Untersuchung von Rekombinationsprozessen und "tiefen" Störstellen in Silizium:
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Bibliographic Details
Main Authors: Hangleiter, Andreas (Author), Conzelmann, Heinrich (Author)
Format: Book
Language:Undetermined
Published: Eggenstein-Leopoldshafen Fachinformationszentrum Energie, Physik, Mathematik 1985
Edition:Als Ms. gedr.
Subjects:
Item Description:Zsfassung in engl. Sprache. - PST: Investigation of recombination processes and deep impurities in silicon
Physical Description:105 S. graph. Darst.

There is no print copy available.

Interlibrary loan Place Request Caution: Not in THWS collection!