Accelerated testing handbook:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | Undetermined |
| Veröffentlicht: |
Portola Valley, Calif.
Technology Associates
1980
|
| Ausgabe: | Losebl.-Ausg. |
| Schlagworte: |
Internformat
MARC
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Datensatz im Suchindex
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| author | Peck, D. S. Trapp, O. D. |
| author_facet | Peck, D. S. Trapp, O. D. |
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| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| edition | Losebl.-Ausg. |
| format | Book |
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| indexdate | 2024-07-09T17:04:43Z |
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| language | Undetermined |
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| spelling | Peck, D. S. Verfasser aut Accelerated testing handbook D. S. Peck ; O. D. Trapp* Losebl.-Ausg. Portola Valley, Calif. Technology Associates 1980 txt rdacontent n rdamedia nc rdacarrier Halbleiter (DE-588)4022993-2 gnd rswk-swf Lebensdauertest gnd rswk-swf Halbleiter (DE-588)4022993-2 s Lebensdauertest f DE-604 Trapp, O. D. Verfasser aut |
| spellingShingle | Peck, D. S. Trapp, O. D. Accelerated testing handbook Halbleiter (DE-588)4022993-2 gnd |
| subject_GND | (DE-588)4022993-2 |
| title | Accelerated testing handbook |
| title_auth | Accelerated testing handbook |
| title_exact_search | Accelerated testing handbook |
| title_full | Accelerated testing handbook D. S. Peck ; O. D. Trapp* |
| title_fullStr | Accelerated testing handbook D. S. Peck ; O. D. Trapp* |
| title_full_unstemmed | Accelerated testing handbook D. S. Peck ; O. D. Trapp* |
| title_short | Accelerated testing handbook |
| title_sort | accelerated testing handbook |
| topic | Halbleiter (DE-588)4022993-2 gnd |
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