Transmission electron microscopy of metals:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
New York
Wiley
1964
|
| Ausgabe: | 2.print. |
| Schriftenreihe: | Wiley series on the science and technology of materials.
|
| Schlagworte: | |
| Beschreibung: | XIV,299 S.m.Abb. |
Internformat
MARC
| LEADER | 00000nam a2200000 c 4500 | ||
|---|---|---|---|
| 001 | BV007091258 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 930421s1964 |||| 00||| eng d | ||
| 035 | |a (OCoLC)248623786 | ||
| 035 | |a (DE-599)BVBBV007091258 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | 0 | |a eng | |
| 049 | |a DE-29T | ||
| 084 | |a UQ 5500 |0 (DE-625)146526: |2 rvk | ||
| 100 | 1 | |a Thomas, Gareth |e Verfasser |4 aut | |
| 245 | 1 | 0 | |a Transmission electron microscopy of metals |
| 250 | |a 2.print. | ||
| 264 | 1 | |a New York |b Wiley |c 1964 | |
| 300 | |a XIV,299 S.m.Abb. | ||
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Wiley series on the science and technology of materials. | |
| 650 | 0 | 7 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Werkstoffprüfung |0 (DE-588)4037934-6 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Festigkeit |0 (DE-588)4016916-9 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Metall |0 (DE-588)4038860-8 |2 gnd |9 rswk-swf |
| 650 | 0 | 7 | |a Kristall |0 (DE-588)4033209-3 |2 gnd |9 rswk-swf |
| 689 | 0 | 0 | |a Durchstrahlungselektronenmikroskopie |0 (DE-588)4215608-7 |D s |
| 689 | 0 | 1 | |a Metall |0 (DE-588)4038860-8 |D s |
| 689 | 0 | 2 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 0 | 3 | |a Werkstoffprüfung |0 (DE-588)4037934-6 |D s |
| 689 | 0 | |8 1\p |5 DE-604 | |
| 689 | 1 | 0 | |a Kristall |0 (DE-588)4033209-3 |D s |
| 689 | 1 | 1 | |a Festigkeit |0 (DE-588)4016916-9 |D s |
| 689 | 1 | 2 | |a Elektronenmikroskopie |0 (DE-588)4014327-2 |D s |
| 689 | 1 | |8 2\p |5 DE-604 | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-004511199 | ||
| 883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
| 883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
Datensatz im Suchindex
| _version_ | 1804121273323749376 |
|---|---|
| any_adam_object | |
| author | Thomas, Gareth |
| author_facet | Thomas, Gareth |
| author_role | aut |
| author_sort | Thomas, Gareth |
| author_variant | g t gt |
| building | Verbundindex |
| bvnumber | BV007091258 |
| classification_rvk | UQ 5500 |
| ctrlnum | (OCoLC)248623786 (DE-599)BVBBV007091258 |
| discipline | Physik |
| edition | 2.print. |
| format | Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01805nam a2200481 c 4500</leader><controlfield tag="001">BV007091258</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930421s1964 |||| 00||| eng d</controlfield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)248623786</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV007091258</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-29T</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">UQ 5500</subfield><subfield code="0">(DE-625)146526:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Thomas, Gareth</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Transmission electron microscopy of metals</subfield></datafield><datafield tag="250" ind1=" " ind2=" "><subfield code="a">2.print.</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Wiley</subfield><subfield code="c">1964</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">XIV,299 S.m.Abb.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Wiley series on the science and technology of materials.</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Festigkeit</subfield><subfield code="0">(DE-588)4016916-9</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Metall</subfield><subfield code="0">(DE-588)4038860-8</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Kristall</subfield><subfield code="0">(DE-588)4033209-3</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Durchstrahlungselektronenmikroskopie</subfield><subfield code="0">(DE-588)4215608-7</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="1"><subfield code="a">Metall</subfield><subfield code="0">(DE-588)4038860-8</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="2"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2="3"><subfield code="a">Werkstoffprüfung</subfield><subfield code="0">(DE-588)4037934-6</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Kristall</subfield><subfield code="0">(DE-588)4033209-3</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="1"><subfield code="a">Festigkeit</subfield><subfield code="0">(DE-588)4016916-9</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2="2"><subfield code="a">Elektronenmikroskopie</subfield><subfield code="0">(DE-588)4014327-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-004511199</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
| id | DE-604.BV007091258 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T16:55:22Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-004511199 |
| oclc_num | 248623786 |
| open_access_boolean | |
| owner | DE-29T |
| owner_facet | DE-29T |
| physical | XIV,299 S.m.Abb. |
| publishDate | 1964 |
| publishDateSearch | 1964 |
| publishDateSort | 1964 |
| publisher | Wiley |
| record_format | marc |
| series2 | Wiley series on the science and technology of materials. |
| spelling | Thomas, Gareth Verfasser aut Transmission electron microscopy of metals 2.print. New York Wiley 1964 XIV,299 S.m.Abb. txt rdacontent n rdamedia nc rdacarrier Wiley series on the science and technology of materials. Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd rswk-swf Werkstoffprüfung (DE-588)4037934-6 gnd rswk-swf Elektronenmikroskopie (DE-588)4014327-2 gnd rswk-swf Festigkeit (DE-588)4016916-9 gnd rswk-swf Metall (DE-588)4038860-8 gnd rswk-swf Kristall (DE-588)4033209-3 gnd rswk-swf Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 s Metall (DE-588)4038860-8 s Elektronenmikroskopie (DE-588)4014327-2 s Werkstoffprüfung (DE-588)4037934-6 s 1\p DE-604 Kristall (DE-588)4033209-3 s Festigkeit (DE-588)4016916-9 s 2\p DE-604 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
| spellingShingle | Thomas, Gareth Transmission electron microscopy of metals Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Festigkeit (DE-588)4016916-9 gnd Metall (DE-588)4038860-8 gnd Kristall (DE-588)4033209-3 gnd |
| subject_GND | (DE-588)4215608-7 (DE-588)4037934-6 (DE-588)4014327-2 (DE-588)4016916-9 (DE-588)4038860-8 (DE-588)4033209-3 |
| title | Transmission electron microscopy of metals |
| title_auth | Transmission electron microscopy of metals |
| title_exact_search | Transmission electron microscopy of metals |
| title_full | Transmission electron microscopy of metals |
| title_fullStr | Transmission electron microscopy of metals |
| title_full_unstemmed | Transmission electron microscopy of metals |
| title_short | Transmission electron microscopy of metals |
| title_sort | transmission electron microscopy of metals |
| topic | Durchstrahlungselektronenmikroskopie (DE-588)4215608-7 gnd Werkstoffprüfung (DE-588)4037934-6 gnd Elektronenmikroskopie (DE-588)4014327-2 gnd Festigkeit (DE-588)4016916-9 gnd Metall (DE-588)4038860-8 gnd Kristall (DE-588)4033209-3 gnd |
| topic_facet | Durchstrahlungselektronenmikroskopie Werkstoffprüfung Elektronenmikroskopie Festigkeit Metall Kristall |
| work_keys_str_mv | AT thomasgareth transmissionelectronmicroscopyofmetals |