | 1 | 0 | |a Electron and ion microscopy and microanalysis |b principles and applications |c Lawrence E. Murr |
| 250 | |a 2. ed., rev. and expanded | ||
| 264 | 1 | |a New York [u.a.] |b Dekker |c 1991 | |
| 300 | |a XIV, 837 S. |b zahlr. Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Optical engineering |v 29 | |
| 650 | 7 | |a Microscopia Eletronica |2 larpcal | |
| 650 | 4 | |a Electron microscopy | |
| 650 | 4 | |a Field ion microscopy | |
| 650 | 4 | |a Microprobe analysis | |
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Datensatz im Suchindex
| _version_ | 1805083586006614016 |
|---|---|
| adam_text |
SECOND EDITION REVISED AND EXPANDED L UNIVERSITY OF TEXAS AT EL PASO EL
PASO, TEXAS MARCEL DEKKER, INC. NEW YORK * BASEL * HONG KONG CONTENTS
ABOUT THE SERIES (BRIAN J. THOMPSON) PREFACE CHAPTER 1: FUNDAMENTAL
PROPERTIES OF ELECTRONS AND IONS 1 1.1 INTRODUCTION 1 1.2 ELECTRON
CHARGE AND MASS 2 1.3 WAVE NATURE OF ELECTRONS 6 1.4 ATOMIC ENERGY
LEVELS 15 1.5 ELECTRON SPIN 17 1.6 ELECTRONS IN MOLECULES AND SOLIDS:
ELECTRON ENERGY BANDS 19 1.7 ELECTRON WAVES IN SOLID CRYSTALS 23 1.8
IONIZATION PROCESSES AND THE NATURE OF IONS 27 PROBLEMS 29 REFERENCES 32
SUGGESTED SUPPLEMENTARY READING 33 CHAPTER 2: ELECTRON EMISSION AND
EMISSION AND IONIZATION MICROSCOPY 35 2.1 INTRODUCTION 35 2.2 ENERGY
DISTRIBUTION OF ELECTRONS IN A METAL 38 2.3 NATURE OF THE METAL WORK
FUNCTION, *** 41 2.4 PHOTOEMISSION ELECTRON MICROSCOPY 43 2.5 THERMIONIC
EMISSION AND THERMIONIC ELECTRON EMISSION MICROSCOPY 45 2.6 FIELD
EMISSION AND FIELD EMISSION MICROSCOPY 58 2.7 SCANNING TUNNELING
MICROSCOPY 83 PROBLEMS 93 REFERENCES 98 SUGGESTED SUPPLEMENTARY READING
101 XII CONTENTS CHAPTER 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS
103 3.1 INTRODUCTION 103 3.2 FUNDAMENTALS OF ELECTRON AND ION OPTICS 104
3.3 THE ELECTRON OPTICAL SYSTEM 114 3.4 THE ION OPTICAL SYSTEM 132 3.5
SIGNAL DETECTION, AMPLIFICATION, AND INTENSIFICATION 141 PROBLEMS 145
REFERENCES 148 SUGGESTED SUPPLEMENTARY READING 148 CHAPTER 4: ELECTRON
AND ION PROBE MICROANALYSIS 151 4.1 INTRODUCTION 151 4.2 ELECTRON PROBE
MICROANALYSIS 152 4.3 MICROANALYSIS BY ELECTRON INTERACTION
SPECTROSCOPIES 175 4.4 RESOLUTION, CORRECTION FACTORS, AND ELEMENTAL
ANALYSIS IN THICK SPECIMENS AND THIN FILMS 191 4.5 APPLICATIONS OF
ELECTRON PROBE MICROANALYSIS 207 4.6 ION MICROPROBES AND MICROANALYSIS
222 4.7 ATOM-PROBE FIELD-ION MASS SPECTROMETRY 233 4.8 INTEGRATED
MODULAR MICROANALYSIS SYSTEMS 241 4.9 SUMMARY AND COMPARISON OF ELECTRON
AND ION PROBE MICROANALYSIS TECHNIQUES 244 PROBLEMS 245 REFERENCES 252
SUGGESTED SUPPLEMENTARY READING 254 CHAPTER 5: ELECTRON AND ION
MICROSCOPY OF SURFACES 257 5.1 INTRODUCTION 257 5.2 THE ELECTRON
MICROSCOPE 258 5.3 REPLICATION ELECTRON MICROSCOPY 273 5.4 REFLECTION
ELECTRON MICROSCOPY 293 5.5 SCANNING ELECTRON MICROSCOPY 301 5.6
ELECTRON MIRROR MICROSCOPY 339 5.7 ION MICROSCOPY OF SURFACES 344
