Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis
Saved in:
| Main Authors: | , , |
|---|---|
| Format: | Book |
| Language: | English |
| Published: |
New York u.a.
Wiley
1989
|
| Series: | A Wiley-Interscience Publication
|
| Subjects: | |
| Physical Description: | Getr. Zählung |
| ISBN: | 0471519456 |
Staff View
MARC
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| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b a practical handbook for depth profiling and bulk impurity analysis |c R. G. Wilson ; F. A. Stevie ; C. W. Magee |
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Record in the Search Index
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| author | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. |
| author_facet | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. |
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| bvnumber | BV007684967 |
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| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
| dewey-raw | 543/.0873 |
| dewey-search | 543/.0873 |
| dewey-sort | 3543 3873 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV007684967 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:07:36Z |
| institution | BVB |
| isbn | 0471519456 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005042702 |
| oclc_num | 20168488 |
| open_access_boolean | |
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| physical | Getr. Zählung |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley-Interscience Publication |
| spelling | Wilson, Robert G. Verfasser aut Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee New York u.a. Wiley 1989 Getr. Zählung txt rdacontent n rdamedia nc rdacarrier A Wiley-Interscience Publication Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Massenspektrometrie (DE-588)4037882-2 s 1\p DE-604 Stevie, Fred A. Verfasser aut Magee, Charles W. Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4037882-2 (DE-588)4077346-2 |
| title | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_auth | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_exact_search | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_full | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| title_fullStr | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| title_full_unstemmed | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_sub | a practical handbook for depth profiling and bulk impurity analysis |
| topic | Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Secondary ion mass spectrometry Massenspektrometrie Sekundärionen-Massenspektrometrie |
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