Imaging techniques for testing and inspection: Seminar-in-depth, February 1972, Los Angeles, Calif.
Gespeichert in:
| Format: | Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Redondo Beach, Calif.
S.P.I.E.
1973
|
| Ausgabe: | Repr. |
| Schriftenreihe: | Society of Photo-optical Instrumentation Engineers: Proceedings.
Vol. 29. |
| Schlagworte: | |
| Beschreibung: | VIII,148 S.m.Abb. |
Internformat
MARC
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Datensatz im Suchindex
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| discipline | Physik |
| edition | Repr. |
| format | Book |
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| indexdate | 2024-07-09T16:59:07Z |
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| physical | VIII,148 S.m.Abb. |
| publishDate | 1973 |
| publishDateSearch | 1973 |
| publishDateSort | 1973 |
| publisher | S.P.I.E. |
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| series | Society of Photo-optical Instrumentation Engineers: Proceedings. |
| series2 | Society of Photo-optical Instrumentation Engineers: Proceedings. |
| spelling | Imaging techniques for testing and inspection Seminar-in-depth, February 1972, Los Angeles, Calif. Hrsg. von John C. Urbach* Repr. Redondo Beach, Calif. S.P.I.E. 1973 VIII,148 S.m.Abb. txt rdacontent n rdamedia nc rdacarrier Society of Photo-optical Instrumentation Engineers: Proceedings. Vol. 29. Elektronenbeugung (DE-588)4151862-7 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Elektronenbeugung (DE-588)4151862-7 s DE-604 Urbach, John C. Sonstige oth Society of Photo-optical Instrumentation Engineers: Proceedings. Vol. 29. (DE-604)BV000010887 29 |
| spellingShingle | Imaging techniques for testing and inspection Seminar-in-depth, February 1972, Los Angeles, Calif. Society of Photo-optical Instrumentation Engineers: Proceedings. Elektronenbeugung (DE-588)4151862-7 gnd |
| subject_GND | (DE-588)4151862-7 (DE-588)1071861417 |
| title | Imaging techniques for testing and inspection Seminar-in-depth, February 1972, Los Angeles, Calif. |
| title_auth | Imaging techniques for testing and inspection Seminar-in-depth, February 1972, Los Angeles, Calif. |
| title_exact_search | Imaging techniques for testing and inspection Seminar-in-depth, February 1972, Los Angeles, Calif. |
| title_full | Imaging techniques for testing and inspection Seminar-in-depth, February 1972, Los Angeles, Calif. Hrsg. von John C. Urbach* |
| title_fullStr | Imaging techniques for testing and inspection Seminar-in-depth, February 1972, Los Angeles, Calif. Hrsg. von John C. Urbach* |
| title_full_unstemmed | Imaging techniques for testing and inspection Seminar-in-depth, February 1972, Los Angeles, Calif. Hrsg. von John C. Urbach* |
| title_short | Imaging techniques for testing and inspection |
| title_sort | imaging techniques for testing and inspection seminar in depth february 1972 los angeles calif |
| title_sub | Seminar-in-depth, February 1972, Los Angeles, Calif. |
| topic | Elektronenbeugung (DE-588)4151862-7 gnd |
| topic_facet | Elektronenbeugung Konferenzschrift |
| volume_link | (DE-604)BV000010887 |
| work_keys_str_mv | AT urbachjohnc imagingtechniquesfortestingandinspectionseminarindepthfebruary1972losangelescalif |