1984 Academic Forum for Test Technology: October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis
Gespeichert in:
Körperschaft: | |
---|---|
Format: | Tagungsbericht Buch |
Sprache: | English |
Veröffentlicht: |
Silver Spring, Md.
IEEE Computer Soc. Pr.
1984
|
Schlagworte: | |
Beschreibung: | VIII, 65 S. Ill., graph. Darst. |
ISBN: | 0818606096 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV006551603 | ||
003 | DE-604 | ||
005 | 19960715 | ||
007 | t| | ||
008 | 930210s1984 xx ad|| |||| 10||| eng d | ||
020 | |a 0818606096 |9 0-8186-0609-6 | ||
035 | |a (OCoLC)16579269 | ||
035 | |a (DE-599)BVBBV006551603 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-739 | ||
050 | 0 | |a TK7874 | |
082 | 0 | |a 621.381/73 |2 19 | |
111 | 2 | |a Academic Forum for Test Technology |d 1984 |c Minneapolis, Minn. |j Verfasser |0 (DE-588)10052989-6 |4 aut | |
245 | 1 | 0 | |a 1984 Academic Forum for Test Technology |b October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
264 | 1 | |a Silver Spring, Md. |b IEEE Computer Soc. Pr. |c 1984 | |
300 | |a VIII, 65 S. |b Ill., graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
650 | 4 | |a Automatic test equipment | |
650 | 4 | |a Integrated circuits |x Testing |v Congresses | |
650 | 4 | |a Semiconductors |x Testing |v Congresses | |
655 | 7 | |0 (DE-588)1071861417 |a Konferenzschrift |2 gnd-content | |
943 | 1 | |a oai:aleph.bib-bvb.de:BVB01-004177007 |
Datensatz im Suchindex
_version_ | 1820875974214942720 |
---|---|
adam_text | |
any_adam_object | |
author_corporate | Academic Forum for Test Technology Minneapolis, Minn |
author_corporate_role | aut |
author_facet | Academic Forum for Test Technology Minneapolis, Minn |
author_sort | Academic Forum for Test Technology Minneapolis, Minn |
building | Verbundindex |
bvnumber | BV006551603 |
callnumber-first | T - Technology |
callnumber-label | TK7874 |
callnumber-raw | TK7874 |
callnumber-search | TK7874 |
callnumber-sort | TK 47874 |
callnumber-subject | TK - Electrical and Nuclear Engineering |
classification_rvk | SS 1984 |
ctrlnum | (OCoLC)16579269 (DE-599)BVBBV006551603 |
dewey-full | 621.381/73 |
dewey-hundreds | 600 - Technology (Applied sciences) |
dewey-ones | 621 - Applied physics |
dewey-raw | 621.381/73 |
dewey-search | 621.381/73 |
dewey-sort | 3621.381 273 |
dewey-tens | 620 - Engineering and allied operations |
discipline | Elektrotechnik / Elektronik / Nachrichtentechnik |
format | Conference Proceeding Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>00000nam a2200000 c 4500</leader><controlfield tag="001">BV006551603</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">19960715</controlfield><controlfield tag="007">t|</controlfield><controlfield tag="008">930210s1984 xx ad|| |||| 10||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0818606096</subfield><subfield code="9">0-8186-0609-6</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)16579269</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV006551603</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-739</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">TK7874</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">621.381/73</subfield><subfield code="2">19</subfield></datafield><datafield tag="111" ind1="2" ind2=" "><subfield code="a">Academic Forum for Test Technology</subfield><subfield code="d">1984</subfield><subfield code="c">Minneapolis, Minn.</subfield><subfield code="j">Verfasser</subfield><subfield code="0">(DE-588)10052989-6</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">1984 Academic Forum for Test Technology</subfield><subfield code="b">October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">Silver Spring, Md.</subfield><subfield code="b">IEEE Computer Soc. Pr.</subfield><subfield code="c">1984</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VIII, 65 S.</subfield><subfield code="b">Ill., graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Automatic test equipment</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Integrated circuits</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Semiconductors</subfield><subfield code="x">Testing</subfield><subfield code="v">Congresses</subfield></datafield><datafield tag="655" ind1=" " ind2="7"><subfield code="0">(DE-588)1071861417</subfield><subfield code="a">Konferenzschrift</subfield><subfield code="2">gnd-content</subfield></datafield><datafield tag="943" ind1="1" ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-004177007</subfield></datafield></record></collection> |
genre | (DE-588)1071861417 Konferenzschrift gnd-content |
genre_facet | Konferenzschrift |
id | DE-604.BV006551603 |
illustrated | Illustrated |
indexdate | 2025-01-10T15:24:09Z |
institution | BVB |
institution_GND | (DE-588)10052989-6 |
isbn | 0818606096 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-004177007 |
oclc_num | 16579269 |
open_access_boolean | |
owner | DE-739 |
owner_facet | DE-739 |
physical | VIII, 65 S. Ill., graph. Darst. |
publishDate | 1984 |
publishDateSearch | 1984 |
publishDateSort | 1984 |
publisher | IEEE Computer Soc. Pr. |
record_format | marc |
spelling | Academic Forum for Test Technology 1984 Minneapolis, Minn. Verfasser (DE-588)10052989-6 aut 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis Silver Spring, Md. IEEE Computer Soc. Pr. 1984 VIII, 65 S. Ill., graph. Darst. txt rdacontent n rdamedia nc rdacarrier Automatic test equipment Integrated circuits Testing Congresses Semiconductors Testing Congresses (DE-588)1071861417 Konferenzschrift gnd-content |
spellingShingle | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis Automatic test equipment Integrated circuits Testing Congresses Semiconductors Testing Congresses |
subject_GND | (DE-588)1071861417 |
title | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
title_auth | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
title_exact_search | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
title_full | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
title_fullStr | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
title_full_unstemmed | 1984 Academic Forum for Test Technology October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
title_short | 1984 Academic Forum for Test Technology |
title_sort | 1984 academic forum for test technology october 19 1984 center for microelectronic and information sciences university of minnesota minneapolis |
title_sub | October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis |
topic | Automatic test equipment Integrated circuits Testing Congresses Semiconductors Testing Congresses |
topic_facet | Automatic test equipment Integrated circuits Testing Congresses Semiconductors Testing Congresses Konferenzschrift |
work_keys_str_mv | AT academicforumfortesttechnologyminneapolisminn 1984academicforumfortesttechnologyoctober191984centerformicroelectronicandinformationsciencesuniversityofminnesotaminneapolis |