Defect analysis in electron microscopy:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
London
Chapman and Hall
1975
|
| Schlagworte: | |
| Beschreibung: | IX, 134 S. Ill. u. graph. Darst. |
Internformat
MARC
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| 100 | 1 | |a Loretto, Michael H. |e Verfasser |0 (DE-588)132011123 |4 aut | |
| 245 | 1 | 0 | |a Defect analysis in electron microscopy |c Michael H. Loretto ; Raymond Edward Smallman* |
| 264 | 1 | |a London |b Chapman and Hall |c 1975 | |
| 300 | |a IX, 134 S. |b Ill. u. graph. Darst. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 650 | 4 | |a Crystals |x Defects | |
| 650 | 4 | |a Electron microscopy | |
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Datensatz im Suchindex
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| author | Loretto, Michael H. Smallman, Raymond E. |
| author_GND | (DE-588)132011123 |
| author_facet | Loretto, Michael H. Smallman, Raymond E. |
| author_role | aut aut |
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| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 548 - Crystallography |
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| dewey-sort | 3548 281 |
| dewey-tens | 540 - Chemistry and allied sciences |
| discipline | Chemie / Pharmazie Physik |
| format | Book |
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| id | DE-604.BV007416027 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T17:01:47Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-004800689 |
| oclc_num | 1582682 |
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| owner | DE-355 DE-BY-UBR |
| owner_facet | DE-355 DE-BY-UBR |
| physical | IX, 134 S. Ill. u. graph. Darst. |
| publishDate | 1975 |
| publishDateSearch | 1975 |
| publishDateSort | 1975 |
| publisher | Chapman and Hall |
| record_format | marc |
| spelling | Loretto, Michael H. Verfasser (DE-588)132011123 aut Defect analysis in electron microscopy Michael H. Loretto ; Raymond Edward Smallman* London Chapman and Hall 1975 IX, 134 S. Ill. u. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Crystals Defects Electron microscopy Gitterbaufehler (DE-588)4125030-8 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 s DE-604 Gitterbaufehler (DE-588)4125030-8 s Smallman, Raymond E. Verfasser aut |
| spellingShingle | Loretto, Michael H. Smallman, Raymond E. Defect analysis in electron microscopy Crystals Defects Electron microscopy Gitterbaufehler (DE-588)4125030-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| subject_GND | (DE-588)4125030-8 (DE-588)4014327-2 |
| title | Defect analysis in electron microscopy |
| title_auth | Defect analysis in electron microscopy |
| title_exact_search | Defect analysis in electron microscopy |
| title_full | Defect analysis in electron microscopy Michael H. Loretto ; Raymond Edward Smallman* |
| title_fullStr | Defect analysis in electron microscopy Michael H. Loretto ; Raymond Edward Smallman* |
| title_full_unstemmed | Defect analysis in electron microscopy Michael H. Loretto ; Raymond Edward Smallman* |
| title_short | Defect analysis in electron microscopy |
| title_sort | defect analysis in electron microscopy |
| topic | Crystals Defects Electron microscopy Gitterbaufehler (DE-588)4125030-8 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd |
| topic_facet | Crystals Defects Electron microscopy Gitterbaufehler Elektronenmikroskopie |
| work_keys_str_mv | AT lorettomichaelh defectanalysisinelectronmicroscopy AT smallmanraymonde defectanalysisinelectronmicroscopy |