PROBLEMS 348 REFERENCES 354 SUGGESTED SUPPLEMENTARY READING 361 CHAPTER
6: ELECTRON DIFFRACTION 363 6.1 INTRODUCTION 363 6.2 ELECTRON SCATTERING
FROM ATOMS IN A CRYSTAL LATTICE 364 6.3 ATOMIC CRYSTAL STRUCTURE
MODIFICATION OF ELECTRON DIFFRACTION AMPLITUDES: EXTINCTION CONDITIONS
371 6.4 GEOMETRICAL NATURE OF ELECTRON DIFFRACTION PATTERNS 377 6.5
DIFFRACTION INTENSITIES 385 6.6 DIFFUSE SCATTERING OF ELECTRONS: KIKUCHI
DIFFRACTION PATTERNS 404 6.7 LOW-ENERGY ELECTRON DIFFRACTION (LEED) 411
6.8 APPLICATIONS AND INTERPRETATION OF SELECTED-AREA ELECTRON
DIFFRACTION PATTERNS 419 6.9 CHEMICAL AND STRUCTURAL ANALYSIS BY
SELECTED-AREA ELECTRON DIFFRACTION 459 CONTENTS XIII 6.10 OBSERVATIONS
OF SURFACES USING MICROPROBE REFLECTION HIGH- ENERGY ELECTRON
DIFFRACTION 463 PROBLEMS 465 REFERENCES 471 SUGGESTED SUPPLEMENTARY
READING 472 CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY 475 7.1
INTRODUCTION 475 7.2 QUALITATIVE (KINEMATICAL) INTERPRETATION OF
CRYSTALLINE IMAGE CONTRAST 480 7.3 DYNAMICAL THEORY OF THE
INTERPRETATION OF THE IMAGES OF CRYSTAL LATTICE IMPERFECTIONS 515 7.4
STRUCTURAL GEOMETRY IN THIN-FILM MATERIALS 557 7.5 HIGH-RESOLUTION
ELECTRON MICROSCOPY 578 7.6 SCANNING TRANSMISSION ELECTRON MICROSCOPY
(STEM) 590 7.7 ANALYTICAL ELECTRON MICROSCOPY (AEM) 595 7.8 IMAGES OF
FERROELECTRIC AND FERROMAGNETIC DOMAINS 601 7.9 TRANSMISSION ION
MICROSCOPY 605 7.10 APPLICATIONS OF TRANSMISSION ELECTRON MICROSCOPY AND
RELATED TECHNIQUES: STRUCTURE-PROPERTY RELATIONSHIPS 607 PROBLEMS 632
REFERENCES 642 SUGGESTED SUPPLEMENTARY READING 647 CHAPTER 8:
HIGH-VOLTAGE ELECTRON MICROSCOPY 649 8.1 INTRODUCTION 649 8.2 DESIGN
FEATURES OF THE HIGH-VOLTAGE ELECTRON MICROSCOPE 650 8.3 HIGH-VOLTAGE
ELECTRON DIFFRACTION 654 8.4 IMAGE CONTRAST AT HIGH VOLTAGES 660 8.5
ELECTRON IRRADIATION EFFECTS IN SPECIMENS OBSERVED AT HIGH VOLTAGE 667
8.6 IN-SITU DEVICES AND EXPERIMENTS 669 8.7 APPLICATIONS OF HIGH-VOLTAGE
ELECTRON MICROSCOPY 674 PROBLEMS 679 REFERENCES 682 SUGGESTED
SUPPLEMENTARY READING 683 APPENDICES A. PRINCIPLES OF CRYSTALLOGRAPHY
AND SOME USEFUL CRYSTALLOGRAPHIC AND DIFFRACTION DATA 685 A.L
INTRODUCTION 685 A.2 UNIT CELLS OF CRYSTAL SPACE LATTICES 686 A.3 THE
IDENTIFICATION OF PLANES AND DIRECTIONS IN A CRYSTAL - CRYSTAL GEOMETRY
686 A.4 DETERMINATION OF CRYSTALLOGRAPHIC ORIENTATIONS 694 REFERENCES
710 B. SPECIMEN PREPARATION 711 B.L INTRODUCTION 711 XIV CONTENTS *.2
SPECIMEN PREPARATION FOR PHOTOELECTRON AND THERMIONIC EMISSION
MICROSCOPY 712 B.3 PREPARATION OF SPECIMENS FOR FIELD EMISSION AND
SCANNING TUNNELING MICROSCOPIES 712 B.4 SPECIMEN PREPARATION FOR
ELECTRON PROBE MICROANALYSIS AND SCANNING ELECTRON MICROSCOPY 714 B.5
PREPARATION OF SURFACE REPLICAS FOR THE ELECTRON MICROSCOPE 718 B.6
SPECIMEN PREPARATION FOR TRANSMISSION ELECTRON MICROSCOPY 720 REFERENCES
752 * COMPUTER PROGRAMS FOR ELECTRON DIFFRACTION ANALYSIS 755 D.
