SEM microcharacterization of semiconductors:
Gespeichert in:
| Weitere Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London [u.a.]
Acad. Press
1989
|
| Schriftenreihe: | Techniques of physics
12 |
| Schlagworte: | |
| Beschreibung: | Literaturangaben |
| Beschreibung: | XIII, 452 S. Ill., graph. Darst. |
| ISBN: | 0123538556 |
Internformat
MARC
| LEADER | 00000nam a2200000 cb4500 | ||
|---|---|---|---|
| 001 | BV007682399 | ||
| 003 | DE-604 | ||
| 005 | 20160916 | ||
| 007 | t | ||
| 008 | 930421s1989 ad|| |||| 00||| eng d | ||
| 020 | |a 0123538556 |9 0-12-353855-6 | ||
| 035 | |a (OCoLC)246725687 | ||
| 035 | |a (DE-599)BVBBV007682399 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-355 |a DE-29T |a DE-706 |a DE-83 |a DE-11 | ||
| 084 | |a UH 6310 |0 (DE-625)159500: |2 rvk | ||
| 084 | |a UP 2800 |0 (DE-625)146366: |2 rvk | ||
| 084 | |a UP 7570 |0 (DE-625)146436: |2 rvk | ||
| 245 | 1 | 0 | |a SEM microcharacterization of semiconductors |c ed. by D. B. Holt ... |
| 264 | 1 | |a London [u.a.] |b Acad. Press |c 1989 | |
| 300 | |a XIII, 452 S. |b Ill., graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 1 | |a Techniques of physics |v 12 | |
| 500 | |a Literaturangaben | ||
| 650 | 0 | 7 | |a Halbleiteroberfläche |0 (DE-588)4137418-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Halbleiteroberfläche |0 (DE-588)4137418-6 |D s |
| 689 | 0 | 1 | |a Rasterelektronenmikroskopie |0 (DE-588)4048455-5 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Holt, David B. |4 edt | |
| 830 | 0 | |a Techniques of physics |v 12 |w (DE-604)BV001890126 |9 12 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-005040423 | ||
Datensatz im Suchindex
| _version_ | 1804122039927177216 |
|---|---|
| any_adam_object | |
| author2 | Holt, David B. |
| author2_role | edt |
| author2_variant | d b h db dbh |
| author_facet | Holt, David B. |
| building | Verbundindex |
| bvnumber | BV007682399 |
| classification_rvk | UH 6310 UP 2800 UP 7570 |
| ctrlnum | (OCoLC)246725687 (DE-599)BVBBV007682399 |
| discipline | Physik |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01329nam a2200385 cb4500</leader><controlfield tag="001">BV007682399</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">20160916 </controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930421s1989 ad|| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0123538556</subfield><subfield code="9">0-12-353855-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)246725687</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV007682399</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-355</subfield><subfield code="a">DE-29T</subfield><subfield code="a">DE-706</subfield><subfield code="a">DE-83</subfield><subfield code="a">DE-11</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UH 6310</subfield><subfield code="0">(DE-625)159500:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 2800</subfield><subfield code="0">(DE-625)146366:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UP 7570</subfield><subfield code="0">(DE-625)146436:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">SEM microcharacterization of semiconductors</subfield><subfield code="c">ed. by D. B. Holt ...</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">London [u.a.]</subfield><subfield code="b">Acad. Press</subfield><subfield code="c">1989</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIII, 452 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="1" ind2=" "><subfield code="a">Techniques of physics</subfield><subfield code="v">12</subfield></datafield><datafield tag="500" ind1=" " ind2=" "><subfield code="a">Literaturangaben</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Halbleiteroberfläche</subfield><subfield code="0">(DE-588)4137418-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Halbleiteroberfläche</subfield><subfield code="0">(DE-588)4137418-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Rasterelektronenmikroskopie</subfield><subfield code="0">(DE-588)4048455-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Holt, David B.</subfield><subfield code="4">edt</subfield></datafield><datafield tag="830" ind1=" " ind2="0"><subfield code="a">Techniques of physics</subfield><subfield code="v">12</subfield><subfield code="w">(DE-604)BV001890126</subfield><subfield code="9">12</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-005040423</subfield></datafield></record></collection> |
| id | DE-604.BV007682399 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:07:33Z |
| institution | BVB |
| isbn | 0123538556 |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-005040423 |
| oclc_num | 246725687 |
| open_access_boolean | |
| owner | DE-355 DE-BY-UBR DE-29T DE-706 DE-83 DE-11 |
| owner_facet | DE-355 DE-BY-UBR DE-29T DE-706 DE-83 DE-11 |
| physical | XIII, 452 S. Ill., graph. Darst. |
| publishDate | 1989 |
| publishDateSearch | 1989 |
| publishDateSort | 1989 |
| publisher | Acad. Press |
| record_format | marc |
| series | Techniques of physics |
| series2 | Techniques of physics |
| spelling | SEM microcharacterization of semiconductors ed. by D. B. Holt ... London [u.a.] Acad. Press 1989 XIII, 452 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Techniques of physics 12 Literaturangaben Halbleiteroberfläche (DE-588)4137418-6 gnd rswk-swf Rasterelektronenmikroskopie (DE-588)4048455-5 gnd rswk-swf Halbleiteroberfläche (DE-588)4137418-6 s Rasterelektronenmikroskopie (DE-588)4048455-5 s DE-604 Holt, David B. edt Techniques of physics 12 (DE-604)BV001890126 12 |
| spellingShingle | SEM microcharacterization of semiconductors Techniques of physics Halbleiteroberfläche (DE-588)4137418-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| subject_GND | (DE-588)4137418-6 (DE-588)4048455-5 |
| title | SEM microcharacterization of semiconductors |
| title_auth | SEM microcharacterization of semiconductors |
| title_exact_search | SEM microcharacterization of semiconductors |
| title_full | SEM microcharacterization of semiconductors ed. by D. B. Holt ... |
| title_fullStr | SEM microcharacterization of semiconductors ed. by D. B. Holt ... |
| title_full_unstemmed | SEM microcharacterization of semiconductors ed. by D. B. Holt ... |
| title_short | SEM microcharacterization of semiconductors |
| title_sort | sem microcharacterization of semiconductors |
| topic | Halbleiteroberfläche (DE-588)4137418-6 gnd Rasterelektronenmikroskopie (DE-588)4048455-5 gnd |
| topic_facet | Halbleiteroberfläche Rasterelektronenmikroskopie |
| volume_link | (DE-604)BV001890126 |
| work_keys_str_mv | AT holtdavidb semmicrocharacterizationofsemiconductors |