Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York u.a.
Wiley
1989
|
| Schriftenreihe: | A Wiley-Interscience Publication
|
| Schlagworte: | |
| Beschreibung: | Getr. Zählung |
| ISBN: | 0471519456 |
Internformat
MARC
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|---|---|---|---|
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| 003 | DE-604 | ||
| 005 | 19970520 | ||
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| 100 | 1 | |a Wilson, Robert G. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b a practical handbook for depth profiling and bulk impurity analysis |c R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| 264 | 1 | |a New York u.a. |b Wiley |c 1989 | |
| 300 | |a Getr. Zählung | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a A Wiley-Interscience Publication | |
| 650 | 4 | |a Secondary ion mass spectrometry | |
| 650 | 0 | 7 | |a Massenspektrometrie |0 (DE-588)4037882-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
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| 689 | 1 | 0 | |a Massenspektrometrie |0 (DE-588)4037882-2 |D s |
| 689 | 1 | |8 1\p |5 DE-604 | |
| 700 | 1 | |a Stevie, Fred A. |e Verfasser |4 aut | |
| 700 | 1 | |a Magee, Charles W. |e Verfasser |4 aut | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-005042702 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804122043062419456 |
|---|---|
| any_adam_object | |
| author | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. |
| author_facet | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. |
| author_role | aut aut aut |
| author_sort | Wilson, Robert G. |
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| building | Verbundindex |
| bvnumber | BV007684967 |
| callnumber-first | Q - Science |
| callnumber-label | QD96 |
| callnumber-raw | QD96.S43 |
| callnumber-search | QD96.S43 |
| callnumber-sort | QD 296 S43 |
| callnumber-subject | QD - Chemistry |
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| ctrlnum | (OCoLC)20168488 (DE-599)BVBBV007684967 |
| dewey-full | 543/.0873 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 543 - Analytical chemistry |
| dewey-raw | 543/.0873 |
| dewey-search | 543/.0873 |
| dewey-sort | 3543 3873 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV007684967 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T17:07:36Z |
| institution | BVB |
| isbn | 0471519456 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005042702 |
| oclc_num | 20168488 |
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| physical | Getr. Zählung |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Wiley |
| record_format | marc |
| series2 | A Wiley-Interscience Publication |
| spelling | Wilson, Robert G. Verfasser aut Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee New York u.a. Wiley 1989 Getr. Zählung txt rdacontent n rdamedia nc rdacarrier A Wiley-Interscience Publication Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Massenspektrometrie (DE-588)4037882-2 s 1\p DE-604 Stevie, Fred A. Verfasser aut Magee, Charles W. Verfasser aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Wilson, Robert G. Stevie, Fred A. Magee, Charles W. Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4037882-2 (DE-588)4077346-2 |
| title | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_auth | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_exact_search | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_full | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| title_fullStr | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| title_full_unstemmed | Secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis R. G. Wilson ; F. A. Stevie ; C. W. Magee |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry a practical handbook for depth profiling and bulk impurity analysis |
| title_sub | a practical handbook for depth profiling and bulk impurity analysis |
| topic | Secondary ion mass spectrometry Massenspektrometrie (DE-588)4037882-2 gnd Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Secondary ion mass spectrometry Massenspektrometrie Sekundärionen-Massenspektrometrie |
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