Secondary ion mass spectrometry: proceedings of the ... internat. conference
Saved in:
| Format: | Conference Proceeding Book |
|---|---|
| Language: | Undetermined |
| Published: |
Berlin u.a.
Springer
|
| Series: | Springer series in chemical physics
... |
| Subjects: | |
| ISBN: | 3540098437 354011372X 354013316X |
Staff View
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Record in the Search Index
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| format | Conference Proceeding Book |
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| spelling | Secondary ion mass spectrometry proceedings of the ... internat. conference Urheber: SIMS. Hrsg. von Alfred Benninghoven* SIMS Berlin u.a. Springer txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics ... Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Benninghoven, Alfred Sonstige oth SIMS Sonstige (DE-588)244977-8 oth |
| spellingShingle | Secondary ion mass spectrometry proceedings of the ... internat. conference Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)1071861417 |
| title | Secondary ion mass spectrometry proceedings of the ... internat. conference |
| title_alt | SIMS |
| title_auth | Secondary ion mass spectrometry proceedings of the ... internat. conference |
| title_exact_search | Secondary ion mass spectrometry proceedings of the ... internat. conference |
| title_full | Secondary ion mass spectrometry proceedings of the ... internat. conference Urheber: SIMS. Hrsg. von Alfred Benninghoven* |
| title_fullStr | Secondary ion mass spectrometry proceedings of the ... internat. conference Urheber: SIMS. Hrsg. von Alfred Benninghoven* |
| title_full_unstemmed | Secondary ion mass spectrometry proceedings of the ... internat. conference Urheber: SIMS. Hrsg. von Alfred Benninghoven* |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry proceedings of the internat conference |
| title_sub | proceedings of the ... internat. conference |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Konferenzschrift |
| work_keys_str_mv | AT benninghovenalfred secondaryionmassspectrometryproceedingsoftheinternatconference AT sims secondaryionmassspectrometryproceedingsoftheinternatconference AT benninghovenalfred sims AT sims sims |