Secondary ion mass spectrometry: proceedings of the ... internat. conference
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Berlin u.a.
Springer
|
| Schriftenreihe: | Springer series in chemical physics
... |
| Schlagworte: | |
| ISBN: | 3540098437 354011372X 354013316X |
Internformat
MARC
| LEADER | 00000nam a2200000 ca4500 | ||
|---|---|---|---|
| 001 | BV006887257 | ||
| 003 | DE-604 | ||
| 005 | 00000000000000.0 | ||
| 007 | t | ||
| 008 | 930405nuuuuuuuu |||| 10||| und d | ||
| 020 | |a 3540098437 |9 3-540-09843-7 | ||
| 020 | |a 354011372X |9 3-540-11372-X | ||
| 020 | |a 354013316X |9 3-540-13316-X | ||
| 035 | |a (DE-599)BVBBV006887257 | ||
| 040 | |a DE-604 |b ger |e rakddb | ||
| 041 | |a und | ||
| 084 | |a VG 9808 |0 (DE-625)147244:261 |2 rvk | ||
| 245 | 1 | 0 | |a Secondary ion mass spectrometry |b proceedings of the ... internat. conference |c Urheber: SIMS. Hrsg. von Alfred Benninghoven* |
| 246 | 1 | 3 | |a SIMS |
| 264 | 1 | |a Berlin u.a. |b Springer | |
| 336 | |b txt |2 rdacontent | ||
| 337 | |b n |2 rdamedia | ||
| 338 | |b nc |2 rdacarrier | ||
| 490 | 0 | |a Springer series in chemical physics |v ... | |
| 650 | 0 | 7 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |2 gnd |9 rswk-swf |
| 655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
| 689 | 0 | 0 | |a Sekundärionen-Massenspektrometrie |0 (DE-588)4077346-2 |D s |
| 689 | 0 | |5 DE-604 | |
| 700 | 1 | |a Benninghoven, Alfred |e Sonstige |4 oth | |
| 711 | 2 | |a SIMS |j Sonstige |0 (DE-588)244977-8 |4 oth | |
| 999 | |a oai:aleph.bib-bvb.de:BVB01-012404413 | ||
Datensatz im Suchindex
| _version_ | 1804132284426616832 |
|---|---|
| any_adam_object | |
| building | Verbundindex |
| bvnumber | BV006887257 |
| classification_rvk | VG 9808 |
| ctrlnum | (DE-599)BVBBV006887257 |
| discipline | Chemie / Pharmazie |
| format | Conference Proceeding Book |
| fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01188nam a2200337 ca4500</leader><controlfield tag="001">BV006887257</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930405nuuuuuuuu |||| 10||| und d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">3540098437</subfield><subfield code="9">3-540-09843-7</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">354011372X</subfield><subfield code="9">3-540-11372-X</subfield></datafield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">354013316X</subfield><subfield code="9">3-540-13316-X</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV006887257</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1=" " ind2=" "><subfield code="a">und</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">VG 9808</subfield><subfield code="0">(DE-625)147244:261</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Secondary ion mass spectrometry</subfield><subfield code="b">proceedings of the ... internat. conference</subfield><subfield code="c">Urheber: SIMS. Hrsg. von Alfred Benninghoven*</subfield></datafield><datafield tag="246" ind1="1" ind2="3"><subfield code="a">SIMS</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Berlin u.a.</subfield><subfield code="b">Springer</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Springer series in chemical physics</subfield><subfield code="v">...</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Sekundärionen-Massenspektrometrie</subfield><subfield code="0">(DE-588)4077346-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Benninghoven, Alfred</subfield><subfield code="e">Sonstige</subfield><subfield code="4">oth</subfield></datafield><datafield tag="711" ind1="2" ind2=" "><subfield code="a">SIMS</subfield><subfield code="j">Sonstige</subfield><subfield code="0">(DE-588)244977-8</subfield><subfield code="4">oth</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-012404413</subfield></datafield></record></collection> |
| genre | (DE-588)1071861417 Konferenzschrift gnd-content |
| genre_facet | Konferenzschrift |
| id | DE-604.BV006887257 |
| illustrated | Not Illustrated |
| indexdate | 2024-07-09T19:50:23Z |
| institution | BVB |
| institution_GND | (DE-588)244977-8 |
| isbn | 3540098437 354011372X 354013316X |
| language | Undetermined |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-012404413 |
| open_access_boolean | |
| publishDateSort | 0000 |
| publisher | Springer |
| record_format | marc |
| series2 | Springer series in chemical physics |
| spelling | Secondary ion mass spectrometry proceedings of the ... internat. conference Urheber: SIMS. Hrsg. von Alfred Benninghoven* SIMS Berlin u.a. Springer txt rdacontent n rdamedia nc rdacarrier Springer series in chemical physics ... Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd rswk-swf (DE-588)1071861417 Konferenzschrift gnd-content Sekundärionen-Massenspektrometrie (DE-588)4077346-2 s DE-604 Benninghoven, Alfred Sonstige oth SIMS Sonstige (DE-588)244977-8 oth |
| spellingShingle | Secondary ion mass spectrometry proceedings of the ... internat. conference Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| subject_GND | (DE-588)4077346-2 (DE-588)1071861417 |
| title | Secondary ion mass spectrometry proceedings of the ... internat. conference |
| title_alt | SIMS |
| title_auth | Secondary ion mass spectrometry proceedings of the ... internat. conference |
| title_exact_search | Secondary ion mass spectrometry proceedings of the ... internat. conference |
| title_full | Secondary ion mass spectrometry proceedings of the ... internat. conference Urheber: SIMS. Hrsg. von Alfred Benninghoven* |
| title_fullStr | Secondary ion mass spectrometry proceedings of the ... internat. conference Urheber: SIMS. Hrsg. von Alfred Benninghoven* |
| title_full_unstemmed | Secondary ion mass spectrometry proceedings of the ... internat. conference Urheber: SIMS. Hrsg. von Alfred Benninghoven* |
| title_short | Secondary ion mass spectrometry |
| title_sort | secondary ion mass spectrometry proceedings of the internat conference |
| title_sub | proceedings of the ... internat. conference |
| topic | Sekundärionen-Massenspektrometrie (DE-588)4077346-2 gnd |
| topic_facet | Sekundärionen-Massenspektrometrie Konferenzschrift |
| work_keys_str_mv | AT benninghovenalfred secondaryionmassspectrometryproceedingsoftheinternatconference AT sims secondaryionmassspectrometryproceedingsoftheinternatconference AT benninghovenalfred sims AT sims sims |