Life testing and reliability estimation:
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Buch |
Sprache: | English |
Veröffentlicht: |
New York
Wiley
1980
|
Schriftenreihe: | Halsted press book.
|
Schlagworte: | |
Beschreibung: | VI, 196 S. graph. Darst. |
ISBN: | 0470269111 |
Internformat
MARC
LEADER | 00000nam a2200000 c 4500 | ||
---|---|---|---|
001 | BV006480081 | ||
003 | DE-604 | ||
005 | 00000000000000.0 | ||
007 | t | ||
008 | 930210s1980 d||| |||| 00||| eng d | ||
020 | |a 0470269111 |9 0-470-26911-1 | ||
035 | |a (OCoLC)636291421 | ||
035 | |a (DE-599)BVBBV006480081 | ||
040 | |a DE-604 |b ger |e rakddb | ||
041 | 0 | |a eng | |
049 | |a DE-739 |a DE-188 | ||
050 | 0 | |a QA276 | |
082 | 0 | |a 519.5 | |
084 | |a QH 233 |0 (DE-625)141548: |2 rvk | ||
100 | 1 | |a Sinha, Snehesh K. |e Verfasser |4 aut | |
245 | 1 | 0 | |a Life testing and reliability estimation |c Snehesh K. Sinha ; Balvant K. Kale* |
264 | 1 | |a New York |b Wiley |c 1980 | |
300 | |a VI, 196 S. |b graph. Darst. | ||
336 | |b txt |2 rdacontent | ||
337 | |b n |2 rdamedia | ||
338 | |b nc |2 rdacarrier | ||
490 | 0 | |a Halsted press book. | |
650 | 4 | |a Fiabilité | |
650 | 4 | |a Temps entre défaillances, Analyse des | |
650 | 4 | |a Accelerated life testing | |
650 | 4 | |a Failure time data analysis | |
650 | 4 | |a Reliability (Engineering) | |
650 | 0 | 7 | |a Statistik |0 (DE-588)4056995-0 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Ingenieurwissenschaften |0 (DE-588)4137304-2 |2 gnd |9 rswk-swf |
650 | 0 | 7 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |2 gnd |9 rswk-swf |
689 | 0 | 0 | |a Ingenieurwissenschaften |0 (DE-588)4137304-2 |D s |
689 | 0 | |8 1\p |5 DE-604 | |
689 | 1 | 0 | |a Zuverlässigkeit |0 (DE-588)4059245-5 |D s |
689 | 1 | |8 2\p |5 DE-604 | |
689 | 2 | 0 | |a Statistik |0 (DE-588)4056995-0 |D s |
689 | 2 | |8 3\p |5 DE-604 | |
700 | 1 | |a Kale, Balvant Keshav |d 1933- |e Verfasser |0 (DE-588)120614928 |4 aut | |
940 | 1 | |q TUB-nvmb | |
999 | |a oai:aleph.bib-bvb.de:BVB01-004117390 | ||
883 | 1 | |8 1\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 2\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk | |
883 | 1 | |8 3\p |a cgwrk |d 20201028 |q DE-101 |u https://d-nb.info/provenance/plan#cgwrk |
Datensatz im Suchindex
_version_ | 1804120739084763136 |
---|---|
any_adam_object | |
author | Sinha, Snehesh K. Kale, Balvant Keshav 1933- |
author_GND | (DE-588)120614928 |
author_facet | Sinha, Snehesh K. Kale, Balvant Keshav 1933- |
author_role | aut aut |
author_sort | Sinha, Snehesh K. |
author_variant | s k s sk sks b k k bk bkk |
building | Verbundindex |
bvnumber | BV006480081 |
callnumber-first | Q - Science |
callnumber-label | QA276 |
callnumber-raw | QA276 |
callnumber-search | QA276 |
callnumber-sort | QA 3276 |
callnumber-subject | QA - Mathematics |
classification_rvk | QH 233 |
ctrlnum | (OCoLC)636291421 (DE-599)BVBBV006480081 |
dewey-full | 519.5 |
dewey-hundreds | 500 - Natural sciences and mathematics |
dewey-ones | 519 - Probabilities and applied mathematics |
dewey-raw | 519.5 |
dewey-search | 519.5 |
dewey-sort | 3519.5 |
dewey-tens | 510 - Mathematics |
discipline | Mathematik Wirtschaftswissenschaften |
format | Book |
