A contribution to the generation of tests for digital circuits described by their behavior:
Gespeichert in:
| 1. Verfasser: | |
|---|---|
| Format: | Buch |
| Sprache: | English |
| Veröffentlicht: |
1992
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| Schlagworte: | |
| Beschreibung: | Duisburg, Univ., Diss., 1992 |
| Beschreibung: | V, 105 S. graph. Darst. |
Internformat
MARC
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Datensatz im Suchindex
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| author | Veit, Holger Hans |
| author_facet | Veit, Holger Hans |
| author_role | aut |
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| building | Verbundindex |
| bvnumber | BV006708539 |
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| ctrlnum | (OCoLC)46143648 (DE-599)BVBBV006708539 |
| discipline | Elektrotechnik |
| format | Book |
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| genre_facet | Hochschulschrift |
| id | DE-604.BV006708539 |
| illustrated | Illustrated |
| indexdate | 2024-07-09T16:50:12Z |
| institution | BVB |
| language | English |
| oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-004264103 |
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| physical | V, 105 S. graph. Darst. |
| publishDate | 1992 |
| publishDateSearch | 1992 |
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| spelling | Veit, Holger Hans Verfasser aut A contribution to the generation of tests for digital circuits described by their behavior von Holger Hans Veit 1992 V, 105 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Duisburg, Univ., Diss., 1992 Testmustergenerierung (DE-588)4234817-1 gnd rswk-swf (DE-588)4113937-9 Hochschulschrift gnd-content Testmustergenerierung (DE-588)4234817-1 s DE-604 |
| spellingShingle | Veit, Holger Hans A contribution to the generation of tests for digital circuits described by their behavior Testmustergenerierung (DE-588)4234817-1 gnd |
| subject_GND | (DE-588)4234817-1 (DE-588)4113937-9 |
| title | A contribution to the generation of tests for digital circuits described by their behavior |
| title_auth | A contribution to the generation of tests for digital circuits described by their behavior |
| title_exact_search | A contribution to the generation of tests for digital circuits described by their behavior |
| title_full | A contribution to the generation of tests for digital circuits described by their behavior von Holger Hans Veit |
| title_fullStr | A contribution to the generation of tests for digital circuits described by their behavior von Holger Hans Veit |
| title_full_unstemmed | A contribution to the generation of tests for digital circuits described by their behavior von Holger Hans Veit |
| title_short | A contribution to the generation of tests for digital circuits described by their behavior |
| title_sort | a contribution to the generation of tests for digital circuits described by their behavior |
| topic | Testmustergenerierung (DE-588)4234817-1 gnd |
| topic_facet | Testmustergenerierung Hochschulschrift |
| work_keys_str_mv | AT veitholgerhans acontributiontothegenerationoftestsfordigitalcircuitsdescribedbytheirbehavior |