TABULATED MATERIALS CONSTANTS AND USEFUL PHYSICAL PROPERTIES 775 E.
PROBLEM SOLUTIONS AND DISCUSSION 789 F. COURSE OUTLINES 813 AUTHOR INDEX
817 SUBJECT INDEX 827 |
| any_adam_object | 1 |
| author | Murr, Lawrence E. 1939- |
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| dewey-ones | 502 - Miscellany |
| dewey-raw | 502/.8/25 |
| dewey-search | 502/.8/25 |
| dewey-sort | 3502 18 225 |
| dewey-tens | 500 - Natural sciences and mathematics |
| discipline | Allgemeine Naturwissenschaft Physik |
| edition | 2. ed., rev. and expanded |
| format | Book |
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| indexdate | 2024-07-20T07:50:54Z |
| institution | BVB |
| isbn | 0824785568 |
| language | English |
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| physical | XIV, 837 S. zahlr. Ill., graph. Darst. |
| publishDate | 1991 |
| publishDateSearch | 1991 |
| publishDateSort | 1991 |
| publisher | Dekker |
| record_format | marc |
| series | Optical engineering |
| series2 | Optical engineering |
| spelling | Murr, Lawrence E. 1939- Verfasser (DE-588)141844752 aut Electron and ion microscopy and microanalysis principles and applications Lawrence E. Murr 2. ed., rev. and expanded New York [u.a.] Dekker 1991 XIV, 837 S. zahlr. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Optical engineering 29 Microscopia Eletronica larpcal Electron microscopy Field ion microscopy Microprobe analysis Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Feldionenmikroskopie (DE-588)4153929-1 gnd rswk-swf Feldionenmikroskopie (DE-588)4153929-1 s DE-604 Elektronenmikroskopie (DE-588)4014327-2 s Optical engineering 29 (DE-604)BV001893528 29 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=005057403&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Murr, Lawrence E. 1939- Electron and ion microscopy and microanalysis principles and applications Optical engineering Microscopia Eletronica larpcal Electron microscopy Field ion microscopy Microprobe analysis Elektronenmikroskopie (DE-588)4014327-2 gnd Feldionenmikroskopie (DE-588)4153929-1 gnd |
| subject_GND | (DE-588)4014327-2 (DE-588)4153929-1 |
| title | Electron and ion microscopy and microanalysis principles and applications |
| title_auth | Electron and ion microscopy and microanalysis principles and applications |
| title_exact_search | Electron and ion microscopy and microanalysis principles and applications |
| title_full | Electron and ion microscopy and microanalysis principles and applications Lawrence E. Murr |
| title_fullStr | Electron and ion microscopy and microanalysis principles and applications Lawrence E. Murr |
| title_full_unstemmed | Electron and ion microscopy and microanalysis principles and applications Lawrence E. Murr |
| title_short | Electron and ion microscopy and microanalysis |
| title_sort | electron and ion microscopy and microanalysis principles and applications |
| title_sub | principles and applications |
| topic | Microscopia Eletronica larpcal Electron microscopy Field ion microscopy Microprobe analysis Elektronenmikroskopie (DE-588)4014327-2 gnd Feldionenmikroskopie (DE-588)4153929-1 gnd |
| topic_facet | Microscopia Eletronica Electron microscopy Field ion microscopy Microprobe analysis Elektronenmikroskopie Feldionenmikroskopie |
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