fullrecord | <?xml version="1.0" encoding="UTF-8"?><collection xmlns="http://www.loc.gov/MARC21/slim"><record><leader>01878nam a2200529 c 4500</leader><controlfield tag="001">BV006480081</controlfield><controlfield tag="003">DE-604</controlfield><controlfield tag="005">00000000000000.0</controlfield><controlfield tag="007">t</controlfield><controlfield tag="008">930210s1980 d||| |||| 00||| eng d</controlfield><datafield tag="020" ind1=" " ind2=" "><subfield code="a">0470269111</subfield><subfield code="9">0-470-26911-1</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(OCoLC)636291421</subfield></datafield><datafield tag="035" ind1=" " ind2=" "><subfield code="a">(DE-599)BVBBV006480081</subfield></datafield><datafield tag="040" ind1=" " ind2=" "><subfield code="a">DE-604</subfield><subfield code="b">ger</subfield><subfield code="e">rakddb</subfield></datafield><datafield tag="041" ind1="0" ind2=" "><subfield code="a">eng</subfield></datafield><datafield tag="049" ind1=" " ind2=" "><subfield code="a">DE-739</subfield><subfield code="a">DE-188</subfield></datafield><datafield tag="050" ind1=" " ind2="0"><subfield code="a">QA276</subfield></datafield><datafield tag="082" ind1="0" ind2=" "><subfield code="a">519.5</subfield></datafield><datafield tag="084" ind1=" " ind2=" "><subfield code="a">QH 233</subfield><subfield code="0">(DE-625)141548:</subfield><subfield code="2">rvk</subfield></datafield><datafield tag="100" ind1="1" ind2=" "><subfield code="a">Sinha, Snehesh K.</subfield><subfield code="e">Verfasser</subfield><subfield code="4">aut</subfield></datafield><datafield tag="245" ind1="1" ind2="0"><subfield code="a">Life testing and reliability estimation</subfield><subfield code="c">Snehesh K. Sinha ; Balvant K. Kale*</subfield></datafield><datafield tag="264" ind1=" " ind2="1"><subfield code="a">New York</subfield><subfield code="b">Wiley</subfield><subfield code="c">1980</subfield></datafield><datafield tag="300" ind1=" " ind2=" "><subfield code="a">VI, 196 S.</subfield><subfield code="b">graph. Darst.</subfield></datafield><datafield tag="336" ind1=" " ind2=" "><subfield code="b">txt</subfield><subfield code="2">rdacontent</subfield></datafield><datafield tag="337" ind1=" " ind2=" "><subfield code="b">n</subfield><subfield code="2">rdamedia</subfield></datafield><datafield tag="338" ind1=" " ind2=" "><subfield code="b">nc</subfield><subfield code="2">rdacarrier</subfield></datafield><datafield tag="490" ind1="0" ind2=" "><subfield code="a">Halsted press book.</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Fiabilité</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Temps entre défaillances, Analyse des</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Accelerated life testing</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Failure time data analysis</subfield></datafield><datafield tag="650" ind1=" " ind2="4"><subfield code="a">Reliability (Engineering)</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Statistik</subfield><subfield code="0">(DE-588)4056995-0</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Ingenieurwissenschaften</subfield><subfield code="0">(DE-588)4137304-2</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="650" ind1="0" ind2="7"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="2">gnd</subfield><subfield code="9">rswk-swf</subfield></datafield><datafield tag="689" ind1="0" ind2="0"><subfield code="a">Ingenieurwissenschaften</subfield><subfield code="0">(DE-588)4137304-2</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="0" ind2=" "><subfield code="8">1\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="1" ind2="0"><subfield code="a">Zuverlässigkeit</subfield><subfield code="0">(DE-588)4059245-5</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="689" ind1="2" ind2="0"><subfield code="a">Statistik</subfield><subfield code="0">(DE-588)4056995-0</subfield><subfield code="D">s</subfield></datafield><datafield tag="689" ind1="2" ind2=" "><subfield code="8">3\p</subfield><subfield code="5">DE-604</subfield></datafield><datafield tag="700" ind1="1" ind2=" "><subfield code="a">Kale, Balvant Keshav</subfield><subfield code="d">1933-</subfield><subfield