Testing and diagnosis of VLSI and ULSI: [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987]
Gespeichert in:
| Format: | Tagungsbericht Buch |
|---|---|
| Sprache: | Undetermined |
| Veröffentlicht: |
Dordrecht u.a.
Kluwer Acad. Publ.
1988
|
| Schriftenreihe: | NATO: NATO ASI series / E
151. |
| Schlagworte: | |
| Online-Zugang: | Inhaltsverzeichnis |
| Beschreibung: | VIII, 533 S. graph. Darst. |
| ISBN: | 902473794X |
Internformat
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Datensatz im Suchindex
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IMAGE 1
TESTING AND DIAGNOSIS OF VLS AND ULSI
EDITED BY
FABRIZIO LOMBARD I DEPARTMENT OF ELECTRICAL AND COMPUTER ENGINEERING,
UNIVERSITY OF COLORADO AT BOULDER, BOULDER, COLORADO, U.S.A. DEPARTMENT
OF COMPUTER SCIENCE, TEXAS A&M UNIVERSITY, COLLEGE STATION, TEXAS,
U.S.A.
AND
MARIAGIOVANNA SAMI DIPARTIMENTO DI ELETTRONICA, POLITECNICO DI MILANO,
MILANO, ITALY
IT.*!!
UNIVERSITATSBIBLIOTHEK HANNOVER TECHNISCHE INFORMATIONSBIBLIOTHEK
KLUWER ACADEMIC PUBLISHERS
DORDRECHT / BOSTON / LONDON
PUBLISHED IN COOPERATION WITH NATO SCIENTIFIC AFFAIRS DIVISION
IMAGE 2
TABLE OF CONTENTS
1. PREFACE
F. LOMBARDI, M.G. SAMI VII
2. TRENDS IN DESIGN FOR TESTABILITY T.W. WILLIAMS 1
3. STATISTICAL TESTING V.D. AGRAWAL 33
4. FAULT MODELS
S. MOURAD, E.J. MCCLUSKEY 49
5. FAULT DETECTION AND DESIGN FOR TESTABILITY OF CMOS LOGIC CIRCUITS
S.M. REDDY, S. KUNDU 69
6. PARALLEL COMPUTER SYSTEMS TESTING AND INTEGRATION M. MALEK 93
7. ANALOG FAULT DIAGNOSIS C.L. WEY, C.C. WU, R. SACKS 117
8. SPECTRAL TECHNIQUES FOR DIGITAL TESTING J.C. MUZIO 151
9. LOGIC VERIFICATION, TESTING AND THEIR RELATIONSHIP TO LOGIC SYNTHESIS
S. DEVADAS, H.K.T. MA, AND A. SANGIOVANNI-VINCENTELU 181
10. PROVING THE NEXT STAGE FROM SIMULATION G. MUSGRAVE 247
11. PETRI NETS AND THEIR RELATION TO DESIGN VALIDATION AND TESTING G.
MUSGRAVE 257
12. FUNCTIONAL TEST OF ASICS AND BOARDS G. SAUCIER, M. CRASTES DE
PAULET, AND F. TIAR 273
13. FAULT SIMULATION TECHNIQUES -THEORY AND PRACTICAL EXAMPLES M.
MTLGARA 287
14. THRESHOLD-VALUE SIMULATION AND TEST GENERATION
V.D. AGRAWAL, K.T. CHENG 311
15. BEHAVIORAL TESTING OF PROGRAMMABLE SYSTEMS F. DISTANTE 325
16. TESTING OF PROCESSING ARRAYS F. DISTANTE, M.G. SAMI, AND R.
STEFANDLI 355
17. OLD AND NEW APPROACHES FOR THE REPAIR OF REDUNDANT MEMORIES F.
LOMBARDI 383
18. RECONFIGURATION OF ORTHOGONAL ARRAYS BY FRONT DELETION F. LOMBARDI,
C.L. WEY 429
19. DEVICE TESTING AND SEM TESTING TOOLS J.P. COLLIN, B. GOURTOIS 469
20. ADVANCES IN ELECTRON BEAM TESTING D. W. RANASINGHE 509
SUBJECT INDEX 527 |
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| isbn | 902473794X |
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| physical | VIII, 533 S. graph. Darst. |
| publishDate | 1988 |
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| series2 | NATO: NATO ASI series / E |
| spelling | Testing and diagnosis of VLSI and ULSI [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987] ed. by Fabrizio Lombardi ... Dordrecht u.a. Kluwer Acad. Publ. 1988 VIII, 533 S. graph. Darst. txt rdacontent n rdamedia nc rdacarrier NATO: NATO ASI series / E 151. Testen (DE-588)4367264-4 gnd rswk-swf Prüfung (DE-588)4047609-1 gnd rswk-swf VLSI (DE-588)4117388-0 gnd rswk-swf (DE-588)1071861417 Konferenzschrift 1987 Como gnd-content VLSI (DE-588)4117388-0 s Prüfung (DE-588)4047609-1 s DE-604 Testen (DE-588)4367264-4 s Lombardi, Fabrizio Sonstige oth Advanced Study Institute on Testing and Diagnosis of VLSI and ULSI 1987 Como Sonstige (DE-588)5034180-7 oth E NATO: NATO ASI series 151. (DE-604)BV000007015 151 GBV Datenaustausch application/pdf http://bvbr.bib-bvb.de:8991/F?func=service&doc_library=BVB01&local_base=BVB01&doc_number=004026841&sequence=000001&line_number=0001&func_code=DB_RECORDS&service_type=MEDIA Inhaltsverzeichnis |
| spellingShingle | Testing and diagnosis of VLSI and ULSI [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987] Testen (DE-588)4367264-4 gnd Prüfung (DE-588)4047609-1 gnd VLSI (DE-588)4117388-0 gnd |
| subject_GND | (DE-588)4367264-4 (DE-588)4047609-1 (DE-588)4117388-0 (DE-588)1071861417 |
| title | Testing and diagnosis of VLSI and ULSI [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987] |
| title_auth | Testing and diagnosis of VLSI and ULSI [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987] |
| title_exact_search | Testing and diagnosis of VLSI and ULSI [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987] |
| title_full | Testing and diagnosis of VLSI and ULSI [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987] ed. by Fabrizio Lombardi ... |
| title_fullStr | Testing and diagnosis of VLSI and ULSI [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987] ed. by Fabrizio Lombardi ... |
| title_full_unstemmed | Testing and diagnosis of VLSI and ULSI [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987] ed. by Fabrizio Lombardi ... |
| title_short | Testing and diagnosis of VLSI and ULSI |
| title_sort | testing and diagnosis of vlsi and ulsi proceedings of the nato advanced study institute on testing and diagnose of vlsi and ulsi como italy june 22 to july 3 1987 |
| title_sub | [proceedings of the NATO Advanced Study Institute on testing and diagnose of VLSI and ULSI, Como, Italy, June 22 to July 3 1987] |
| topic | Testen (DE-588)4367264-4 gnd Prüfung (DE-588)4047609-1 gnd VLSI (DE-588)4117388-0 gnd |
| topic_facet | Testen Prüfung VLSI Konferenzschrift 1987 Como |
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| volume_link | (DE-604)BV000007015 |
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