Characterization of semiconductor materials:
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York [u.a.]
McGraw-Hill
1970
|
| Schriftenreihe: | Texas instruments electronics series
|
| Schlagworte: | |
| Beschreibung: | XVI, 351 S. Ill., graph. Darst. |
Internformat
MARC
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| 100 | 1 | |a Kane, Philip F. |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Characterization of semiconductor materials |c Philip F. Kane ; Graydon B. Larrabee |
| 264 | 1 | |a New York [u.a.] |b McGraw-Hill |c 1970 | |
| 300 | |a XVI, 351 S. |b Ill., graph. Darst. | ||
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| 490 | 0 | |a Texas instruments electronics series | |
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Datensatz im Suchindex
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|---|---|
| any_adam_object | |
| author | Kane, Philip F. Larrabee, Graydon B. |
| author_facet | Kane, Philip F. Larrabee, Graydon B. |
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| author_sort | Kane, Philip F. |
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| callnumber-subject | QC - Physics |
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| dewey-full | 537.6/22 |
| dewey-hundreds | 500 - Natural sciences and mathematics |
| dewey-ones | 537 - Electricity and electronics |
| dewey-raw | 537.6/22 |
| dewey-search | 537.6/22 |
| dewey-sort | 3537.6 222 |
| dewey-tens | 530 - Physics |
| discipline | Physik |
| format | Book |
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| id | DE-604.BV007170733 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:56:55Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-004581389 |
| oclc_num | 52919 |
| open_access_boolean | |
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| physical | XVI, 351 S. Ill., graph. Darst. |
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| publishDate | 1970 |
| publishDateSearch | 1970 |
| publishDateSort | 1970 |
| publisher | McGraw-Hill |
| record_format | marc |
| series2 | Texas instruments electronics series |
| spelling | Kane, Philip F. Verfasser aut Characterization of semiconductor materials Philip F. Kane ; Graydon B. Larrabee New York [u.a.] McGraw-Hill 1970 XVI, 351 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Texas instruments electronics series Halfgeleiders gtt Materiaalkunde gtt Semiconductors Halbleiterwerkstoff (DE-588)4158817-4 gnd rswk-swf Halbleiterwerkstoff (DE-588)4158817-4 s DE-604 Larrabee, Graydon B. Verfasser aut |
| spellingShingle | Kane, Philip F. Larrabee, Graydon B. Characterization of semiconductor materials Halfgeleiders gtt Materiaalkunde gtt Semiconductors Halbleiterwerkstoff (DE-588)4158817-4 gnd |
| subject_GND | (DE-588)4158817-4 |
| title | Characterization of semiconductor materials |
| title_auth | Characterization of semiconductor materials |
| title_exact_search | Characterization of semiconductor materials |
| title_full | Characterization of semiconductor materials Philip F. Kane ; Graydon B. Larrabee |
| title_fullStr | Characterization of semiconductor materials Philip F. Kane ; Graydon B. Larrabee |
| title_full_unstemmed | Characterization of semiconductor materials Philip F. Kane ; Graydon B. Larrabee |
| title_short | Characterization of semiconductor materials |
| title_sort | characterization of semiconductor materials |
| topic | Halfgeleiders gtt Materiaalkunde gtt Semiconductors Halbleiterwerkstoff (DE-588)4158817-4 gnd |
| topic_facet | Halfgeleiders Materiaalkunde Semiconductors Halbleiterwerkstoff |
| work_keys_str_mv | AT kanephilipf characterizationofsemiconductormaterials AT larrabeegraydonb characterizationofsemiconductormaterials |