code="e">Verfasser</subfield><subfield code="0">(DE-588)120614928</subfield><subfield code="4">aut</subfield></datafield><datafield tag="940" ind1="1" ind2=" "><subfield code="q">TUB-nvmb</subfield></datafield><datafield tag="999" ind1=" " ind2=" "><subfield code="a">oai:aleph.bib-bvb.de:BVB01-004117390</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">1\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">2\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield><datafield tag="883" ind1="1" ind2=" "><subfield code="8">3\p</subfield><subfield code="a">cgwrk</subfield><subfield code="d">20201028</subfield><subfield code="q">DE-101</subfield><subfield code="u">https://d-nb.info/provenance/plan#cgwrk</subfield></datafield></record></collection> |
id | DE-604.BV006480081 |
illustrated | Illustrated |
indexdate | 2024-07-09T16:46:52Z |
institution | BVB |
isbn | 0470269111 |
language | English |
oai_aleph_id | oai:aleph.bib-bvb.de:BVB01-004117390 |
oclc_num | 636291421 |
open_access_boolean | |
owner | DE-739 DE-188 |
owner_facet | DE-739 DE-188 |
physical | VI, 196 S. graph. Darst. |
psigel | TUB-nvmb |
publishDate | 1980 |
publishDateSearch | 1980 |
publishDateSort | 1980 |
publisher | Wiley |
record_format | marc |
series2 | Halsted press book. |
spelling | Sinha, Snehesh K. Verfasser aut Life testing and reliability estimation Snehesh K. Sinha ; Balvant K. Kale* New York Wiley 1980 VI, 196 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier Halsted press book. Fiabilité Temps entre défaillances, Analyse des Accelerated life testing Failure time data analysis Reliability (Engineering) Statistik (DE-588)4056995-0 gnd rswk-swf Ingenieurwissenschaften (DE-588)4137304-2 gnd rswk-swf Zuverlässigkeit (DE-588)4059245-5 gnd rswk-swf Ingenieurwissenschaften (DE-588)4137304-2 s 1\p DE-604 Zuverlässigkeit (DE-588)4059245-5 s 2\p DE-604 Statistik (DE-588)4056995-0 s 3\p DE-604 Kale, Balvant Keshav 1933- Verfasser (DE-588)120614928 aut 1\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 2\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk 3\p cgwrk 20201028 DE-101 https://d-nb.info/provenance/plan#cgwrk |
spellingShingle | Sinha, Snehesh K. Kale, Balvant Keshav 1933- Life testing and reliability estimation Fiabilité Temps entre défaillances, Analyse des Accelerated life testing Failure time data analysis Reliability (Engineering) Statistik (DE-588)4056995-0 gnd Ingenieurwissenschaften (DE-588)4137304-2 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
subject_GND | (DE-588)4056995-0 (DE-588)4137304-2 (DE-588)4059245-5 |
title | Life testing and reliability estimation |
title_auth | Life testing and reliability estimation |
title_exact_search | Life testing and reliability estimation |
title_full | Life testing and reliability estimation Snehesh K. Sinha ; Balvant K. Kale* |
title_fullStr | Life testing and reliability estimation Snehesh K. Sinha ; Balvant K. Kale* |
title_full_unstemmed | Life testing and reliability estimation Snehesh K. Sinha ; Balvant K. Kale* |
title_short | Life testing and reliability estimation |
title_sort | life testing and reliability estimation |
topic | Fiabilité Temps entre défaillances, Analyse des Accelerated life testing Failure time data analysis Reliability (Engineering) Statistik (DE-588)4056995-0 gnd Ingenieurwissenschaften (DE-588)4137304-2 gnd Zuverlässigkeit (DE-588)4059245-5 gnd |
topic_facet | Fiabilité Temps entre défaillances, Analyse des Accelerated life testing Failure time data analysis Reliability (Engineering) Statistik Ingenieurwissenschaften Zuverlässigkeit |
work_keys_str_mv | AT sinhasneheshk lifetestingandreliabilityestimation AT kalebalvantkeshav lifetestingandreliabilityestimation |