1984 Academic Forum for Test Technology: October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis
Saved in:
| Corporate Author: | |
|---|---|
| Format: | Conference Proceeding Book |
| Language: | English |
| Published: |
Silver Spring, Md.
IEEE Computer Soc. Pr.
1984
|
| Subjects: | |
| Physical Description: | VIII, 65 S. Ill., graph. Darst. |
| ISBN: | 0818606096 |
Staff View
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Record in the Search Index
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| author_corporate | Academic Forum for Test Technology Minneapolis, Minn |
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| classification_rvk | SS 1984 |
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| dewey-tens | 620 - Engineering and allied operations |
| discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
| format | Conference Proceeding Book |
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| isbn | 0818606096 |
| language | English |
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| physical | VIII, 65 S. Ill., graph. Darst. |
| publishDate | 1984 |
| publishDateSearch | 1984 |
| publishDateSort | 1984 |
| publisher | IEEE Computer Soc. Pr. |
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| spelling | Academic Forum for Test Technology 1984 Minneapolis, Minn. Verfasser (DE-588)10052989-6 aut 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis Silver Spring, Md. IEEE Computer Soc. Pr. 1984 VIII, 65 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Automatic test equipment Integrated circuits Testing Congresses Semiconductors Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
| spellingShingle | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis Automatic test equipment Integrated circuits Testing Congresses Semiconductors Testing Congresses |
| subject_GND | (DE-588)1071861417 |
| title | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
| title_auth | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
| title_exact_search | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
| title_full | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
| title_fullStr | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
| title_full_unstemmed | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
| title_short | 1984 Academic Forum for Test Technology |
| title_sort | 1984 academic forum for test technology october 19 1984 center for microelectronic and information sciences university of minnesota minneapolis |
| title_sub | October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
| topic | Automatic test equipment Integrated circuits Testing Congresses Semiconductors Testing Congresses |
| topic_facet | Automatic test equipment Integrated circuits Testing Congresses Semiconductors Testing Congresses Konferenzschrift |
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